FR2286501A1 - Installation de detection d'ions par spectrometrie de masse - Google Patents

Installation de detection d'ions par spectrometrie de masse

Info

Publication number
FR2286501A1
FR2286501A1 FR7528199A FR7528199A FR2286501A1 FR 2286501 A1 FR2286501 A1 FR 2286501A1 FR 7528199 A FR7528199 A FR 7528199A FR 7528199 A FR7528199 A FR 7528199A FR 2286501 A1 FR2286501 A1 FR 2286501A1
Authority
FR
France
Prior art keywords
mass spectrometry
ion detection
detection installation
spectrometry ion
installation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7528199A
Other languages
English (en)
French (fr)
Other versions
FR2286501B1 (OSRAM
Inventor
Ernst Lobach
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Balzers Patent und Beteiligungs AG
Original Assignee
Balzers Patent und Beteiligungs AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Balzers Patent und Beteiligungs AG filed Critical Balzers Patent und Beteiligungs AG
Publication of FR2286501A1 publication Critical patent/FR2286501A1/fr
Application granted granted Critical
Publication of FR2286501B1 publication Critical patent/FR2286501B1/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/08—Deviation, concentration or focusing of the beam by electric or magnetic means
    • G21K1/087—Deviation, concentration or focusing of the beam by electric or magnetic means by electrical means

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
FR7528199A 1974-09-30 1975-09-15 Installation de detection d'ions par spectrometrie de masse Granted FR2286501A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1313974A CH583460A5 (OSRAM) 1974-09-30 1974-09-30

Publications (2)

Publication Number Publication Date
FR2286501A1 true FR2286501A1 (fr) 1976-04-23
FR2286501B1 FR2286501B1 (OSRAM) 1980-01-11

Family

ID=4389658

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7528199A Granted FR2286501A1 (fr) 1974-09-30 1975-09-15 Installation de detection d'ions par spectrometrie de masse

Country Status (6)

Country Link
US (1) US4047030A (OSRAM)
CH (1) CH583460A5 (OSRAM)
DE (1) DE2538123A1 (OSRAM)
FR (1) FR2286501A1 (OSRAM)
GB (1) GB1473054A (OSRAM)
NL (1) NL161918B (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2316721A1 (fr) * 1975-06-30 1977-01-28 Ibm Procede et appareil de deflexion electrostatique de faisceaux ioniques a courant eleve intervenant dans un appareil de balayage

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3037258A1 (de) * 1980-10-02 1982-05-19 Leybold-Heraeus GmbH, 5000 Köln Energie- oder massendispersiver analysator fuer elektrisch geladene teilchen
EP0107320A3 (en) * 1982-09-17 1986-11-20 Dubilier Scientific Limited Improvements relating to ion-beam apparatus
US4719349A (en) * 1986-05-27 1988-01-12 The United States Of America As Represented By The Department Of Health And Human Services Electrochemical sample probe for use in fast-atom bombardment mass spectrometry
SE461549B (sv) * 1988-06-13 1990-02-26 Sefors Ab Anordning vid ett straalningsdetekteringssystem med ett gasurladdningsroer
US5605798A (en) 1993-01-07 1997-02-25 Sequenom, Inc. DNA diagnostic based on mass spectrometry
US5464975A (en) * 1993-12-14 1995-11-07 Massively Parallel Instruments Method and apparatus for charged particle collection, conversion, fragmentation or detection
US5495107A (en) * 1994-04-06 1996-02-27 Thermo Jarrell Ash Corporation Analysis
JP3189652B2 (ja) * 1995-12-01 2001-07-16 株式会社日立製作所 質量分析装置
JP3355270B2 (ja) * 1996-02-05 2002-12-09 アルプス電気株式会社 発光モジュール
US5864137A (en) * 1996-10-01 1999-01-26 Genetrace Systems, Inc. Mass spectrometer
ATE375403T1 (de) 1996-11-06 2007-10-15 Sequenom Inc Dna-diagnostik mittels massenspektrometrie
JP2001524808A (ja) 1996-12-10 2001-12-04 ジーントレイス・システムズ・インコーポレイテッド 放出可能な不揮発性の質量標識分子
US6043488A (en) * 1997-08-18 2000-03-28 The Perkin-Elmer Corporation Carrier gas separator for mass spectroscopy
JP2000067807A (ja) * 1998-08-25 2000-03-03 Perkin Elmer Corp:The イオンビームからイオンを分離するための方法及び装置
ATE423221T1 (de) 2000-06-13 2009-03-15 Univ Boston Verwendung von mass-matched nukleotide in der analyse von oligonukleotidmischungen sowie in der hoch-multiplexen nukleinsäuresequenzierung
US7465919B1 (en) * 2006-03-22 2008-12-16 Itt Manufacturing Enterprises, Inc. Ion detection system with neutral noise suppression
GB0612503D0 (en) * 2006-06-23 2006-08-02 Micromass Ltd Mass spectrometer
CN103858201A (zh) 2011-03-04 2014-06-11 珀金埃尔默健康科学股份有限公司 静电透镜及包括该静电透镜的系统
KR101633978B1 (ko) 2014-06-20 2016-06-28 한국표준과학연구원 모노크로메이터 및 이를 구비한 하전입자빔 장치

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2255302C3 (de) * 1972-11-11 1980-09-11 Leybold-Heraeus Gmbh, 5000 Koeln Einrichtung für die Sekundär-Ionen-Massenspektroskopie

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2316721A1 (fr) * 1975-06-30 1977-01-28 Ibm Procede et appareil de deflexion electrostatique de faisceaux ioniques a courant eleve intervenant dans un appareil de balayage

Also Published As

Publication number Publication date
NL161918B (nl) 1979-10-15
US4047030A (en) 1977-09-06
NL7416698A (nl) 1976-04-01
GB1473054A (en) 1977-05-11
FR2286501B1 (OSRAM) 1980-01-11
CH583460A5 (OSRAM) 1976-12-31
DE2538123A1 (de) 1976-04-08

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Legal Events

Date Code Title Description
ST Notification of lapse