FR2314264A2 - Very pure thin films obtd. by reactive sputtering - using high frequency discharge in chamber contg. reaction gases - Google Patents

Very pure thin films obtd. by reactive sputtering - using high frequency discharge in chamber contg. reaction gases

Info

Publication number
FR2314264A2
FR2314264A2 FR7518043A FR7518043A FR2314264A2 FR 2314264 A2 FR2314264 A2 FR 2314264A2 FR 7518043 A FR7518043 A FR 7518043A FR 7518043 A FR7518043 A FR 7518043A FR 2314264 A2 FR2314264 A2 FR 2314264A2
Authority
FR
France
Prior art keywords
high frequency
thin films
reactive sputtering
reaction gases
contg
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7518043A
Other languages
French (fr)
Other versions
FR2314264B2 (en
Inventor
Bernard Bourdon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cegelec SA
Original Assignee
Cegelec SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cegelec SA filed Critical Cegelec SA
Priority to FR7518043A priority Critical patent/FR2314264A2/en
Publication of FR2314264A2 publication Critical patent/FR2314264A2/en
Application granted granted Critical
Publication of FR2314264B2 publication Critical patent/FR2314264B2/fr
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/34Nitrides
    • C23C16/345Silicon nitride
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • C23C16/5096Flat-bed apparatus

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Inorganic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

Film is formed by chemical vapour deposition, where a substrate is located in a chamber fed with a reaction gas. The substrate is located between two conducting surfaces across which a high-frequency potential is applied to obtain a plasma. Gas has a press. of 10-2 to 10-4 torr. The substrate is pref. Si, whereas the gas is either (a) mainly N2 contg. SiH4 so a deposit of Si3N4 is obtd.; or (b) mainly H2 or He, contg. SiH4 to produce a deposit of Si. Reactive cathodic sputtering esp. in mfg. semiconductors. The process can also be used to deposit GaN or doped layers of Si, e.g using B2H6 or AsH3 for doping with B or As.
FR7518043A 1975-06-10 1975-06-10 Very pure thin films obtd. by reactive sputtering - using high frequency discharge in chamber contg. reaction gases Granted FR2314264A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7518043A FR2314264A2 (en) 1975-06-10 1975-06-10 Very pure thin films obtd. by reactive sputtering - using high frequency discharge in chamber contg. reaction gases

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7518043A FR2314264A2 (en) 1975-06-10 1975-06-10 Very pure thin films obtd. by reactive sputtering - using high frequency discharge in chamber contg. reaction gases

Publications (2)

Publication Number Publication Date
FR2314264A2 true FR2314264A2 (en) 1977-01-07
FR2314264B2 FR2314264B2 (en) 1980-03-28

Family

ID=9156264

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7518043A Granted FR2314264A2 (en) 1975-06-10 1975-06-10 Very pure thin films obtd. by reactive sputtering - using high frequency discharge in chamber contg. reaction gases

Country Status (1)

Country Link
FR (1) FR2314264A2 (en)

Also Published As

Publication number Publication date
FR2314264B2 (en) 1980-03-28

Similar Documents

Publication Publication Date Title
IL48478A (en) Process and apparatus for producing compound thin films on a surface by deposition from the gaseous phase
UA18259A (en) StarWriterMETHOD FOR CONTROL OF PLASMA DEPOSITION OF THIN FILMS IN VACUUM
TW368688B (en) Method and apparatus for plasma-assisted film deposition
EP0936284A3 (en) Method and apparatus for producing thin films
ES8503453A1 (en) Method of making amorphous semiconductor alloys and devices using microwave energy.
JPS5628637A (en) Film making method
RU98119152A (en) METHOD FOR PRODUCING HOMOEPITAXIAL DIAMOND THIN FILM AND DEVICE FOR ITS IMPLEMENTATION
GB1118757A (en) Method of depositing silicon nitride films
KR960034479A (en) METHOD FOR MANUFACTING OXIDE FILM AND METHOD FOR PRODUCING THE SAME
DE10345824A1 (en) Arrangement for depositing atomic layers onto substrates used in the production of semiconductors comprises a source for trimethylaluminum vapor and a source for water connected together
FR2314264A2 (en) Very pure thin films obtd. by reactive sputtering - using high frequency discharge in chamber contg. reaction gases
JPS5536980A (en) Production of film by plasma reaction
FR2213586A1 (en) Doped dielectric film deposition at low temp and press - using plasma discharge to initiate reaction of organometallic cpd in inert gas, silane and nitrogen dioxide
JPS5471577A (en) Production of semiconductor device
KR960036155A (en) P.L.T. Thin film manufacturing method
JPS6451620A (en) Vapor growth method
JPH0361371A (en) Thin film forming device
JPS61256625A (en) Manufacture of thin film semiconductor element
JPS61266575A (en) Substrate stuck with thin tin nitride film and its production
JPS5685877A (en) Treatment of amorphous semiconductor film
FR2411897A2 (en) RF sputtering of thin semiconductor films - using polarisation impedance and gas pressure gradient to give high deposition rate
JPS6431468A (en) Manufacture of thin film transistor
KR950002061A (en) Tantalum oxide thin film formation method and its application
JPS63123802A (en) Production of carbon film
JPS57166029A (en) Forming method for film

Legal Events

Date Code Title Description
CL Concession to grant licenses