FR2336658A1 - Magnetic thickness gauges calibration - uses nickel test plate of known thickness providing calibration reading for permanent magnet probe - Google Patents
Magnetic thickness gauges calibration - uses nickel test plate of known thickness providing calibration reading for permanent magnet probeInfo
- Publication number
- FR2336658A1 FR2336658A1 FR7639165A FR7639165A FR2336658A1 FR 2336658 A1 FR2336658 A1 FR 2336658A1 FR 7639165 A FR7639165 A FR 7639165A FR 7639165 A FR7639165 A FR 7639165A FR 2336658 A1 FR2336658 A1 FR 2336658A1
- Authority
- FR
- France
- Prior art keywords
- calibration
- permanent magnet
- thickness
- test plate
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
The thickness gauge test apparatus is suitable for use with instruments designed to measure coatings on ferromagnetic substrates. The permanent magnet probe of the gauge to be calibrated (5) is first fully magnetised. The spring-loaded magnet is then drawn across the surface of a precision test surface of known properties (6). A plate of pure nickel with a magnetic saturation Js=0,62 T is used. For an instrument with a thickness measuring range of 0...1000 mum, a nickel test plate of 1 mm thickness provides a calibration point equivalent to 65 mum and a plate 0.1 mm thick an equivalent of 900 mum. The magnetic probe of the instrument is now progressively demagnetised until the pointer reading reduces from infinity (8) to the calibration point (b) related to the nickel test plate in use. At this point the instrument is calibrated.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19752558897 DE2558897C3 (en) | 1975-12-27 | 1975-12-27 | Test plate for calibrating coating thickness measuring devices |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2336658A1 true FR2336658A1 (en) | 1977-07-22 |
FR2336658B1 FR2336658B1 (en) | 1982-02-12 |
Family
ID=5965780
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7639165A Granted FR2336658A1 (en) | 1975-12-27 | 1976-12-27 | Magnetic thickness gauges calibration - uses nickel test plate of known thickness providing calibration reading for permanent magnet probe |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE2558897C3 (en) |
FR (1) | FR2336658A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140039830A1 (en) * | 2012-08-06 | 2014-02-06 | Hon Hai Precision Industry Co., Ltd. | Test device to measure coating thickness and test system |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2811368A1 (en) * | 1978-03-16 | 1979-09-27 | Felix Von Rueling | Measurement value indication method - displays sheet thicknesses using three LEDs showing three comparator states |
US4567436A (en) * | 1982-01-21 | 1986-01-28 | Linda Koch | Magnetic thickness gauge with adjustable probe |
DE19918064C2 (en) * | 1999-04-21 | 2003-09-18 | Norbert Nix | Layer thickness measuring device with automated zeroing and / or calibration |
RU2532858C2 (en) * | 2013-01-28 | 2014-11-10 | Закрытое Акционерное Общество "КОНСТАНТА" | Measurement method of thickness of non-ferromagnetic electrically conducting coating of steel |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3077858A (en) * | 1960-03-17 | 1963-02-19 | Gen Electric Canada | Apparatus for controlling and measuring the thickness of thin electrically conductive films |
US3407352A (en) * | 1965-06-07 | 1968-10-22 | Western Electric Co | Method of and apparatus for monitoring the thickness of a non-conductive coating on a conductive base |
US3454874A (en) * | 1962-10-11 | 1969-07-08 | British Aluminium Co Ltd | Instrument for measuring the thickness of a non-conducting film on a metal base and for measuring the resistivity of a metal sample |
-
1975
- 1975-12-27 DE DE19752558897 patent/DE2558897C3/en not_active Expired
-
1976
- 1976-12-27 FR FR7639165A patent/FR2336658A1/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3077858A (en) * | 1960-03-17 | 1963-02-19 | Gen Electric Canada | Apparatus for controlling and measuring the thickness of thin electrically conductive films |
US3454874A (en) * | 1962-10-11 | 1969-07-08 | British Aluminium Co Ltd | Instrument for measuring the thickness of a non-conducting film on a metal base and for measuring the resistivity of a metal sample |
US3407352A (en) * | 1965-06-07 | 1968-10-22 | Western Electric Co | Method of and apparatus for monitoring the thickness of a non-conductive coating on a conductive base |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140039830A1 (en) * | 2012-08-06 | 2014-02-06 | Hon Hai Precision Industry Co., Ltd. | Test device to measure coating thickness and test system |
Also Published As
Publication number | Publication date |
---|---|
DE2558897A1 (en) | 1977-07-07 |
FR2336658B1 (en) | 1982-02-12 |
DE2558897C3 (en) | 1979-02-15 |
DE2558897B2 (en) | 1978-06-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |