FR2502325B1 - Palpeur pour machine-outil - Google Patents

Palpeur pour machine-outil

Info

Publication number
FR2502325B1
FR2502325B1 FR8204490A FR8204490A FR2502325B1 FR 2502325 B1 FR2502325 B1 FR 2502325B1 FR 8204490 A FR8204490 A FR 8204490A FR 8204490 A FR8204490 A FR 8204490A FR 2502325 B1 FR2502325 B1 FR 2502325B1
Authority
FR
France
Prior art keywords
probe
machine tool
tool
machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8204490A
Other languages
English (en)
Other versions
FR2502325A1 (fr
Inventor
Yuzuru Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daishowa Seiki Co Ltd
Original Assignee
Daishowa Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daishowa Seiki Co Ltd filed Critical Daishowa Seiki Co Ltd
Publication of FR2502325A1 publication Critical patent/FR2502325A1/fr
Application granted granted Critical
Publication of FR2502325B1 publication Critical patent/FR2502325B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J65/00—Lamps without any electrode inside the vessel; Lamps with at least one main electrode outside the vessel
    • H01J65/04—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/002—Constructional details of contacts for gauges actuating one or more contacts
FR8204490A 1981-03-18 1982-03-17 Palpeur pour machine-outil Expired FR2502325B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56038899A JPS57152663A (en) 1981-03-18 1981-03-18 Micro-wave electric-discharge light source device

Publications (2)

Publication Number Publication Date
FR2502325A1 FR2502325A1 (fr) 1982-09-24
FR2502325B1 true FR2502325B1 (fr) 1985-01-04

Family

ID=12538040

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8204490A Expired FR2502325B1 (fr) 1981-03-18 1982-03-17 Palpeur pour machine-outil

Country Status (4)

Country Link
US (1) US4447958A (fr)
JP (1) JPS57152663A (fr)
FR (1) FR2502325B1 (fr)
GB (1) GB2094979B (fr)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4510693A (en) * 1982-06-14 1985-04-16 Gte Valeron Corporation Probe with stylus adjustment
US4509266A (en) * 1982-06-14 1985-04-09 Gte Valeron Corporation Touch probe
DE3234470C2 (de) * 1982-09-17 1985-11-21 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
IT1156686B (it) * 1982-10-18 1987-02-04 Finike Italiana Marposs Testa per il controllo di dimensioni lineari
AU555481B2 (en) * 1983-06-14 1986-09-25 Gte Valeron Corp. Remote measuring apparatus
US4543859A (en) * 1983-06-14 1985-10-01 Gte Valeron Corporation Probe adjustment tool and method of using same
DE3340311C2 (de) * 1983-11-08 1985-12-12 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Tast- und/oder Meßeinrichtung
IT1168698B (it) * 1983-11-21 1987-05-20 Finike Italiana Marposs Testa per il controllo di dimensioni lineari
JPS60189860A (ja) * 1984-03-01 1985-09-27 フユージョン・システムズ・コーポレーション マイクロ波により発生される無電極光源
JPS617402A (ja) * 1984-06-21 1986-01-14 Sotsukishiya:Kk 位置検出装置
GB8503355D0 (en) * 1985-02-09 1985-03-13 Renishaw Plc Sensing surface of object
DE3508396C1 (de) * 1985-03-08 1985-09-12 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
US4693110A (en) * 1985-06-06 1987-09-15 Gte Valeron Corporation Method and apparatus for testing the operability of a probe
US4831743A (en) * 1986-10-15 1989-05-23 Struble James E Fixture rail snap-mountable transducer gage assembly for selectively making outline (gap) and contour checks
US4731935A (en) * 1986-10-15 1988-03-22 Struble James E Contour and outline transducer gage assembly
US4831742A (en) * 1986-10-15 1989-05-23 Struble James E Contour and outline transducer gage assembly
US4752166A (en) * 1987-01-02 1988-06-21 Manuflex Corp. Probing device
US4778313A (en) * 1987-05-18 1988-10-18 Manuflex Corp. Intelligent tool system
JPH074735B2 (ja) * 1989-01-20 1995-01-25 大昭和精機株式会社 接触検出装置
US5491904A (en) * 1990-02-23 1996-02-20 Mcmurtry; David R. Touch probe
IT1238266B (it) * 1990-03-06 1993-07-12 Marposs Spa Testa per il controllo di dimensioni lineari di pezzi.
DE4100323C2 (de) * 1991-01-08 1998-03-19 Franz Haimer Mehrkoordinaten-Tastmeßgerät
ATE111590T1 (de) * 1991-07-26 1994-09-15 Heidenhain Gmbh Dr Johannes Mehrkoordinaten-tastkopf.
JPH0535708U (ja) * 1991-10-17 1993-05-14 東洋製罐株式会社 ヒンジキヤツプ
GB9225994D0 (en) * 1992-12-12 1993-02-10 Renishaw Metrology Ltd Device for connecting a shank to a probe
US5594995A (en) * 1995-04-06 1997-01-21 Metrol Co., Ltd. Touch sensor
US5819429A (en) * 1995-10-12 1998-10-13 Metrol Co., Ltd. Touch sensor
US6633416B1 (en) * 2000-01-10 2003-10-14 International Business Machines Corporation Computer scanner for three-dimensional objects
GB0005166D0 (en) * 2000-03-04 2000-04-26 Renishaw Plc Probe signal transmission system
KR20020093071A (ko) 2000-04-26 2002-12-12 코넬 리서치 화운데이션,인크. 향상된 작동개시 필드를 위하여 파이버를 이용하는 램프
CN1250930C (zh) 2001-06-18 2006-04-12 弗朗茨·海默机械制造两合公司 多坐标感知测量装置
US6897615B2 (en) * 2001-11-01 2005-05-24 Axcelis Technologies, Inc. Plasma process and apparatus
KR100442398B1 (ko) * 2002-01-22 2004-07-30 엘지전자 주식회사 무전극 조명기기의 재발광 촉진구조
KR100498307B1 (ko) 2002-10-24 2005-07-01 엘지전자 주식회사 무전극 조명 시스템의 재발광 촉진 장치
US9797820B2 (en) 2013-11-06 2017-10-24 Illinois Tool Works Inc. Loadcell probe for overload protection
CN111256565B (zh) * 2019-12-18 2021-07-06 浙江零跑科技有限公司 一种悬置支架检具

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3571934A (en) * 1968-06-24 1971-03-23 Lockheed Aircraft Corp Three-axis inspection probe
GB1271841A (en) * 1969-01-01 1972-04-26 British Aircraft Corp Ltd Improvements relating to dimensional sensing devices
US3766653A (en) * 1971-10-04 1973-10-23 Lockheed Missiles Space Three axis inspection probe
JPS5231059B2 (fr) * 1972-08-09 1977-08-12
GB1447613A (en) * 1973-06-14 1976-08-25 Rolls Royce Probes
JPS5616760Y2 (fr) * 1975-08-26 1981-04-18
GB1593050A (en) * 1976-09-30 1981-07-15 Renishaw Electrical Ltd Contact sensing probe
GB1593682A (en) * 1977-01-20 1981-07-22 Rolls Royce Probe for use in mearusing apparatus
US4145816A (en) * 1977-11-21 1979-03-27 Kearney & Trecker Corporation Spindle probe with orbital transformer
JPS581511B2 (ja) * 1977-12-15 1983-01-11 三菱電機株式会社 無電極螢光灯
US4230916A (en) * 1978-10-26 1980-10-28 Showa Musen Kogyo Kabushiki Kaisha Multiway change-over switch having joy-stick actuator
GB2047133B (en) * 1979-03-30 1982-12-15 Renishaw Electrical Ltd Tool connecting mechanism for machine tools
SU794361A1 (ru) * 1979-04-09 1981-01-07 Экспериментальный Научно-Исследо-Вательский Институт Металлорежущихстанков "Энимс", Вильнюсский Филиал Измерительна головка
GB2049198B (en) * 1979-05-01 1983-03-30 Renishaw Electrical Ltd Probe for use in measuring apparatus

Also Published As

Publication number Publication date
FR2502325A1 (fr) 1982-09-24
GB2094979B (en) 1985-07-17
JPS57152663A (en) 1982-09-21
US4447958A (en) 1984-05-15
GB2094979A (en) 1982-09-22
JPS637657B2 (fr) 1988-02-17

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