FR2459980A1 - Procedes et appareils de localisation de defauts dans des circuits electroniques - Google Patents

Procedes et appareils de localisation de defauts dans des circuits electroniques Download PDF

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Publication number
FR2459980A1
FR2459980A1 FR8013688A FR8013688A FR2459980A1 FR 2459980 A1 FR2459980 A1 FR 2459980A1 FR 8013688 A FR8013688 A FR 8013688A FR 8013688 A FR8013688 A FR 8013688A FR 2459980 A1 FR2459980 A1 FR 2459980A1
Authority
FR
France
Prior art keywords
circuit
conductor
pulse
current pulse
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8013688A
Other languages
English (en)
French (fr)
Other versions
FR2459980B1 (cs
Inventor
Eric Metcalf
Jack Woolven
Stephen Nicholas Spens
Brian Lawrence Arthur Kett
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger Technologies Ltd
Original Assignee
Membrain Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Membrain Ltd filed Critical Membrain Ltd
Publication of FR2459980A1 publication Critical patent/FR2459980A1/fr
Application granted granted Critical
Publication of FR2459980B1 publication Critical patent/FR2459980B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/088—Aspects of digital computing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Mathematical Physics (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Locating Faults (AREA)
FR8013688A 1979-06-23 1980-06-20 Procedes et appareils de localisation de defauts dans des circuits electroniques Granted FR2459980A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB7921940 1979-06-23
GB7943989 1979-12-20

Publications (2)

Publication Number Publication Date
FR2459980A1 true FR2459980A1 (fr) 1981-01-16
FR2459980B1 FR2459980B1 (cs) 1983-04-01

Family

ID=26271949

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8013688A Granted FR2459980A1 (fr) 1979-06-23 1980-06-20 Procedes et appareils de localisation de defauts dans des circuits electroniques

Country Status (3)

Country Link
DE (1) DE3022279A1 (cs)
FR (1) FR2459980A1 (cs)
GB (1) GB2055478B (cs)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2619926A1 (fr) * 1987-08-27 1989-03-03 Teradyne Inc Procede et appareil de diagnostic de defauts sur une carte de circuit
EP0527321A1 (de) * 1991-08-05 1993-02-17 Siemens Aktiengesellschaft Verfahren zur automatischen Fehlerdiagnose von elektrischen Baugruppen
EP0729035A3 (de) * 1995-02-24 1997-05-07 Langer Guenter Feldquelle zur Untersuchung der elektromagnetischen Verträglichkeit

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0077725B1 (en) * 1981-10-16 1986-04-30 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Current probe signal processing circuit
DE69229389T2 (de) * 1992-02-25 1999-10-07 Hewlett-Packard Co., Palo Alto Testsystem für Schaltkreise
CN113777459B (zh) * 2021-08-12 2024-05-28 中国南方电网有限责任公司超高压输电公司昆明局 换流器丢脉冲故障定位方法及装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2374650A1 (fr) * 1976-12-16 1978-07-13 Genrad Inc Detecteur de defauts de conducteurs de circuits imprimes

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2524361A1 (de) * 1975-06-02 1976-12-09 Tesla Np Verfahren zum pruefen von integrierten digitalbausteinen
US4074188A (en) * 1975-08-01 1978-02-14 Testline Instruments, Inc. Low impedance fault detection system and method
GB1537870A (en) * 1975-09-05 1979-01-04 Ericsson L M Pty Ltd Printed circuit board testing method and apparatus
DD133598A1 (de) * 1977-10-18 1979-01-10 Franz Drescher Verfahren und vorrichtung zur fehlerlokalisierung an defekten digitalen funktionseinheiten

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2374650A1 (fr) * 1976-12-16 1978-07-13 Genrad Inc Detecteur de defauts de conducteurs de circuits imprimes

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
EXBK/79 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2619926A1 (fr) * 1987-08-27 1989-03-03 Teradyne Inc Procede et appareil de diagnostic de defauts sur une carte de circuit
EP0527321A1 (de) * 1991-08-05 1993-02-17 Siemens Aktiengesellschaft Verfahren zur automatischen Fehlerdiagnose von elektrischen Baugruppen
EP0729035A3 (de) * 1995-02-24 1997-05-07 Langer Guenter Feldquelle zur Untersuchung der elektromagnetischen Verträglichkeit

Also Published As

Publication number Publication date
FR2459980B1 (cs) 1983-04-01
GB2055478B (en) 1983-01-26
GB2055478A (en) 1981-03-04
DE3022279A1 (de) 1981-01-08
DE3022279C2 (cs) 1992-08-13

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