FR2288432A1 - Analyseur differentiel a echantillonnage - Google Patents

Analyseur differentiel a echantillonnage

Info

Publication number
FR2288432A1
FR2288432A1 FR7530857A FR7530857A FR2288432A1 FR 2288432 A1 FR2288432 A1 FR 2288432A1 FR 7530857 A FR7530857 A FR 7530857A FR 7530857 A FR7530857 A FR 7530857A FR 2288432 A1 FR2288432 A1 FR 2288432A1
Authority
FR
France
Prior art keywords
differential sampling
sampling analyzer
analyzer
differential
sampling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7530857A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CBS Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of FR2288432A1 publication Critical patent/FR2288432A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FR7530857A 1974-10-17 1975-10-08 Analyseur differentiel a echantillonnage Withdrawn FR2288432A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/515,748 US3987241A (en) 1974-10-17 1974-10-17 Sampled differential analyzer

Publications (1)

Publication Number Publication Date
FR2288432A1 true FR2288432A1 (fr) 1976-05-14

Family

ID=24052589

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7530857A Withdrawn FR2288432A1 (fr) 1974-10-17 1975-10-08 Analyseur differentiel a echantillonnage

Country Status (5)

Country Link
US (1) US3987241A (fr)
JP (1) JPS5166857A (fr)
DE (1) DE2546070A1 (fr)
FR (1) FR2288432A1 (fr)
GB (1) GB1489678A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2447550A1 (fr) * 1979-01-25 1980-08-22 Hajime Industries Dispositif d'examen d'objets

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2700252C2 (de) * 1977-01-05 1985-03-14 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zum Prüfen definierter Strukturen
US4152723A (en) * 1977-12-19 1979-05-01 Sperry Rand Corporation Method of inspecting circuit boards and apparatus therefor
DE2822204A1 (de) * 1978-05-22 1979-11-29 Opto Produkte Ag Reifenpruefgeraet
DE2834504C2 (de) * 1978-08-07 1986-07-10 Výzkumný ústav 070, Brünn/Brno Vorrichtung zur Auswertung von Deformationscharakteristiken
DE2934038C2 (de) * 1979-08-23 1982-02-25 Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln Rißfortschritts-Meßeinrichtung
JPS5744824A (en) * 1980-09-01 1982-03-13 Hitachi Ltd Spectrum display device
JPS5870105A (ja) * 1981-10-22 1983-04-26 Mitsubishi Electric Corp 形状検出装置
DE3406375A1 (de) * 1984-02-22 1985-08-22 SIGNUM Computer für Signalverarbeitung und Mustererkennung GmbH, 8000 München Geraet zur bestimmung von oberflaechenprofilen von nichttransparentem material durch digitale auswertung einer sequenz von mikroskopbildern mit unterschiedlichen schaerfeebenen
JPS61102507A (ja) * 1984-10-26 1986-05-21 Amada Co Ltd 計測検査システム
JPS62263404A (ja) * 1986-05-10 1987-11-16 Fujitsu Ltd パタ−ン検査装置
US5835621A (en) * 1992-09-15 1998-11-10 Gaston A. Vandermeerssche Abrasion analyzer and testing method
WO2006009087A1 (fr) * 2004-07-20 2006-01-26 Matsushita Electric Industrial Co., Ltd. Dispositif de réception/reproduction de données en flux et méthode de réception/reproduction de données en flux

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system
US3321575A (en) * 1964-02-11 1967-05-23 Jolew Corp Television inspection apparatus adapted for measurement and comparison purposes
US3823261A (en) * 1968-05-27 1974-07-09 E Bolsey Image motion and change transducers and systems controlled thereby
JPS4945428B1 (fr) * 1968-10-05 1974-12-04
US3715480A (en) * 1969-09-29 1973-02-06 Itt Motion detection system
JPS51951B2 (fr) * 1971-09-06 1976-01-12
JPS4898886A (fr) * 1972-03-29 1973-12-14
US3916439A (en) * 1974-03-08 1975-10-28 Westinghouse Electric Corp Inspection system employing differential imaging

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2447550A1 (fr) * 1979-01-25 1980-08-22 Hajime Industries Dispositif d'examen d'objets

Also Published As

Publication number Publication date
GB1489678A (en) 1977-10-26
DE2546070A1 (de) 1976-04-22
JPS5166857A (fr) 1976-06-09
US3987241A (en) 1976-10-19

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Legal Events

Date Code Title Description
ST Notification of lapse