FR2413776A1 - Objectif d'optique electronique - Google Patents
Objectif d'optique electroniqueInfo
- Publication number
- FR2413776A1 FR2413776A1 FR7800049A FR7800049A FR2413776A1 FR 2413776 A1 FR2413776 A1 FR 2413776A1 FR 7800049 A FR7800049 A FR 7800049A FR 7800049 A FR7800049 A FR 7800049A FR 2413776 A1 FR2413776 A1 FR 2413776A1
- Authority
- FR
- France
- Prior art keywords
- deviators
- zone
- magnetic field
- optics lens
- objective
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/10—Lenses
- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/1472—Deflecting along given lines
- H01J37/1474—Scanning means
- H01J37/1475—Scanning means magnetic
Abstract
L'INVENTION A POUR OBJET UN OBJECTIF D'OPTIQUE ELECTRONIQUE. CET OBJECTIF COMPORTE UNE LENTILLE ELECTROMAGNETIQUE DE REVOLUTION AUTOUR DE SON AXE OPTIQUE ET FORMEE DE DEUX PIECES POLAIRES, L'UNE EN FER DOUX, L'AUTRE EN FERRITE, SEPAREE L'UNE DE L'AUTRE PAR UN ENTREFER. ELLE COMPORTE EGALEMENT DEUX DEVIATEURS, L'UN PLACE DANS UNE ZONE DE FAIBLE CHAMP MAGNETIQUE LONGITUDINAL, L'AUTRE DANS UNE ZONE DE FORT CHAMP MAGNETIQUE LONGITUDINAL, CES DEUX DEVIATEURS ETANT IDENTIQUES ET DECALES DE 215 A 225 L'UN PAR RAPPORT A L'AUTRE. L'INVENTION S'APPLIQUE AUX DISPOSITIFS DE L'ELECTROLITHOGRAPHIE.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7800049A FR2413776A1 (fr) | 1978-01-03 | 1978-01-03 | Objectif d'optique electronique |
DE19782856782 DE2856782A1 (de) | 1978-01-03 | 1978-12-29 | Elektronenoptik-objektiv |
JP16436778A JPS54101276A (en) | 1978-01-03 | 1978-12-31 | Electrooptical objective lens and microlithoraphic system |
GB7968A GB2012105B (en) | 1978-01-03 | 1979-01-02 | Electronic optical objective |
US06/154,911 US4330709A (en) | 1978-01-03 | 1980-05-30 | Electronic optical objective |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7800049A FR2413776A1 (fr) | 1978-01-03 | 1978-01-03 | Objectif d'optique electronique |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2413776A1 true FR2413776A1 (fr) | 1979-07-27 |
FR2413776B1 FR2413776B1 (fr) | 1980-09-19 |
Family
ID=9203081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7800049A Granted FR2413776A1 (fr) | 1978-01-03 | 1978-01-03 | Objectif d'optique electronique |
Country Status (5)
Country | Link |
---|---|
US (1) | US4330709A (fr) |
JP (1) | JPS54101276A (fr) |
DE (1) | DE2856782A1 (fr) |
FR (1) | FR2413776A1 (fr) |
GB (1) | GB2012105B (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2507816A1 (fr) * | 1981-06-15 | 1982-12-17 | Nippon Telegraph & Telephone | Systeme deflecteur de focalisation pour faisceau de particules chargees |
EP0129681A2 (fr) * | 1983-06-28 | 1985-01-02 | International Business Machines Corporation | Système de projection par faisceau électronique avec lentille à immersion d'axe variable |
EP0821392A1 (fr) * | 1996-07-25 | 1998-01-28 | ACT Advanced Circuit Testing Gesellschaft für Testsystementwicklung mbH | Système déflecteur |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5738544A (en) * | 1980-08-19 | 1982-03-03 | Matsushita Electronics Corp | Electromagnetic deflection system picture tube system equipment |
JPS5788659A (en) * | 1980-11-21 | 1982-06-02 | Jeol Ltd | Electron ray device |
NL8301712A (nl) * | 1983-05-13 | 1984-12-03 | Philips Nv | Kleurenbeeldbuis. |
NL8801208A (nl) * | 1988-05-09 | 1989-12-01 | Philips Nv | Geladen deeltjes bundel apparaat. |
FR2837931B1 (fr) * | 2002-03-29 | 2004-12-10 | Cameca | Dispositif de mesure de l'emission de rayons x produite par un objet soumis a un faisceau d'electrons |
US8642959B2 (en) | 2007-10-29 | 2014-02-04 | Micron Technology, Inc. | Method and system of performing three-dimensional imaging using an electron microscope |
US10008360B2 (en) | 2015-01-26 | 2018-06-26 | Hermes Microvision Inc. | Objective lens system for fast scanning large FOV |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1325540A (en) * | 1969-10-10 | 1973-08-01 | Texas Instruments Ltd | Electron beam apparatus |
JPS4929089B1 (fr) * | 1970-05-13 | 1974-08-01 | ||
US3801792A (en) * | 1973-05-23 | 1974-04-02 | Bell Telephone Labor Inc | Electron beam apparatus |
JPS561744B2 (fr) * | 1973-06-26 | 1981-01-14 | ||
JPS5944743B2 (ja) * | 1974-04-16 | 1984-10-31 | 日本電子株式会社 | 走査電子顕微鏡等用照射電子レンズ系 |
JPS5169327A (en) * | 1974-12-03 | 1976-06-15 | Canon Kk | Ekishoku dosochi |
US4162403A (en) * | 1978-07-26 | 1979-07-24 | Advanced Metals Research Corp. | Method and means for compensating for charge carrier beam astigmatism |
-
1978
- 1978-01-03 FR FR7800049A patent/FR2413776A1/fr active Granted
- 1978-12-29 DE DE19782856782 patent/DE2856782A1/de active Granted
- 1978-12-31 JP JP16436778A patent/JPS54101276A/ja active Granted
-
1979
- 1979-01-02 GB GB7968A patent/GB2012105B/en not_active Expired
-
1980
- 1980-05-30 US US06/154,911 patent/US4330709A/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2507816A1 (fr) * | 1981-06-15 | 1982-12-17 | Nippon Telegraph & Telephone | Systeme deflecteur de focalisation pour faisceau de particules chargees |
EP0129681A2 (fr) * | 1983-06-28 | 1985-01-02 | International Business Machines Corporation | Système de projection par faisceau électronique avec lentille à immersion d'axe variable |
EP0129681A3 (en) * | 1983-06-28 | 1986-04-16 | International Business Machines Corporation | Variable axis immerson lens electron beam projection system |
EP0821392A1 (fr) * | 1996-07-25 | 1998-01-28 | ACT Advanced Circuit Testing Gesellschaft für Testsystementwicklung mbH | Système déflecteur |
Also Published As
Publication number | Publication date |
---|---|
FR2413776B1 (fr) | 1980-09-19 |
JPS6216502B2 (fr) | 1987-04-13 |
GB2012105A (en) | 1979-07-18 |
US4330709A (en) | 1982-05-18 |
DE2856782C2 (fr) | 1991-03-07 |
JPS54101276A (en) | 1979-08-09 |
DE2856782A1 (de) | 1979-07-12 |
GB2012105B (en) | 1982-09-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |