FR2246976A1 - Ion or electron converter for mass spectroscopes - has evacuated envelope with charged and uncharged particles injection - Google Patents

Ion or electron converter for mass spectroscopes - has evacuated envelope with charged and uncharged particles injection

Info

Publication number
FR2246976A1
FR2246976A1 FR7433032A FR7433032A FR2246976A1 FR 2246976 A1 FR2246976 A1 FR 2246976A1 FR 7433032 A FR7433032 A FR 7433032A FR 7433032 A FR7433032 A FR 7433032A FR 2246976 A1 FR2246976 A1 FR 2246976A1
Authority
FR
France
Prior art keywords
charged
ion
uncharged particles
evacuated envelope
electron converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7433032A
Other languages
French (fr)
Other versions
FR2246976B3 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of FR2246976A1 publication Critical patent/FR2246976A1/en
Application granted granted Critical
Publication of FR2246976B3 publication Critical patent/FR2246976B3/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

The ion/electron converter has a device for injection of charged and uncharged particles into its evacuated envelope along a starting path. The envelope contains a conversion electrode and a collector electrode and a device for generating an electric field between the two electrodes. Both the conversion and collector electrodes are arranged outside the starting path of the injected particles, in which is incorporated a noise suppressor with a number of depressions, screening the two electrodes against generated electromagnetic radiation due to impingement of uncharged particles. electric fields generated between the envelope, the conversion electrode and the noise suppressor deflect the charged particles from the starting path to the conversion electrode.
FR7433032A 1973-10-03 1974-10-01 Ion or electron converter for mass spectroscopes - has evacuated envelope with charged and uncharged particles injection Granted FR2246976A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US40323073A 1973-10-03 1973-10-03

Publications (2)

Publication Number Publication Date
FR2246976A1 true FR2246976A1 (en) 1975-05-02
FR2246976B3 FR2246976B3 (en) 1977-07-08

Family

ID=23594996

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7433032A Granted FR2246976A1 (en) 1973-10-03 1974-10-01 Ion or electron converter for mass spectroscopes - has evacuated envelope with charged and uncharged particles injection

Country Status (4)

Country Link
JP (1) JPS5515066B2 (en)
DE (1) DE2445711A1 (en)
FR (1) FR2246976A1 (en)
IT (1) IT1019448B (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0281413A2 (en) * 1987-03-06 1988-09-07 FISONS plc Mass spectrometer for positive and negative ions
FR2618605A1 (en) * 1987-07-22 1989-01-27 Nermag Sa Ste Nouvelle Device for detecting and amplifying small positive or negative ion currents
EP0345605A1 (en) * 1988-06-01 1989-12-13 Hitachi, Ltd. Mass spectrometer
FR2658361A1 (en) * 1990-02-14 1991-08-16 Nermag Ste Nouvelle Device for detecting and amplifying weak positive and negative ion currents
DE4019005A1 (en) * 1990-06-13 1991-12-19 Finnigan Mat Gmbh DEVICE AND METHOD FOR ANALYZING HIGH-VOLUME IONS
EP0559202A1 (en) * 1992-03-04 1993-09-08 Ebara Corporation Secondary ion mass spectrometer for analyzing positive and negative ions
EP0890975A1 (en) * 1997-07-12 1999-01-13 Eaton Corporation System and method for detecting neutral particles in an ion beam

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4066894A (en) * 1976-01-20 1978-01-03 University Of Virginia Positive and negative ion recording system for mass spectrometer
DE2741489A1 (en) * 1977-05-09 1978-11-16 Univ Virginia Double action mass spectrometer system - has device for generating positive and negative ions and collecting them separately
JPS5859013A (en) * 1981-08-25 1983-04-07 Kiyoshi Takeda Hook stamper
JPS604029A (en) * 1983-06-23 1985-01-10 Morito Kk Method of expressing pattern on surface of fixing member made of synthetic resin

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0281413A2 (en) * 1987-03-06 1988-09-07 FISONS plc Mass spectrometer for positive and negative ions
EP0281413A3 (en) * 1987-03-06 1989-09-27 Vg Instruments Group Limited Mass spectrometer for positive and negative ions
FR2618605A1 (en) * 1987-07-22 1989-01-27 Nermag Sa Ste Nouvelle Device for detecting and amplifying small positive or negative ion currents
EP0345605A1 (en) * 1988-06-01 1989-12-13 Hitachi, Ltd. Mass spectrometer
FR2658361A1 (en) * 1990-02-14 1991-08-16 Nermag Ste Nouvelle Device for detecting and amplifying weak positive and negative ion currents
DE4019005A1 (en) * 1990-06-13 1991-12-19 Finnigan Mat Gmbh DEVICE AND METHOD FOR ANALYZING HIGH-VOLUME IONS
DE4019005C2 (en) * 1990-06-13 2000-03-09 Finnigan Mat Gmbh Devices for analyzing high mass ions
EP0559202A1 (en) * 1992-03-04 1993-09-08 Ebara Corporation Secondary ion mass spectrometer for analyzing positive and negative ions
US5401965A (en) * 1992-03-04 1995-03-28 Ebara Corporation Secondary ion mass spectrometer for analyzing positive and negative ions
EP0890975A1 (en) * 1997-07-12 1999-01-13 Eaton Corporation System and method for detecting neutral particles in an ion beam

Also Published As

Publication number Publication date
JPS5070087A (en) 1975-06-11
FR2246976B3 (en) 1977-07-08
DE2445711A1 (en) 1975-04-10
JPS5515066B2 (en) 1980-04-21
IT1019448B (en) 1977-11-10

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Legal Events

Date Code Title Description
ST Notification of lapse