FR2565353B1 - Procede pour mesurer des capacites, notamment de faibles capacites, dans lequel on utilise deux capacites de reference - Google Patents

Procede pour mesurer des capacites, notamment de faibles capacites, dans lequel on utilise deux capacites de reference

Info

Publication number
FR2565353B1
FR2565353B1 FR8508231A FR8508231A FR2565353B1 FR 2565353 B1 FR2565353 B1 FR 2565353B1 FR 8508231 A FR8508231 A FR 8508231A FR 8508231 A FR8508231 A FR 8508231A FR 2565353 B1 FR2565353 B1 FR 2565353B1
Authority
FR
France
Prior art keywords
capacities
measuring
especially low
low capacities
measuring capacities
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8508231A
Other languages
English (en)
French (fr)
Other versions
FR2565353A1 (fr
Inventor
Jorma Ponkala
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vaisala Oy
Original Assignee
Vaisala Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vaisala Oy filed Critical Vaisala Oy
Publication of FR2565353A1 publication Critical patent/FR2565353A1/fr
Application granted granted Critical
Publication of FR2565353B1 publication Critical patent/FR2565353B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
FR8508231A 1984-05-31 1985-05-31 Procede pour mesurer des capacites, notamment de faibles capacites, dans lequel on utilise deux capacites de reference Expired FR2565353B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI842193A FI69932C (fi) 1984-05-31 1984-05-31 Maetningsfoerfarande foer kapacitanser speciellt foer smao kapacitanser vid vilker man anvaender tvao referenser

Publications (2)

Publication Number Publication Date
FR2565353A1 FR2565353A1 (fr) 1985-12-06
FR2565353B1 true FR2565353B1 (fr) 1986-12-26

Family

ID=8519172

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8508231A Expired FR2565353B1 (fr) 1984-05-31 1985-05-31 Procede pour mesurer des capacites, notamment de faibles capacites, dans lequel on utilise deux capacites de reference

Country Status (10)

Country Link
JP (1) JPS60262067A (enrdf_load_stackoverflow)
AU (1) AU587578B2 (enrdf_load_stackoverflow)
BR (1) BR8502572A (enrdf_load_stackoverflow)
CA (1) CA1262372A (enrdf_load_stackoverflow)
DE (1) DE3519390A1 (enrdf_load_stackoverflow)
FI (1) FI69932C (enrdf_load_stackoverflow)
FR (1) FR2565353B1 (enrdf_load_stackoverflow)
GB (1) GB2159965B (enrdf_load_stackoverflow)
IT (1) IT1200492B (enrdf_load_stackoverflow)
ZA (1) ZA853855B (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI74549C (fi) * 1986-02-13 1988-02-08 Vaisala Oy Maetningsfoerfarande foer impedanser, saerskilt smao kapacitanser.
DE19524387C1 (de) * 1995-07-04 1996-11-07 Siemens Ag Schaltungsanordnung und Verfahren zum Messen eines Kapazitätsunterschiedes zwischen einer ersten Kapazität C1 und einer zweiten Kapazität C2
CN102096057B (zh) * 2010-11-16 2013-10-02 北京航天测控技术有限公司 一种电容测量电路的校准方法及装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE970798C (de) * 1953-05-16 1958-10-30 Rolf Scheunert Dr Ing Anordnung zur Messung von vorzugsweise sehr kleinen Kapazitaeten bzw. Kapazitaetsaenderungen
DE1026860B (de) * 1956-05-24 1958-03-27 Die Bundesrepublik Deutschland Schwebungskompensator
US3480857A (en) * 1967-12-27 1969-11-25 Ibm Digital method and apparatus for measuring small inductances and capacitances
DE2508033A1 (de) * 1975-02-25 1976-09-02 Zinn Erich Kapazitaets- und verlustfaktormesseinrichtung mit selbsttaetiger abgleichung
US4041382A (en) * 1976-08-16 1977-08-09 The Sippican Corporation Calibrating a measurement system including bridge circuit
SE431683B (sv) * 1977-09-23 1984-02-20 Testut Aequitas Anordning for metning av kapacitansen hos en kondensator
FI57319C (fi) * 1977-10-14 1980-07-10 Vaisala Oy Foerfarande foer maetning av smao kapacitanser
FI54664C (fi) * 1977-10-14 1979-01-10 Vaisala Oy Elektronisk omkopplingstroemstaellare i synnerhet foer telemeteranvaendning i sonder
US4130796A (en) * 1977-12-07 1978-12-19 Westinghouse Electric Corp. Calibrating and measuring circuit for a capacitive probe-type instrument
AU530552B2 (en) * 1978-04-07 1983-07-21 Minister of Public Works of Nsw Wave level measuring apparatus
JPS5528157A (en) * 1978-08-19 1980-02-28 Fuji Electric Co Ltd Displacement converter
US4295091B1 (en) * 1978-10-12 1995-08-15 Vaisala Oy Circuit for measuring low capacitances
FR2446037A1 (fr) * 1979-01-03 1980-08-01 Vaisala Oy Procede d'emission de signaux pour une radiosonde
DE2901516C2 (de) * 1979-01-16 1985-01-24 VEGA Grieshaber GmbH & Co, 7620 Wolfach Anordnung zur Erzeugung eines einer Kapazität proportionalen Signals
US4322977A (en) * 1980-05-27 1982-04-06 The Bendix Corporation Pressure measuring system
SE436936B (sv) * 1981-01-29 1985-01-28 Asea Ab Integrerad kapacitiv givare
US4398426A (en) * 1981-07-02 1983-08-16 Kavlico Corporation Linear capacitive pressure transducer system
DE3321580A1 (de) * 1983-06-15 1984-12-20 Philips Patentverwaltung Gmbh, 2000 Hamburg Einrichtung zur erfassung der temperatur fuer die kompensation temperaturabhaengiger fehler in einem kapazitiven differenzdrucksensor

Also Published As

Publication number Publication date
FI842193A0 (fi) 1984-05-31
IT1200492B (it) 1989-01-18
IT8520967A0 (it) 1985-05-30
GB2159965B (en) 1988-06-29
FR2565353A1 (fr) 1985-12-06
GB2159965A (en) 1985-12-11
ZA853855B (en) 1986-03-26
BR8502572A (pt) 1986-02-04
JPS60262067A (ja) 1985-12-25
DE3519390A1 (de) 1985-12-12
FI69932B (fi) 1985-12-31
AU587578B2 (en) 1989-08-24
GB8513830D0 (en) 1985-07-03
FI69932C (fi) 1986-05-26
DE3519390C2 (enrdf_load_stackoverflow) 1990-10-25
CA1262372A (en) 1989-10-17
AU4274985A (en) 1985-12-05

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Legal Events

Date Code Title Description
ST Notification of lapse