FR2331122B3 - - Google Patents
Info
- Publication number
- FR2331122B3 FR2331122B3 FR7633105A FR7633105A FR2331122B3 FR 2331122 B3 FR2331122 B3 FR 2331122B3 FR 7633105 A FR7633105 A FR 7633105A FR 7633105 A FR7633105 A FR 7633105A FR 2331122 B3 FR2331122 B3 FR 2331122B3
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19752549392 DE2549392C3 (de) | 1975-11-04 | 1975-11-04 | Verfahren zur Erhöhung der Zuverlässigkeit von integrierten Speicherbausteinen und zur Verbesserung der Ausbeute von nach außen hin fehlerfrei erscheinenden Speicherbausteinen bei ihrer Herstellung |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2331122A1 FR2331122A1 (fr) | 1977-06-03 |
FR2331122B3 true FR2331122B3 (fr) | 1979-07-13 |
Family
ID=5960852
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7633105A Granted FR2331122A1 (fr) | 1975-11-04 | 1976-11-03 | Procede pour accroitre la fiabilite de sous-ensembles integres de memoires et pour ameliorer le rendement de leur fabrication |
Country Status (4)
Country | Link |
---|---|
DE (1) | DE2549392C3 (fr) |
FR (1) | FR2331122A1 (fr) |
GB (1) | GB1557684A (fr) |
NL (1) | NL7612146A (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2934599C3 (de) * | 1979-08-27 | 1982-04-08 | Siemens AG, 1000 Berlin und 8000 München | Schaltungsanordnung zur Bildung von Prüfbits in einer Fehlerkorrektureinrichtung |
US4319356A (en) * | 1979-12-19 | 1982-03-09 | Ncr Corporation | Self-correcting memory system |
US4317201A (en) * | 1980-04-01 | 1982-02-23 | Honeywell, Inc. | Error detecting and correcting RAM assembly |
US4380812A (en) * | 1980-04-25 | 1983-04-19 | Data General Corporation | Refresh and error detection and correction technique for a data processing system |
US4359771A (en) * | 1980-07-25 | 1982-11-16 | Honeywell Information Systems Inc. | Method and apparatus for testing and verifying the operation of error control apparatus within a memory |
US5177743A (en) * | 1982-02-15 | 1993-01-05 | Hitachi, Ltd. | Semiconductor memory |
JPS58139399A (ja) * | 1982-02-15 | 1983-08-18 | Hitachi Ltd | 半導体記憶装置 |
US4943967A (en) * | 1982-02-15 | 1990-07-24 | Hitachi, Ltd. | Semiconductor memory with an improved dummy cell arrangement and with a built-in error correction code circuit |
US4656605A (en) * | 1983-09-02 | 1987-04-07 | Wang Laboratories, Inc. | Single in-line memory module |
CA1232355A (fr) * | 1983-09-02 | 1988-02-02 | Wang Laboratories, Inc. | Module de memoire en ligne |
US5798961A (en) * | 1994-08-23 | 1998-08-25 | Emc Corporation | Non-volatile memory module |
-
1975
- 1975-11-04 DE DE19752549392 patent/DE2549392C3/de not_active Expired
-
1976
- 1976-10-27 GB GB4457276A patent/GB1557684A/en not_active Expired
- 1976-11-02 NL NL7612146A patent/NL7612146A/xx not_active Application Discontinuation
- 1976-11-03 FR FR7633105A patent/FR2331122A1/fr active Granted
Also Published As
Publication number | Publication date |
---|---|
DE2549392A1 (de) | 1977-05-05 |
DE2549392C3 (de) | 1978-07-27 |
FR2331122A1 (fr) | 1977-06-03 |
DE2549392B2 (de) | 1977-12-01 |
GB1557684A (en) | 1979-12-12 |
NL7612146A (nl) | 1977-05-06 |