FR2592152A1 - Element sensible d'interferometrie sans contact pour l'exploration incrementielle de structures d'interference variables. - Google Patents
Element sensible d'interferometrie sans contact pour l'exploration incrementielle de structures d'interference variables.Info
- Publication number
- FR2592152A1 FR2592152A1 FR8616993A FR8616993A FR2592152A1 FR 2592152 A1 FR2592152 A1 FR 2592152A1 FR 8616993 A FR8616993 A FR 8616993A FR 8616993 A FR8616993 A FR 8616993A FR 2592152 A1 FR2592152 A1 FR 2592152A1
- Authority
- FR
- France
- Prior art keywords
- exploration
- interferometry
- contact
- sensitive element
- incremential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02061—Reduction or prevention of effects of tilts or misalignment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
Abstract
Elément sensible d'interférométrie sans contact pour l'exploration de structures d'interférence variables, caractérisé en ce que le dispositif comporte, sur chacun des trajets de faisceaux 13, 14 du diviseur de rayons 2, un élément 15, 16 donnant des images optiques et, au niveau de chaque image 17, 18 du diaphragme 11, des éléments 19, 20 assurant l'exploration de la structure d'interférence. (CF DESSIN DANS BOPI)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DD28497685 | 1985-12-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2592152A1 true FR2592152A1 (fr) | 1987-06-26 |
FR2592152B1 FR2592152B1 (fr) | 1991-03-22 |
Family
ID=5574830
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR868616993A Expired - Fee Related FR2592152B1 (fr) | 1985-12-23 | 1986-12-04 | Element sensible d'interferometrie sans contact pour l'exploration incrementielle de structures d'interference variables. |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE3623244A1 (fr) |
FR (1) | FR2592152B1 (fr) |
GB (1) | GB2184866B (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4427317C2 (de) * | 1994-08-02 | 1999-04-01 | Zeiss Carl Jena Gmbh | Interferometer für die Prüfung optischer Elemente |
GB2555646A (en) * | 2016-11-03 | 2018-05-09 | Mbda Uk Ltd | Interferometric position sensor |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1565437A (fr) * | 1967-01-25 | 1969-05-02 | ||
US3549260A (en) * | 1967-01-10 | 1970-12-22 | Barringer Research Ltd | Spatially dispersive correlation interferometer |
FR2541447A1 (fr) * | 1983-02-22 | 1984-08-24 | Kulesh Vladimir | Procede de mesure de chemin optique et interferometre laser pour sa realisation |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1460861A (en) * | 1974-03-05 | 1977-01-06 | Nat Res Dev | Interferrometers |
DD201191B1 (de) * | 1981-09-24 | 1987-07-15 | Ilmenau Tech Hochschule | Kippinvariantes interferometer mit ebenen spiegeln |
US4512661A (en) * | 1982-09-02 | 1985-04-23 | The United States Of America As Represented By The Aministration Of The National Aeronautics And Space Administration | Dual differential interferometer |
US4498773A (en) * | 1983-05-04 | 1985-02-12 | Rockwell International Corporation | Pencil beam interferometer |
DD229208B1 (de) * | 1984-11-22 | 1988-02-10 | Ilmenau Tech Hochschule | Interferometer, insbesondere zur inkrementalen abtastung veraenderlicher interferenzstrukturen |
DD234070A1 (de) * | 1985-01-18 | 1986-03-19 | Ilmenau Tech Hochschule | Interferometrische mehrkoordinatenmesseinrichtung |
DE3612157A1 (de) * | 1985-04-26 | 1986-11-06 | VEB Feinmeßzeugfabrik Suhl, DDR 6000 Suhl | Interferometrisch-inkrementale vorrichtung zur ebenheitsmessung |
-
1986
- 1986-07-10 DE DE19863623244 patent/DE3623244A1/de not_active Ceased
- 1986-12-04 FR FR868616993A patent/FR2592152B1/fr not_active Expired - Fee Related
- 1986-12-17 GB GB8630195A patent/GB2184866B/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3549260A (en) * | 1967-01-10 | 1970-12-22 | Barringer Research Ltd | Spatially dispersive correlation interferometer |
FR1565437A (fr) * | 1967-01-25 | 1969-05-02 | ||
FR2541447A1 (fr) * | 1983-02-22 | 1984-08-24 | Kulesh Vladimir | Procede de mesure de chemin optique et interferometre laser pour sa realisation |
Also Published As
Publication number | Publication date |
---|---|
DE3623244A1 (de) | 1987-06-25 |
GB2184866A (en) | 1987-07-01 |
FR2592152B1 (fr) | 1991-03-22 |
GB2184866B (en) | 1990-03-21 |
GB8630195D0 (en) | 1987-01-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |