FR2296262A1 - Appareil d'ionisation pour spectrometre de masse quadrupolaire - Google Patents

Appareil d'ionisation pour spectrometre de masse quadrupolaire

Info

Publication number
FR2296262A1
FR2296262A1 FR7539390A FR7539390A FR2296262A1 FR 2296262 A1 FR2296262 A1 FR 2296262A1 FR 7539390 A FR7539390 A FR 7539390A FR 7539390 A FR7539390 A FR 7539390A FR 2296262 A1 FR2296262 A1 FR 2296262A1
Authority
FR
France
Prior art keywords
mass spectrometer
ionization device
quadrupolar mass
quadrupolar
ionization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7539390A
Other languages
English (en)
French (fr)
Other versions
FR2296262B1 (instruction
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Co
Original Assignee
Minnesota Mining and Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minnesota Mining and Manufacturing Co filed Critical Minnesota Mining and Manufacturing Co
Publication of FR2296262A1 publication Critical patent/FR2296262A1/fr
Application granted granted Critical
Publication of FR2296262B1 publication Critical patent/FR2296262B1/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7539390A 1974-12-23 1975-12-22 Appareil d'ionisation pour spectrometre de masse quadrupolaire Granted FR2296262A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/535,805 US3939344A (en) 1974-12-23 1974-12-23 Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers

Publications (2)

Publication Number Publication Date
FR2296262A1 true FR2296262A1 (fr) 1976-07-23
FR2296262B1 FR2296262B1 (instruction) 1981-09-18

Family

ID=24135839

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7539390A Granted FR2296262A1 (fr) 1974-12-23 1975-12-22 Appareil d'ionisation pour spectrometre de masse quadrupolaire

Country Status (6)

Country Link
US (1) US3939344A (instruction)
JP (1) JPS5829578B2 (instruction)
CH (1) CH610440A5 (instruction)
DE (1) DE2558107A1 (instruction)
FR (1) FR2296262A1 (instruction)
GB (1) GB1537250A (instruction)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4075479A (en) * 1976-03-04 1978-02-21 Finnigan Corporation Focusing ion lens system for mass spectrometer for separating charged and neutral particles
US4107526A (en) * 1976-03-22 1978-08-15 Minnesota Mining And Manufacturing Company Ion scattering spectrometer with modified bias
US4481415A (en) * 1982-10-27 1984-11-06 Shimadzu Corporation Quadrupole mass spectrometer
CA1245778A (en) * 1985-10-24 1988-11-29 John B. French Mass analyzer system with reduced drift
US4719349A (en) * 1986-05-27 1988-01-12 The United States Of America As Represented By The Department Of Health And Human Services Electrochemical sample probe for use in fast-atom bombardment mass spectrometry
US4814613A (en) * 1987-03-06 1989-03-21 Extrel Corporation Collision cell for triple quadrupole tandem mass spectrometry
US4800273A (en) * 1988-01-07 1989-01-24 Phillips Bradway F Secondary ion mass spectrometer
JPH02304854A (ja) * 1989-05-19 1990-12-18 Jeol Ltd 同時検出型質量分析装置
JPH05500726A (ja) * 1989-06-06 1993-02-12 ヴァイキング　インストゥルメンツ　コーポレーション 小型質量分析器システム
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
US4968888A (en) * 1989-07-05 1990-11-06 The United States Of America As Represented By The United States Department Of Energy Pulsed field sample neutralization
DE19511333C1 (de) * 1995-03-28 1996-08-08 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für orthogonalen Einschuß von Ionen in ein Flugzeit-Massenspektrometer
US5596193A (en) * 1995-10-11 1997-01-21 California Institute Of Technology Miniature quadrupole mass spectrometer array
US8796620B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8796638B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8450681B2 (en) 2011-06-08 2013-05-28 Mks Instruments, Inc. Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3473018A (en) * 1967-03-02 1969-10-14 Bell & Howell Co Mass analyzer using two spaced,tubular,and coaxial electrodes
DE2255302C3 (de) * 1972-11-11 1980-09-11 Leybold-Heraeus Gmbh, 5000 Koeln Einrichtung für die Sekundär-Ionen-Massenspektroskopie

Also Published As

Publication number Publication date
JPS5189492A (instruction) 1976-08-05
GB1537250A (en) 1978-12-29
US3939344A (en) 1976-02-17
CH610440A5 (instruction) 1979-04-12
FR2296262B1 (instruction) 1981-09-18
JPS5829578B2 (ja) 1983-06-23
DE2558107A1 (de) 1976-06-24

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Legal Events

Date Code Title Description
TP Transmission of property
CD Change of name or company name
ST Notification of lapse