FR2321123A1 - Mesure de l'anisotropie du pouvoir reflecteur d'une surface par analyse d'un faisceau de lumiere polarisee reflechie - Google Patents

Mesure de l'anisotropie du pouvoir reflecteur d'une surface par analyse d'un faisceau de lumiere polarisee reflechie

Info

Publication number
FR2321123A1
FR2321123A1 FR7614773A FR7614773A FR2321123A1 FR 2321123 A1 FR2321123 A1 FR 2321123A1 FR 7614773 A FR7614773 A FR 7614773A FR 7614773 A FR7614773 A FR 7614773A FR 2321123 A1 FR2321123 A1 FR 2321123A1
Authority
FR
France
Prior art keywords
anisotropy
analysis
measuring
polarized light
reflected polarized
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7614773A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Atomics Corp
Original Assignee
General Atomics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Atomics Corp filed Critical General Atomics Corp
Publication of FR2321123A1 publication Critical patent/FR2321123A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
FR7614773A 1975-08-11 1976-05-17 Mesure de l'anisotropie du pouvoir reflecteur d'une surface par analyse d'un faisceau de lumiere polarisee reflechie Withdrawn FR2321123A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/603,375 US3972619A (en) 1975-08-11 1975-08-11 Method and apparatus for surface analysis

Publications (1)

Publication Number Publication Date
FR2321123A1 true FR2321123A1 (fr) 1977-03-11

Family

ID=24415166

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7614773A Withdrawn FR2321123A1 (fr) 1975-08-11 1976-05-17 Mesure de l'anisotropie du pouvoir reflecteur d'une surface par analyse d'un faisceau de lumiere polarisee reflechie

Country Status (4)

Country Link
US (1) US3972619A (fr)
JP (1) JPS5222980A (fr)
DE (1) DE2621940A1 (fr)
FR (1) FR2321123A1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4436426A (en) 1978-01-03 1984-03-13 Raytheon Company High-precision reflectometer
US4342515A (en) * 1978-01-27 1982-08-03 Hitachi, Ltd. Method of inspecting the surface of an object and apparatus therefor
AT356935B (de) * 1978-05-02 1980-06-10 Vianova Kunstharz Ag Anordnung zur messung der das glanzvermoegen von oberflaechen bestimmenden eigenschaften
JPS60252315A (ja) * 1984-05-29 1985-12-13 Hamamatsu Photonics Kk 単色照明顕微鏡装置
US4641524A (en) * 1985-08-15 1987-02-10 Kms Fusion, Inc. Optical humidity sensor
JP2530454Y2 (ja) * 1989-07-27 1997-03-26 株式会社 京都フィッション・トラック 偏光顕微鏡用プリズム自転装置
KR100272329B1 (ko) * 1994-12-07 2000-11-15 이중구 비디오 마이크로스코프
WO2004053501A2 (fr) * 2002-12-11 2004-06-24 Arizona Board Of Regents, Acting For And On Behalf Of, Arizona State University Detecteur a polarisation amelioree dote de nanobatonnets d'or pour la detection de mouvements de rotation a l'echelle nanometrique, et procede associe
FR2886404B1 (fr) * 2005-05-25 2008-03-07 Framatome Anp Sas Procede de mesure de l'anisotropie dans un element comprenant au moins un materiau fissile et installation correspondante.
EP1883804A1 (fr) * 2005-05-25 2008-02-06 Commissariat A L'energie Atomique Procede de mesure de l'anisotropie d'un element contenant au moins une matiere fissile, et installation correspondante
JP2010134328A (ja) * 2008-12-08 2010-06-17 Disco Abrasive Syst Ltd 偏光素子およびレーザーユニット
KR102659810B1 (ko) * 2015-09-11 2024-04-23 삼성디스플레이 주식회사 결정화도 측정 장치 및 그 측정 방법

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2248503A1 (fr) * 1973-10-17 1975-05-16 Vickers Ltd

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2944463A (en) * 1955-01-14 1960-07-12 Zeiss Carl Illuminating device particularly for objects in microscopes

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2248503A1 (fr) * 1973-10-17 1975-05-16 Vickers Ltd

Also Published As

Publication number Publication date
JPS5222980A (en) 1977-02-21
DE2621940A1 (de) 1977-03-03
US3972619A (en) 1976-08-03

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Legal Events

Date Code Title Description
ST Notification of lapse