FR2635414A1 - Optical switching device and applications to circuit testing - Google Patents

Optical switching device and applications to circuit testing Download PDF

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Publication number
FR2635414A1
FR2635414A1 FR8809917A FR8809917A FR2635414A1 FR 2635414 A1 FR2635414 A1 FR 2635414A1 FR 8809917 A FR8809917 A FR 8809917A FR 8809917 A FR8809917 A FR 8809917A FR 2635414 A1 FR2635414 A1 FR 2635414A1
Authority
FR
France
Prior art keywords
circuit
layer
electro
photoconductive
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8809917A
Other languages
English (en)
French (fr)
Other versions
FR2635414B1 (enExample
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger SA
Original Assignee
Schlumberger SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger SA filed Critical Schlumberger SA
Priority to FR8809917A priority Critical patent/FR2635414A1/fr
Publication of FR2635414A1 publication Critical patent/FR2635414A1/fr
Application granted granted Critical
Publication of FR2635414B1 publication Critical patent/FR2635414B1/fr
Granted legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/10—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to infrared radiation, visible or ultraviolet radiation, and having no potential barriers, e.g. photoresistors

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
FR8809917A 1988-07-22 1988-07-22 Optical switching device and applications to circuit testing Granted FR2635414A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8809917A FR2635414A1 (en) 1988-07-22 1988-07-22 Optical switching device and applications to circuit testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8809917A FR2635414A1 (en) 1988-07-22 1988-07-22 Optical switching device and applications to circuit testing

Publications (2)

Publication Number Publication Date
FR2635414A1 true FR2635414A1 (en) 1990-02-16
FR2635414B1 FR2635414B1 (enExample) 1990-07-27

Family

ID=9368673

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8809917A Granted FR2635414A1 (en) 1988-07-22 1988-07-22 Optical switching device and applications to circuit testing

Country Status (1)

Country Link
FR (1) FR2635414A1 (enExample)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4355278A (en) * 1980-08-06 1982-10-19 The United States Of America As Represented By The Secretary Of The Air Force Method for testing and analyzing surface acoustic wave interdigital transducers
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4693561A (en) * 1985-12-23 1987-09-15 The United States Of America As Represented By The Secretary Of The Army Amorphous silicon spatial light modulator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4355278A (en) * 1980-08-06 1982-10-19 The United States Of America As Represented By The Secretary Of The Air Force Method for testing and analyzing surface acoustic wave interdigital transducers
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4693561A (en) * 1985-12-23 1987-09-15 The United States Of America As Represented By The Secretary Of The Army Amorphous silicon spatial light modulator

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
IBM TECHNICAL DISCLOSURE BULLETIN, vol. 15, no. 3, août 1972, pages 779-780, New York, US; J.G.CAHILL et al.: "Electrical testing of glass metallized modules" *
IBM TECHNICAL DISCLOSURE BULLETIN, vol. 15, no. 6, novembre 1972, pages 2032-2033, New York, US; R.F.BUSH et al.: "Photoconductor contacting for module testing" *
IBM TECHNICAL DISCLOSURE BULLETIN, vol. 30, no. 10, pages 229-233, New York, US; "Optical space transformer for extending VLSI testing into the multi-gigahertz range" *
IBM TECHNICAL DISCLOSURE, vol. 15, no. 3, août 1972, pages 904-905, New York, US; K.F.GREENE et al.: "Photoconductor for electrical testing" *
IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. SC-20, no. 1, février 1985, pages 284-289, IEEE, New York, US; W.R.EISENSTADT et al.: "On-chip picosecond time-domain measurements for VLSI and interconnect testing using photoconductors" *
SOVIET TECHNICAL PHYSICS LETTERS, vol. 11, no. 1, janvier 1985, pages 16-17, American Institute of Physics, Woodbury, New York, US; V.S.MYL'NIKOV et al.: "Efficient reversible phase recording of optical information by a structure consisting of an organic polymer photoconductor and a liquid crystal" *

Also Published As

Publication number Publication date
FR2635414B1 (enExample) 1990-07-27

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Legal Events

Date Code Title Description
ER Errata listed in the french official journal (bopi)

Free format text: 07/90

ST Notification of lapse