FR2531229B1 - Systeme de mesure a fiabilite amelioree - Google Patents

Systeme de mesure a fiabilite amelioree

Info

Publication number
FR2531229B1
FR2531229B1 FR8312666A FR8312666A FR2531229B1 FR 2531229 B1 FR2531229 B1 FR 2531229B1 FR 8312666 A FR8312666 A FR 8312666A FR 8312666 A FR8312666 A FR 8312666A FR 2531229 B1 FR2531229 B1 FR 2531229B1
Authority
FR
France
Prior art keywords
measurement system
improved reliability
reliability
improved
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8312666A
Other languages
English (en)
Other versions
FR2531229A1 (fr
Inventor
Shinichi Fujitani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Information Systems Ltd
Original Assignee
Nippon Business Consultant Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP13553682A external-priority patent/JPS5927301A/ja
Priority claimed from JP1697183A external-priority patent/JPS59161797A/ja
Application filed by Nippon Business Consultant Co Ltd filed Critical Nippon Business Consultant Co Ltd
Publication of FR2531229A1 publication Critical patent/FR2531229A1/fr
Application granted granted Critical
Publication of FR2531229B1 publication Critical patent/FR2531229B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/245—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect
    • G01R15/246—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect based on the Faraday, i.e. linear magneto-optic, effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/247—Details of the circuitry or construction of devices covered by G01R15/241 - G01R15/246
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
FR8312666A 1982-08-02 1983-08-01 Systeme de mesure a fiabilite amelioree Expired FR2531229B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP13553682A JPS5927301A (ja) 1982-08-02 1982-08-02 アナログ信号インタフエ−スに対する付加型の耐障害化方式
JP1697183A JPS59161797A (ja) 1983-02-04 1983-02-04 計測システムの耐障害化方式

Publications (2)

Publication Number Publication Date
FR2531229A1 FR2531229A1 (fr) 1984-02-03
FR2531229B1 true FR2531229B1 (fr) 1986-12-12

Family

ID=26353428

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8312666A Expired FR2531229B1 (fr) 1982-08-02 1983-08-01 Systeme de mesure a fiabilite amelioree

Country Status (5)

Country Link
US (1) US4580234A (fr)
CA (1) CA1205196A (fr)
DE (1) DE3327263A1 (fr)
FR (1) FR2531229B1 (fr)
GB (1) GB2125545B (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3929404A1 (de) * 1989-09-05 1991-03-07 Bodenseewerk Geraetetech Verfahren und vorrichtung zum erkennen und identifizieren von fehlern an sensoren
US5151866A (en) * 1990-03-30 1992-09-29 The Dow Chemical Company High speed power analyzer
EP0720004B1 (fr) * 1994-12-27 2000-02-16 LITEF GmbH Procédé FDIC pour minimiser les erreurs de mesure dans un dispositif de mesure à capteurs redondants
DE19506388C1 (de) * 1995-02-23 1996-08-22 Buero Fuer Ca Technik Dipl Ing Verfahren zum Erkennen von systematischen Fehlern, insbesondere zur automatischen Störungserkennung bei Qualitätskontrollen, mittels mit Meßsensoren ausgestatteten Meßgeräten
FR2740899B1 (fr) * 1995-11-06 1997-12-05 Gec Alsthom T D Balteau Transformateur de mesure non conventionnel
US7805245B2 (en) * 2007-04-18 2010-09-28 Honeywell International Inc. Inertial measurement unit fault detection isolation reconfiguration using parity logic
EP2796835B1 (fr) 2012-02-03 2018-09-12 Asahi Kasei Kabushiki Kaisha Dispositif de traitement de signal
US10139433B2 (en) 2014-03-24 2018-11-27 Prysmian S.P.A. Method of measuring current distribution in high and medium voltage cables
US20170323240A1 (en) 2016-05-06 2017-11-09 General Electric Company Computing system to control the use of physical state attainment with inspection

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1352126A (en) * 1970-07-28 1974-05-08 Atomic Energy Authority Uk Monitoring systems
US4039933A (en) * 1976-03-25 1977-08-02 Instrumentation Laboratory, Inc. Continuous calibration system and method for analytical instruments
US4000643A (en) * 1976-03-29 1977-01-04 Honeywell Inc. Apparatus for producing a compensating voltage
CH601874A5 (fr) * 1976-07-07 1978-07-14 Bbc Brown Boveri & Cie
CH619779A5 (fr) * 1977-09-20 1980-10-15 Mettler Instrumente Ag
FR2425665A1 (fr) * 1978-05-10 1979-12-07 Boeing Co Appareil de controle-selection de signaux a possibilites de selection ponderee
DE2964099D1 (en) * 1979-08-08 1982-12-30 Hasler Ag Device for continuously controlling the functioning of a display or recording instrument, method of operating same and application of the method
FR2485204A1 (fr) * 1980-06-19 1981-12-24 Commissariat Energie Atomique Amperemetre a effet faraday
DE3123180A1 (de) * 1981-06-11 1983-01-05 Siemens AG, 1000 Berlin und 8000 München Korrekturverfahren und -einrichtung fuer eine magnetfeldsonde

Also Published As

Publication number Publication date
DE3327263C2 (fr) 1990-08-30
GB8320232D0 (en) 1983-09-01
GB2125545A (en) 1984-03-07
FR2531229A1 (fr) 1984-02-03
DE3327263A1 (de) 1984-02-02
CA1205196A (fr) 1986-05-27
GB2125545B (en) 1986-02-26
US4580234A (en) 1986-04-01

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Legal Events

Date Code Title Description
ST Notification of lapse