FR2266901B1 - - Google Patents

Info

Publication number
FR2266901B1
FR2266901B1 FR7510218A FR7510218A FR2266901B1 FR 2266901 B1 FR2266901 B1 FR 2266901B1 FR 7510218 A FR7510218 A FR 7510218A FR 7510218 A FR7510218 A FR 7510218A FR 2266901 B1 FR2266901 B1 FR 2266901B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7510218A
Other languages
French (fr)
Other versions
FR2266901A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
USS Engineers and Consultants Inc
Original Assignee
USS Engineers and Consultants Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by USS Engineers and Consultants Inc filed Critical USS Engineers and Consultants Inc
Publication of FR2266901A1 publication Critical patent/FR2266901A1/fr
Application granted granted Critical
Publication of FR2266901B1 publication Critical patent/FR2266901B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
FR7510218A 1974-04-08 1975-04-02 Expired FR2266901B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US458555A US3917950A (en) 1974-04-08 1974-04-08 Fluoroscopic screen which is optically homogeneous

Publications (2)

Publication Number Publication Date
FR2266901A1 FR2266901A1 (en) 1975-10-31
FR2266901B1 true FR2266901B1 (en) 1978-10-20

Family

ID=23821230

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7510218A Expired FR2266901B1 (en) 1974-04-08 1975-04-02

Country Status (9)

Country Link
US (1) US3917950A (en)
JP (2) JPS50146385A (en)
CA (1) CA1031082A (en)
DE (1) DE2514942A1 (en)
DK (1) DK146775A (en)
FR (1) FR2266901B1 (en)
GB (1) GB1458947A (en)
IT (1) IT1036204B (en)
NL (1) NL7503894A (en)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4078180A (en) * 1976-03-17 1978-03-07 United States Steel Corporation X-ray inspection of welds
US4107534A (en) * 1977-06-13 1978-08-15 Piltingsrud Harley V Plutonium-americium detection probe with frontal light-guide-diffuser
US4204125A (en) * 1978-03-27 1980-05-20 Minnesota Mining And Manufacturing Company High resolution X-ray intensifying screen with antireflecting substrate
US4263061A (en) * 1978-03-27 1981-04-21 Minnesota Mining And Manufacturing Company Process for forming a high resolution X-ray intensifying screen with antireflecting substrate
JPS5578942U (en) * 1978-11-22 1980-05-30
JPS56126750A (en) * 1980-03-11 1981-10-05 Mitsubishi Electric Corp Inspecting device for transmission of radiant ray
US4360733A (en) * 1980-09-08 1982-11-23 Bicron Corporation Window assembly for a deep well scintillation detector
JPS5863559U (en) * 1981-10-24 1983-04-28 株式会社島津製作所 X-ray fluoroscope
JPS58204400A (en) * 1982-05-24 1983-11-29 富士写真フイルム株式会社 Radiation image conversion panel
EP0285702B1 (en) * 1984-04-06 1993-11-03 Fuji Photo Film Co., Ltd. Stimulable phosphor sheet
US4636644A (en) * 1984-05-01 1987-01-13 Irt Corporation Anti-parallax scintillator system for use with penetrating ionizing radiation
JPS61228399A (en) * 1985-04-03 1986-10-11 富士写真フイルム株式会社 Radiation image conversion panel and making thereof
GB2199443B (en) * 1986-12-04 1990-10-03 Rank Cintel Ltd Improvements in cathode ray tubes
EP0498908A1 (en) * 1991-02-13 1992-08-19 Siemens Aktiengesellschaft Storage phosphor screen with a stimulable storage phosphor
US5498923A (en) * 1994-01-05 1996-03-12 At&T Corp. Fluoresence imaging
EP1684095B1 (en) * 1998-06-18 2013-09-04 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
JP4550976B2 (en) * 2000-07-31 2010-09-22 浜松ホトニクス株式会社 Photocathode and electron tube
JP2002181997A (en) * 2000-12-14 2002-06-26 Fuji Photo Film Co Ltd Radiation image conversion panel and method of reading radiation image information
DE10318560A1 (en) * 2003-04-24 2004-11-11 Carl Zeiss Sms Gmbh Arrangement for the inspection of objects, in particular masks in microlithography
DE10335125B4 (en) * 2003-07-31 2007-09-13 Siemens Ag Method for producing a phosphor body for an x-ray detector
US7057187B1 (en) * 2003-11-07 2006-06-06 Xradia, Inc. Scintillator optical system and method of manufacture
JP4813294B2 (en) * 2006-08-29 2011-11-09 浜松ホトニクス株式会社 Optical inspection device
CN102695966B (en) * 2009-11-16 2015-08-05 圣戈本陶瓷及塑料股份有限公司 Scintillation article
JP6487263B2 (en) * 2015-04-20 2019-03-20 浜松ホトニクス株式会社 Radiation detector and manufacturing method thereof
JP6862324B2 (en) * 2017-09-27 2021-04-21 浜松ホトニクス株式会社 Scintillator panel and radiation detector
US10490397B1 (en) * 2018-07-18 2019-11-26 Thermo Finnigan Llc Methods and systems for detection of ion spatial distribution

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3745359A (en) * 1971-03-22 1973-07-10 Picker Corp Scintillation crystal with reflection inhibiting material and scintillation device embodying the crystal

Also Published As

Publication number Publication date
US3917950A (en) 1975-11-04
JPS50146385A (en) 1975-11-25
DE2514942A1 (en) 1975-10-16
DK146775A (en) 1975-10-09
NL7503894A (en) 1975-10-10
JPS5917879U (en) 1984-02-03
CA1031082A (en) 1978-05-09
GB1458947A (en) 1976-12-15
FR2266901A1 (en) 1975-10-31
IT1036204B (en) 1979-10-30

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Legal Events

Date Code Title Description
TP Transmission of property
ST Notification of lapse