FR2477324B1 - - Google Patents

Info

Publication number
FR2477324B1
FR2477324B1 FR8004486A FR8004486A FR2477324B1 FR 2477324 B1 FR2477324 B1 FR 2477324B1 FR 8004486 A FR8004486 A FR 8004486A FR 8004486 A FR8004486 A FR 8004486A FR 2477324 B1 FR2477324 B1 FR 2477324B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8004486A
Other languages
French (fr)
Other versions
FR2477324A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Dassault Electronique SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dassault Electronique SA filed Critical Dassault Electronique SA
Priority to FR8004486A priority Critical patent/FR2477324A1/fr
Priority to US06/237,564 priority patent/US4477774A/en
Publication of FR2477324A1 publication Critical patent/FR2477324A1/fr
Application granted granted Critical
Publication of FR2477324B1 publication Critical patent/FR2477324B1/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00—Contacts
    • H01H1/60—Auxiliary means structurally associated with the switch for cleaning or lubricating contact-making surfaces
    • H01H1/605—Cleaning of contact-making surfaces by relatively high voltage pulses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
FR8004486A 1980-02-28 1980-02-28 Dispositif de contact electrique pour appareil de traitement de cartes electroniques Granted FR2477324A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR8004486A FR2477324A1 (fr) 1980-02-28 1980-02-28 Dispositif de contact electrique pour appareil de traitement de cartes electroniques
US06/237,564 US4477774A (en) 1980-02-28 1981-02-24 Electrical contact device for an electronic card processing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8004486A FR2477324A1 (fr) 1980-02-28 1980-02-28 Dispositif de contact electrique pour appareil de traitement de cartes electroniques

Publications (2)

Publication Number Publication Date
FR2477324A1 FR2477324A1 (fr) 1981-09-04
FR2477324B1 true FR2477324B1 (cg-RX-API-DMAC7.html) 1983-04-15

Family

ID=9239122

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8004486A Granted FR2477324A1 (fr) 1980-02-28 1980-02-28 Dispositif de contact electrique pour appareil de traitement de cartes electroniques

Country Status (2)

Country Link
US (1) US4477774A (cg-RX-API-DMAC7.html)
FR (1) FR2477324A1 (cg-RX-API-DMAC7.html)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4588241A (en) * 1983-09-23 1986-05-13 Probe-Rite, Inc. Surface mating coaxial connector
US4700132A (en) * 1985-05-06 1987-10-13 Motorola, Inc. Integrated circuit test site
US4764722A (en) * 1985-10-28 1988-08-16 International Business Machines Corporation Coaxial probe
NL8702537A (nl) * 1987-10-26 1989-05-16 At & T & Philips Telecomm Coaxiale connector.
FR2651580B1 (fr) * 1989-09-05 1991-12-13 Aerospatiale Dispositif de caracterisation dielectrique d'echantillons de materiau de surface plane ou non plane et application au controle non destructif de l'homogeneite dielectrique desdits echantillons.
US5388996A (en) * 1991-01-09 1995-02-14 Johnson; David A. Electrical interconnect contact system
US5634801A (en) * 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
US5221905A (en) * 1992-02-28 1993-06-22 International Business Machines Corporation Test system with reduced test contact interface resistance
US5645433A (en) * 1994-05-09 1997-07-08 Johnstech International Corporation Contacting system for electrical devices
US5543724A (en) * 1994-10-03 1996-08-06 Motorola, Inc. Method and apparatus for locating conductive features and testing semiconductor devices
JP4841737B2 (ja) * 2000-08-21 2011-12-21 東京エレクトロン株式会社 検査方法及び検査装置
DE60204640T2 (de) * 2001-08-31 2006-05-11 Tyco Electronics Amp Gmbh Koaxialverbinder zum Verbinden von Leiterplatten
US9746867B2 (en) 2015-04-20 2017-08-29 Hamilton Sundstrand Corporation Wetting current sequencing for low current interface
CN109596677A (zh) * 2018-11-02 2019-04-09 大族激光科技产业集团股份有限公司 一种质量检测装置、方法、系统及一体式探针组件

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1150233A (en) * 1966-09-19 1969-04-30 Clarke & Smith Controls Ltd Improvements in or relating to Electrical Connectintg Devices.
FR2032175A5 (cg-RX-API-DMAC7.html) * 1969-02-21 1970-11-20 Compteurs Comp D
CA1038042A (en) * 1975-03-03 1978-09-05 Motorola Programmable probe fixture and method of connecting units under test with test equipment
JPS5337077A (en) * 1976-09-17 1978-04-05 Hitachi Ltd Probe for tester

Also Published As

Publication number Publication date
US4477774A (en) 1984-10-16
FR2477324A1 (fr) 1981-09-04

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Legal Events

Date Code Title Description
ST Notification of lapse
TP Transmission of property