FR2721409B1 - Procédé et dispositif pour l'auto-dépannage de cartes de circuits imprimés. - Google Patents

Procédé et dispositif pour l'auto-dépannage de cartes de circuits imprimés.

Info

Publication number
FR2721409B1
FR2721409B1 FR9407455A FR9407455A FR2721409B1 FR 2721409 B1 FR2721409 B1 FR 2721409B1 FR 9407455 A FR9407455 A FR 9407455A FR 9407455 A FR9407455 A FR 9407455A FR 2721409 B1 FR2721409 B1 FR 2721409B1
Authority
FR
France
Prior art keywords
troubleshooting
self
printed circuit
circuit boards
boards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9407455A
Other languages
English (en)
Other versions
FR2721409A1 (fr
Inventor
Jacques Galland
Franck Lutz
Pierre Becker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Priority to FR9407455A priority Critical patent/FR2721409B1/fr
Publication of FR2721409A1 publication Critical patent/FR2721409A1/fr
Application granted granted Critical
Publication of FR2721409B1 publication Critical patent/FR2721409B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
FR9407455A 1994-06-17 1994-06-17 Procédé et dispositif pour l'auto-dépannage de cartes de circuits imprimés. Expired - Fee Related FR2721409B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9407455A FR2721409B1 (fr) 1994-06-17 1994-06-17 Procédé et dispositif pour l'auto-dépannage de cartes de circuits imprimés.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9407455A FR2721409B1 (fr) 1994-06-17 1994-06-17 Procédé et dispositif pour l'auto-dépannage de cartes de circuits imprimés.

Publications (2)

Publication Number Publication Date
FR2721409A1 FR2721409A1 (fr) 1995-12-22
FR2721409B1 true FR2721409B1 (fr) 1996-07-19

Family

ID=9464346

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9407455A Expired - Fee Related FR2721409B1 (fr) 1994-06-17 1994-06-17 Procédé et dispositif pour l'auto-dépannage de cartes de circuits imprimés.

Country Status (1)

Country Link
FR (1) FR2721409B1 (fr)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4573007A (en) * 1983-05-26 1986-02-25 Harris Corporation Digital test probe having memory for logic levels at different test locations
EP0352910A3 (fr) * 1988-07-28 1991-04-17 Digital Equipment Corporation Dépistage des défauts dans plaquettes à circuites imprimés

Also Published As

Publication number Publication date
FR2721409A1 (fr) 1995-12-22

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Legal Events

Date Code Title Description
ST Notification of lapse
ST Notification of lapse