AU587578B2 - Method and circuit for the measurement of capacitance - Google Patents

Method and circuit for the measurement of capacitance

Info

Publication number
AU587578B2
AU587578B2 AU42749/85A AU4274985A AU587578B2 AU 587578 B2 AU587578 B2 AU 587578B2 AU 42749/85 A AU42749/85 A AU 42749/85A AU 4274985 A AU4274985 A AU 4274985A AU 587578 B2 AU587578 B2 AU 587578B2
Authority
AU
Australia
Prior art keywords
capacitance
measurement
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU42749/85A
Other languages
English (en)
Other versions
AU4274985A (en
Inventor
Jorma Ponkala
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vaisala Oy
Original Assignee
Vaisala Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vaisala Oy filed Critical Vaisala Oy
Publication of AU4274985A publication Critical patent/AU4274985A/en
Application granted granted Critical
Publication of AU587578B2 publication Critical patent/AU587578B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
AU42749/85A 1984-05-31 1985-05-22 Method and circuit for the measurement of capacitance Ceased AU587578B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI842193A FI69932C (fi) 1984-05-31 1984-05-31 Maetningsfoerfarande foer kapacitanser speciellt foer smao kapacitanser vid vilker man anvaender tvao referenser
FI842193 1984-05-31

Publications (2)

Publication Number Publication Date
AU4274985A AU4274985A (en) 1985-12-05
AU587578B2 true AU587578B2 (en) 1989-08-24

Family

ID=8519172

Family Applications (1)

Application Number Title Priority Date Filing Date
AU42749/85A Ceased AU587578B2 (en) 1984-05-31 1985-05-22 Method and circuit for the measurement of capacitance

Country Status (10)

Country Link
JP (1) JPS60262067A (enrdf_load_stackoverflow)
AU (1) AU587578B2 (enrdf_load_stackoverflow)
BR (1) BR8502572A (enrdf_load_stackoverflow)
CA (1) CA1262372A (enrdf_load_stackoverflow)
DE (1) DE3519390A1 (enrdf_load_stackoverflow)
FI (1) FI69932C (enrdf_load_stackoverflow)
FR (1) FR2565353B1 (enrdf_load_stackoverflow)
GB (1) GB2159965B (enrdf_load_stackoverflow)
IT (1) IT1200492B (enrdf_load_stackoverflow)
ZA (1) ZA853855B (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI74549C (fi) * 1986-02-13 1988-02-08 Vaisala Oy Maetningsfoerfarande foer impedanser, saerskilt smao kapacitanser.
DE19524387C1 (de) * 1995-07-04 1996-11-07 Siemens Ag Schaltungsanordnung und Verfahren zum Messen eines Kapazitätsunterschiedes zwischen einer ersten Kapazität C1 und einer zweiten Kapazität C2
CN102096057B (zh) * 2010-11-16 2013-10-02 北京航天测控技术有限公司 一种电容测量电路的校准方法及装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU503639B2 (en) * 1976-08-16 1979-09-13 Sippican Ocean Systems Inc. Calibrating a measurement system including bridge circuit
AU523345B2 (en) * 1977-10-14 1982-07-22 Vaisala Oy A method for measuring low capacitances
AU530552B2 (en) * 1978-04-07 1983-07-21 Minister of Public Works of Nsw Wave level measuring apparatus

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE970798C (de) * 1953-05-16 1958-10-30 Rolf Scheunert Dr Ing Anordnung zur Messung von vorzugsweise sehr kleinen Kapazitaeten bzw. Kapazitaetsaenderungen
DE1026860B (de) * 1956-05-24 1958-03-27 Die Bundesrepublik Deutschland Schwebungskompensator
US3480857A (en) * 1967-12-27 1969-11-25 Ibm Digital method and apparatus for measuring small inductances and capacitances
DE2508033A1 (de) * 1975-02-25 1976-09-02 Zinn Erich Kapazitaets- und verlustfaktormesseinrichtung mit selbsttaetiger abgleichung
GB2006970B (en) * 1977-09-23 1982-03-31 Testut Aequitas Capacitance measuring device
FI54664C (fi) * 1977-10-14 1979-01-10 Vaisala Oy Elektronisk omkopplingstroemstaellare i synnerhet foer telemeteranvaendning i sonder
US4130796A (en) * 1977-12-07 1978-12-19 Westinghouse Electric Corp. Calibrating and measuring circuit for a capacitive probe-type instrument
JPS5528157A (en) * 1978-08-19 1980-02-28 Fuji Electric Co Ltd Displacement converter
US4295091B1 (en) * 1978-10-12 1995-08-15 Vaisala Oy Circuit for measuring low capacitances
FR2446037A1 (fr) * 1979-01-03 1980-08-01 Vaisala Oy Procede d'emission de signaux pour une radiosonde
DE2901516C2 (de) * 1979-01-16 1985-01-24 VEGA Grieshaber GmbH & Co, 7620 Wolfach Anordnung zur Erzeugung eines einer Kapazität proportionalen Signals
US4322977A (en) * 1980-05-27 1982-04-06 The Bendix Corporation Pressure measuring system
SE436936B (sv) * 1981-01-29 1985-01-28 Asea Ab Integrerad kapacitiv givare
US4398426A (en) * 1981-07-02 1983-08-16 Kavlico Corporation Linear capacitive pressure transducer system
DE3321580A1 (de) * 1983-06-15 1984-12-20 Philips Patentverwaltung Gmbh, 2000 Hamburg Einrichtung zur erfassung der temperatur fuer die kompensation temperaturabhaengiger fehler in einem kapazitiven differenzdrucksensor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU503639B2 (en) * 1976-08-16 1979-09-13 Sippican Ocean Systems Inc. Calibrating a measurement system including bridge circuit
AU523345B2 (en) * 1977-10-14 1982-07-22 Vaisala Oy A method for measuring low capacitances
AU530552B2 (en) * 1978-04-07 1983-07-21 Minister of Public Works of Nsw Wave level measuring apparatus

Also Published As

Publication number Publication date
ZA853855B (en) 1986-03-26
JPS60262067A (ja) 1985-12-25
GB2159965B (en) 1988-06-29
DE3519390A1 (de) 1985-12-12
FI69932B (fi) 1985-12-31
FI69932C (fi) 1986-05-26
DE3519390C2 (enrdf_load_stackoverflow) 1990-10-25
FR2565353A1 (fr) 1985-12-06
FR2565353B1 (fr) 1986-12-26
FI842193A0 (fi) 1984-05-31
GB2159965A (en) 1985-12-11
GB8513830D0 (en) 1985-07-03
CA1262372A (en) 1989-10-17
IT1200492B (it) 1989-01-18
BR8502572A (pt) 1986-02-04
AU4274985A (en) 1985-12-05
IT8520967A0 (it) 1985-05-30

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Legal Events

Date Code Title Description
MK14 Patent ceased section 143(a) (annual fees not paid) or expired