FR2503872B1 - Sonde active de tension pour instruments electroniques de mesure - Google Patents

Sonde active de tension pour instruments electroniques de mesure

Info

Publication number
FR2503872B1
FR2503872B1 FR8206699A FR8206699A FR2503872B1 FR 2503872 B1 FR2503872 B1 FR 2503872B1 FR 8206699 A FR8206699 A FR 8206699A FR 8206699 A FR8206699 A FR 8206699A FR 2503872 B1 FR2503872 B1 FR 2503872B1
Authority
FR
France
Prior art keywords
measuring instruments
electronic measuring
voltage probe
active voltage
active
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8206699A
Other languages
English (en)
Other versions
FR2503872A1 (fr
Inventor
Jonathan C Lueker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of FR2503872A1 publication Critical patent/FR2503872A1/fr
Application granted granted Critical
Publication of FR2503872B1 publication Critical patent/FR2503872B1/fr
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/20Cathode-ray oscilloscopes
    • G01R13/22Circuits therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145Indicating the presence of current or voltage
    • G01R19/155Indicating the presence of voltage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Amplifiers (AREA)
FR8206699A 1981-04-10 1982-04-09 Sonde active de tension pour instruments electroniques de mesure Expired FR2503872B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/252,749 US4403183A (en) 1981-04-10 1981-04-10 Active voltage probe

Publications (2)

Publication Number Publication Date
FR2503872A1 FR2503872A1 (fr) 1982-10-15
FR2503872B1 true FR2503872B1 (fr) 1986-04-11

Family

ID=22957372

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8206699A Expired FR2503872B1 (fr) 1981-04-10 1982-04-09 Sonde active de tension pour instruments electroniques de mesure

Country Status (7)

Country Link
US (1) US4403183A (fr)
JP (1) JPS57175961A (fr)
CA (1) CA1199069A (fr)
DE (1) DE3213039C2 (fr)
FR (1) FR2503872B1 (fr)
GB (1) GB2096775B (fr)
NL (1) NL8201340A (fr)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5975157A (ja) * 1982-10-22 1984-04-27 テクトロニクス・インコ−ポレイテツド トリガ回路
US4551636A (en) * 1983-05-25 1985-11-05 Tektronix, Inc. Wide bandwidth signal coupling circuit having a variable voltage-level shift from input to output
JPH0625778B2 (ja) * 1985-07-19 1994-04-06 光一 吉田 コンタクト式マルチプロ−ブ
FR2595887A1 (fr) * 1986-03-14 1987-09-18 Labo Electronique Physique Attenuateur a haute impedance d'entree, a calibres multiples pour hautes frequences, et oscilloscope et sonde active comportant un tel attenuateur
US4758779A (en) * 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
US4779042A (en) * 1986-12-23 1988-10-18 Grumman Aerospace Corporation Computer-aided probe with tri-state circuitry test capability
US4963812A (en) * 1989-10-02 1990-10-16 Motorola, Inc. Battery charger housing for batteries of differing dimensions
US5672997A (en) * 1994-09-21 1997-09-30 Intel Corporation Method and apparatus for reducing the nominal operating voltage supplied to an integrated circuit
US5583447A (en) * 1995-02-03 1996-12-10 Hewlett-Packard Company Voltage probe with reverse impedance matching
US6351112B1 (en) * 1998-08-31 2002-02-26 Agilent Technologies, Inc. Calibrating combinations of probes and channels in an oscilloscope
US6271712B1 (en) * 1999-04-07 2001-08-07 Semiconductor Components Industries Llc Synchronous rectifier and method of operation
US6462528B1 (en) * 2000-05-23 2002-10-08 Tektronix, Inc. Method and apparatus for probing a conductor of an array of closely-spaced conductors
DE10131350A1 (de) * 2001-06-28 2003-02-06 Egm Entwicklung Montage Schaltungsanordnung zur Messung eines Stromes und/oder einer Spannung, insbesondere zur Verwendung bei induktiven Wegaufnehmern oder dergleichen
TWI273250B (en) * 2004-06-28 2007-02-11 Richtek Technology Corp A sensor apparatus without being influenced by bias electric current and the method thereof
JP4910520B2 (ja) * 2006-07-07 2012-04-04 横河電機株式会社 アクティブプローブ
US7795860B2 (en) * 2006-08-16 2010-09-14 Tektronix, Inc. Multiple probe acquisition system
DE102008009962A1 (de) * 2007-12-04 2009-06-10 Rohde & Schwarz Gmbh & Co. Kg Tastkopf mit hochgenauer Gleichspannungsmessung
CN102053177B (zh) * 2009-11-10 2014-12-10 北京普源精电科技有限公司 一种有源差分电压探头
US10408861B2 (en) * 2015-03-04 2019-09-10 Rohde & Schwarz Gmbh & Co. Kg Circuit for compensating an offset voltage in an amplifier

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3256484A (en) * 1962-09-10 1966-06-14 Tektronix Inc High voltage test probe containing a part gas, part liquid dielectric fluid under pressure and having a transparent housing section for viewing the presence of the liquid therein
DE1591450A1 (de) * 1967-03-16 1969-11-06 Siemens Ag Anordnung zur Umsymmetrierung von elektrischen Spannungen
US3533004A (en) * 1968-11-13 1970-10-06 Electronic Associates Feed forward amplifier
US3943367A (en) * 1975-06-10 1976-03-09 The United States Of America As Represented By The Secretary Of The Army High frequency optically coupled differential voltage probe with logarithmic response
US4042881A (en) * 1975-06-23 1977-08-16 Unitec, Inc. Voltage measuring device having an amplifier in the probe
US4209742A (en) * 1976-10-13 1980-06-24 Tektronix, Inc. Modular probe system
DE2810951C2 (de) * 1978-03-14 1980-02-07 Hewlett-Packard Gmbh, 7030 Boeblingen Kompensationsschaltung für elektronische Meßgeräte
IL55101A0 (en) * 1978-07-07 1978-09-29 Kibbutz Mishmar Hanegev Electronic circuit

Also Published As

Publication number Publication date
GB2096775A (en) 1982-10-20
CA1199069A (fr) 1986-01-07
FR2503872A1 (fr) 1982-10-15
US4403183A (en) 1983-09-06
NL8201340A (nl) 1982-11-01
DE3213039A1 (de) 1982-10-28
DE3213039C2 (de) 1985-10-03
JPS57175961A (en) 1982-10-29
GB2096775B (en) 1984-09-26

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Legal Events

Date Code Title Description
ST Notification of lapse