FR2489964A1 - Equipement de commutation utilisable dans un appareil de test - Google Patents

Equipement de commutation utilisable dans un appareil de test Download PDF

Info

Publication number
FR2489964A1
FR2489964A1 FR8114262A FR8114262A FR2489964A1 FR 2489964 A1 FR2489964 A1 FR 2489964A1 FR 8114262 A FR8114262 A FR 8114262A FR 8114262 A FR8114262 A FR 8114262A FR 2489964 A1 FR2489964 A1 FR 2489964A1
Authority
FR
France
Prior art keywords
switching
bus
test
terminal
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8114262A
Other languages
English (en)
French (fr)
Other versions
FR2489964B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Bernard Paul Gollomp
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bendix Corp
Original Assignee
Bendix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bendix Corp filed Critical Bendix Corp
Publication of FR2489964A1 publication Critical patent/FR2489964A1/fr
Application granted granted Critical
Publication of FR2489964B1 publication Critical patent/FR2489964B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/206—Switches for connection of measuring instruments or electric motors to measuring loads

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
FR8114262A 1980-09-09 1981-07-22 Equipement de commutation utilisable dans un appareil de test Granted FR2489964A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/185,452 US4392107A (en) 1980-09-09 1980-09-09 Switching equipment for testing apparatus

Publications (2)

Publication Number Publication Date
FR2489964A1 true FR2489964A1 (fr) 1982-03-12
FR2489964B1 FR2489964B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1984-11-30

Family

ID=22681030

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8114262A Granted FR2489964A1 (fr) 1980-09-09 1981-07-22 Equipement de commutation utilisable dans un appareil de test

Country Status (5)

Country Link
US (1) US4392107A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1172697A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3131151A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2489964A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2085600B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2540993A1 (fr) * 1983-02-15 1984-08-17 Miller Special Tools Analyseur de systemes de circuit de commande electronique
GR880100266A (en) * 1987-04-23 1989-01-31 Grumman Aerospace Corp Programmed tester with memory of the type of bubble

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4620304A (en) * 1982-09-13 1986-10-28 Gen Rad, Inc. Method of and apparatus for multiplexed automatic testing of electronic circuits and the like
US4708278A (en) * 1986-02-10 1987-11-24 The United States Of America As Represented By The Secretary Of The Navy Portable, electronically controlled, integrated, P.C.B. rework station
US4719459A (en) * 1986-03-06 1988-01-12 Grumman Aerospace Corporation Signal distribution system switching module
US4862069A (en) * 1987-08-05 1989-08-29 Genrad, Inc. Method of in-circuit testing
US5861743A (en) * 1995-12-21 1999-01-19 Genrad, Inc. Hybrid scanner for use in an improved MDA tester
US6100815A (en) * 1997-12-24 2000-08-08 Electro Scientific Industries, Inc. Compound switching matrix for probing and interconnecting devices under test to measurement equipment
US6492819B1 (en) 2001-01-12 2002-12-10 Abb Inc. High voltage switch and switching process for impulse measurement
US7414418B2 (en) * 2005-01-07 2008-08-19 Formfactor, Inc. Method and apparatus for increasing operating frequency of a system for testing electronic devices
CN101435841B (zh) * 2007-11-16 2013-08-28 鸿富锦精密工业（深圳）有限公司 测试系统及方法
US20120242357A1 (en) * 2011-03-23 2012-09-27 Hamilton Sundstrand Corporation Automatic fault insertion, calibration and test system
KR20140000855A (ko) * 2012-06-26 2014-01-06 삼성전자주식회사 테스트 인터페이스 보드 및 테스트 시스템

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2805104A1 (de) * 1978-02-07 1979-08-09 Loewe Opta Gmbh Schaltungsanordnung zur fehlerdiagnose in nachrichtentechnischen geraeten
FR2441177A1 (fr) * 1978-08-25 1980-06-06 Racal Automation Ltd Procede et appareil d'essai automatique de circuits electriques ou electroniques
GB2039372A (en) * 1979-01-08 1980-08-06 Bendix Corp Test apparatus for electrical control systems of internal combustion engines

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2473685A (en) * 1944-08-26 1949-06-21 Anchor Mfg Co Current distribution panel
US3058061A (en) * 1957-10-18 1962-10-09 North American Aviation Inc Automatic checkout coding system
GB1000281A (en) * 1962-01-15 1965-08-04 Bendix Corp Test equipment for electronic assemblies
US3345522A (en) * 1964-12-04 1967-10-03 Westinghouse Electric Corp System for providing reaction indicative of deviation from a predetermined order
US3357007A (en) * 1965-03-16 1967-12-05 Sonex Inc Telemetry system with calibration signal channel for transmitting data concurrently with the testing of data channes
US3370232A (en) * 1965-05-07 1968-02-20 Xebec Corp Switching apparatus for verifying the resistive integrity of electrical wiring systems
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
GB1540263A (en) * 1975-12-16 1979-02-07 Sun Electric Corp Engine test and display apparatus
DE2630993C3 (de) * 1976-07-09 1979-12-06 Siemens Ag, 1000 Berlin Und 8000 Muenchen Schaltmatrix mit Anschlußmoduln
DE2723536C3 (de) * 1977-05-25 1980-10-23 Daimler-Benz Ag, 7000 Stuttgart Vorrichtung zum Prüfen verschiedenartiger Kabelsätze
PL112944B1 (en) * 1977-12-02 1980-11-29 Device for communication by means of a computer with telemetric channels
DE2755576C2 (de) * 1977-12-09 1980-01-24 Maschinenbau Ing. H. Stegenwalner, 1000 Berlin Prüfeinrichtung für eine bestückte Leiterplatte
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
DE2905220C2 (de) * 1979-02-12 1986-12-11 Brown, Boveri & Cie Ag, 6800 Mannheim Prüfsystem zur Prüfung von Elektronik-Anlagen

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2805104A1 (de) * 1978-02-07 1979-08-09 Loewe Opta Gmbh Schaltungsanordnung zur fehlerdiagnose in nachrichtentechnischen geraeten
FR2441177A1 (fr) * 1978-08-25 1980-06-06 Racal Automation Ltd Procede et appareil d'essai automatique de circuits electriques ou electroniques
GB2039372A (en) * 1979-01-08 1980-08-06 Bendix Corp Test apparatus for electrical control systems of internal combustion engines

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2540993A1 (fr) * 1983-02-15 1984-08-17 Miller Special Tools Analyseur de systemes de circuit de commande electronique
GR880100266A (en) * 1987-04-23 1989-01-31 Grumman Aerospace Corp Programmed tester with memory of the type of bubble
EP0311682A4 (en) * 1987-04-23 1989-08-09 Grumman Aerospace Corp PROGRAMMABLE TEST DEVICE WITH BUBBLE MEMORY.

Also Published As

Publication number Publication date
FR2489964B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1984-11-30
GB2085600B (en) 1985-01-03
CA1172697A (en) 1984-08-14
US4392107A (en) 1983-07-05
GB2085600A (en) 1982-04-28
DE3131151A1 (de) 1982-05-13

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