FR2423774A1 - Procede et dispositif pour la determination de caracteristiques technologiques - Google Patents

Procede et dispositif pour la determination de caracteristiques technologiques

Info

Publication number
FR2423774A1
FR2423774A1 FR7910102A FR7910102A FR2423774A1 FR 2423774 A1 FR2423774 A1 FR 2423774A1 FR 7910102 A FR7910102 A FR 7910102A FR 7910102 A FR7910102 A FR 7910102A FR 2423774 A1 FR2423774 A1 FR 2423774A1
Authority
FR
France
Prior art keywords
detected
rays
technological characteristics
crystal
maxima
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7910102A
Other languages
English (en)
French (fr)
Other versions
FR2423774B1 (enrdf_load_stackoverflow
Inventor
Wolfgang Bottcher
Hermann-Josef Kopineck
Albrecht Maurer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoesch Werke AG
Original Assignee
Hoesch Werke AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoesch Werke AG filed Critical Hoesch Werke AG
Publication of FR2423774A1 publication Critical patent/FR2423774A1/fr
Application granted granted Critical
Publication of FR2423774B1 publication Critical patent/FR2423774B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7910102A 1978-04-22 1979-04-20 Procede et dispositif pour la determination de caracteristiques technologiques Granted FR2423774A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2817742A DE2817742C2 (de) 1978-04-22 1978-04-22 Verfahren und Vorrichtung zum Bestimmen technologischer Kennwerte

Publications (2)

Publication Number Publication Date
FR2423774A1 true FR2423774A1 (fr) 1979-11-16
FR2423774B1 FR2423774B1 (enrdf_load_stackoverflow) 1984-05-04

Family

ID=6037775

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7910102A Granted FR2423774A1 (fr) 1978-04-22 1979-04-20 Procede et dispositif pour la determination de caracteristiques technologiques

Country Status (8)

Country Link
JP (1) JPS54141695A (enrdf_load_stackoverflow)
AT (1) AT381394B (enrdf_load_stackoverflow)
BE (1) BE875722A (enrdf_load_stackoverflow)
DE (1) DE2817742C2 (enrdf_load_stackoverflow)
FR (1) FR2423774A1 (enrdf_load_stackoverflow)
GB (1) GB2019559B (enrdf_load_stackoverflow)
IT (1) IT1114999B (enrdf_load_stackoverflow)
LU (1) LU81170A1 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3825830A1 (de) * 1988-07-29 1990-02-01 Hoesch Stahl Ag Verfahren und vorrichtung zur texturanalyse
US5381458A (en) * 1993-02-23 1995-01-10 The United States Of America As Represented By The Secretary Of Commerce Method and apparatus for precisely measuring accelerating voltages applied to x-ray sources
FR2833081B1 (fr) * 2001-11-30 2004-05-07 Centre Nat Rech Scient Procede d'analyse volumique aux rayons x de caracteristiques cristallographiques de pieces
DE102016222644A1 (de) 2016-03-14 2017-09-28 Sms Group Gmbh Verfahren zum Walzen und/oder zur Wärmebehandlung eines metallischen Produkts
DE102017208576A1 (de) 2016-05-25 2017-11-30 Sms Group Gmbh Vorrichtung und Verfahren zum Ermitteln einer Mikrostruktur eines Metallprodukts sowie metallurgische Anlage

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1329695A (en) * 1970-09-09 1973-09-12 Nutter J C Diffractometry
US4128762A (en) * 1976-09-08 1978-12-05 Hitachi, Ltd. Apparatus for measuring mechanical stress using white X-rays

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1329695A (en) * 1970-09-09 1973-09-12 Nutter J C Diffractometry
US4128762A (en) * 1976-09-08 1978-12-05 Hitachi, Ltd. Apparatus for measuring mechanical stress using white X-rays

Also Published As

Publication number Publication date
FR2423774B1 (enrdf_load_stackoverflow) 1984-05-04
GB2019559A (en) 1979-10-31
LU81170A1 (de) 1979-11-07
IT7948613A0 (it) 1979-04-04
DE2817742B1 (de) 1979-10-31
GB2019559B (en) 1983-01-06
AT381394B (de) 1986-10-10
JPS54141695A (en) 1979-11-05
BE875722A (fr) 1979-10-22
DE2817742C2 (de) 1980-07-24
JPH0237539B2 (enrdf_load_stackoverflow) 1990-08-24
IT1114999B (it) 1986-02-03
ATA149679A (de) 1986-02-15

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