FR2570194B1 - Tete de test pour cartes de circuits imprimes equipes - Google Patents

Tete de test pour cartes de circuits imprimes equipes

Info

Publication number
FR2570194B1
FR2570194B1 FR8414070A FR8414070A FR2570194B1 FR 2570194 B1 FR2570194 B1 FR 2570194B1 FR 8414070 A FR8414070 A FR 8414070A FR 8414070 A FR8414070 A FR 8414070A FR 2570194 B1 FR2570194 B1 FR 2570194B1
Authority
FR
France
Prior art keywords
printed circuit
circuit boards
test head
equipped printed
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8414070A
Other languages
English (en)
Other versions
FR2570194A1 (fr
Inventor
Rolland Lissillour
Michel Prat
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel CIT SA
Original Assignee
Alcatel CIT SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel CIT SA filed Critical Alcatel CIT SA
Priority to FR8414070A priority Critical patent/FR2570194B1/fr
Publication of FR2570194A1 publication Critical patent/FR2570194A1/fr
Application granted granted Critical
Publication of FR2570194B1 publication Critical patent/FR2570194B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
FR8414070A 1984-09-13 1984-09-13 Tete de test pour cartes de circuits imprimes equipes Expired FR2570194B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8414070A FR2570194B1 (fr) 1984-09-13 1984-09-13 Tete de test pour cartes de circuits imprimes equipes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8414070A FR2570194B1 (fr) 1984-09-13 1984-09-13 Tete de test pour cartes de circuits imprimes equipes

Publications (2)

Publication Number Publication Date
FR2570194A1 FR2570194A1 (fr) 1986-03-14
FR2570194B1 true FR2570194B1 (fr) 1986-12-05

Family

ID=9307704

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8414070A Expired FR2570194B1 (fr) 1984-09-13 1984-09-13 Tete de test pour cartes de circuits imprimes equipes

Country Status (1)

Country Link
FR (1) FR2570194B1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8622878D0 (en) * 1986-09-23 1986-10-29 Marconi Instruments Ltd Electrical interface arrangement
US4902234A (en) * 1988-11-03 1990-02-20 International Business Machines Corporation Electrical connector assembly including pressure exertion member
FR2690596B1 (fr) * 1992-04-24 1995-04-14 Christian Godier Dispositif d'interface de test pour carte électronique.
DE102004027675A1 (de) * 2004-06-07 2006-01-05 Siemens Ag Leiterplatten-Prüfvorrichtung
CN110045270B (zh) * 2019-05-11 2024-05-17 宁波吉田智能洁具科技有限公司 一体式检测灌胶线

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4017793A (en) * 1975-08-11 1977-04-12 Haines Fred E Printed circuit board circuit tester
US4230985A (en) * 1978-01-12 1980-10-28 Fairchild Camera And Instrument Corporation Fixturing system
US4209745A (en) * 1978-06-12 1980-06-24 Everett/Charles, Inc. Interchangeable test head for loaded test member
US4344033A (en) * 1980-09-12 1982-08-10 Virginia Panel Corporation Vacuum-actuated test fixture for printed circuit boards

Also Published As

Publication number Publication date
FR2570194A1 (fr) 1986-03-14

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Legal Events

Date Code Title Description
ST Notification of lapse