FR2211659A1 - - Google Patents

Info

Publication number
FR2211659A1
FR2211659A1 FR7344148A FR7344148A FR2211659A1 FR 2211659 A1 FR2211659 A1 FR 2211659A1 FR 7344148 A FR7344148 A FR 7344148A FR 7344148 A FR7344148 A FR 7344148A FR 2211659 A1 FR2211659 A1 FR 2211659A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7344148A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bull HN Information Systems Italia SpA
Bull HN Information Systems Inc
Original Assignee
Honeywell Information Systems Italia SpA
Honeywell Information Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Information Systems Italia SpA, Honeywell Information Systems Inc filed Critical Honeywell Information Systems Italia SpA
Publication of FR2211659A1 publication Critical patent/FR2211659A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
FR7344148A 1972-12-20 1973-12-11 Withdrawn FR2211659A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00316796A US3842346A (en) 1972-12-20 1972-12-20 Continuity testing of solid state circuitry during temperature cycling

Publications (1)

Publication Number Publication Date
FR2211659A1 true FR2211659A1 (fr) 1974-07-19

Family

ID=23230725

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7344148A Withdrawn FR2211659A1 (fr) 1972-12-20 1973-12-11

Country Status (4)

Country Link
US (1) US3842346A (fr)
JP (1) JPS4991383A (fr)
DE (1) DE2363604A1 (fr)
FR (1) FR2211659A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0060194A1 (fr) * 1981-03-11 1982-09-15 Commissariat à l'Energie Atomique Système de test de la défaillance ou du bon fonctionnement d'un circuit à composants logiques
FR2509563A1 (fr) * 1981-07-10 1983-01-14 Thomson Csf Dispositif support de circuits integres utilise dans un systeme de selection de circuits integres a haute fiabilite

Families Citing this family (36)

* Cited by examiner, † Cited by third party
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DE2559004C2 (de) * 1975-12-29 1978-09-28 Ibm Deutschland Gmbh, 7000 Stuttgart Anordnung zur Prüfung von elektrischen Prüflingen mit einer Vielzahl von Prüfkontakten
DE2753684C2 (de) * 1977-12-02 1982-09-30 Erich 8000 München Reitinger Drehbarer Auflagetisch für automatische Prober zur Halterung von Wafern
US4374317A (en) * 1979-07-05 1983-02-15 Reliability, Inc. Burn-in chamber
US4379259A (en) * 1980-03-12 1983-04-05 National Semiconductor Corporation Process of performing burn-in and parallel functional testing of integrated circuit memories in an environmental chamber
US4528504A (en) * 1982-05-27 1985-07-09 Harris Corporation Pulsed linear integrated circuit tester
US4616178A (en) * 1982-05-27 1986-10-07 Harris Corporation Pulsed linear integrated circuit tester
ATE49303T1 (de) * 1984-09-21 1990-01-15 Siemens Ag Einrichtung fuer die funktionspruefung integrierter schaltkreise.
WO1987001813A1 (fr) * 1985-09-23 1987-03-26 Sharetree Limited Four de deverminage de circuits integres
US4751455A (en) * 1985-12-04 1988-06-14 Analog Devices, Inc. Low frequency noise measurement system using sliding pole for fast settling
US4696578A (en) * 1986-06-19 1987-09-29 International Business Machines Corporation Single chip thermal tester
US4713612A (en) * 1986-07-14 1987-12-15 Hughes Aircraft Company Method and apparatus for determination of junction-to-case thermal resistance for a hybrid circuit element
DK208087A (da) * 1987-04-24 1988-10-25 Scantest Systems A S Fremgangsmaade og kredsloebskort til udfoerelse af test under burn-in af integrerede halvlederkredsloeb
US4989991A (en) * 1987-10-26 1991-02-05 Ag Processing Technologies, Inc. Emissivity calibration apparatus and method
US4820976A (en) * 1987-11-24 1989-04-11 Advanced Micro Devices, Inc. Test fixture capable of electrically testing an integrated circuit die having a planar array of contacts
US5646540A (en) * 1989-04-19 1997-07-08 Interuniversitair Micro-Elektronic Centrum Vzw Apparatus and method for measuring electromagnetic ageing parameter of a circuit element and predicting its values
US5047711A (en) * 1989-08-23 1991-09-10 Silicon Connections Corporation Wafer-level burn-in testing of integrated circuits
US5166606A (en) * 1989-11-03 1992-11-24 John H. Blanz Company, Inc. High efficiency cryogenic test station
US5077523A (en) * 1989-11-03 1991-12-31 John H. Blanz Company, Inc. Cryogenic probe station having movable chuck accomodating variable thickness probe cards
US5160883A (en) * 1989-11-03 1992-11-03 John H. Blanz Company, Inc. Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support
US5361032A (en) * 1992-01-27 1994-11-01 Motorola, Inc. Method of troubleshooting electronic circuit board assemblies using temperature isolation
US5162742A (en) * 1992-01-29 1992-11-10 International Business Machines Corporation Method for locating electrical shorts in electronic substrates
US5260668A (en) * 1992-06-11 1993-11-09 Prometrix Corporation Semiconductor surface resistivity probe with semiconductor temperature control
US5307018A (en) * 1992-07-01 1994-04-26 Ashok Gadgil Apparatus and method to detect an impending failure of a cirucit caused by deposits of aerosol
JPH0653299A (ja) * 1992-07-31 1994-02-25 Tokyo Electron Yamanashi Kk バーンイン装置
JP3214766B2 (ja) * 1992-08-06 2001-10-02 アジレント・テクノロジーズ・インク 接続検査のための装置
US5833365A (en) * 1995-03-24 1998-11-10 Interuniversitair Micro-Electronika Centrum Vzw Method for local temperature sensing for use in performing high resolution in-situ parameter measurements
US5744967A (en) * 1995-08-24 1998-04-28 Sorensen; Brent A. Apparatus for detecting intermittent and continuous faults in multiple conductor wiring and terminations for electronic systems
US5977785A (en) * 1996-05-28 1999-11-02 Burward-Hoy; Trevor Method and apparatus for rapidly varying the operating temperature of a semiconductor device in a testing environment
US7133726B1 (en) * 1997-03-28 2006-11-07 Applera Corporation Thermal cycler for PCR
US7099599B2 (en) * 2003-08-15 2006-08-29 Static Control Components, Inc. System and method for port testing and configuration
US8029186B2 (en) * 2004-11-05 2011-10-04 International Business Machines Corporation Method for thermal characterization under non-uniform heat load
JP2006234635A (ja) * 2005-02-25 2006-09-07 Three M Innovative Properties Co フレキシブルプリント配線板の接合部の非破壊検査方法
CN1862249B (zh) 2006-04-20 2012-01-04 上海科勒电子科技有限公司 干电池供电主动式红外感应器具的节能处理方法
US20100039117A1 (en) * 2008-08-11 2010-02-18 Dcg Systems, Inc. Temperature control system for a device under test
JP2010251485A (ja) * 2009-04-15 2010-11-04 Sony Corp 熱電装置、熱電装置の製造方法、熱電装置の制御システム及び電子機器
US11378468B2 (en) * 2016-08-12 2022-07-05 Brightsentinel Limited Sensor module and process for producing same

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3617879A (en) * 1969-09-22 1971-11-02 Int Standard Electric Corp Apparatus for automatically indicating whether or not a test joint in a circuit is above or below a predetermined reference potential
US3609547A (en) * 1970-03-27 1971-09-28 Eugene A Slusser Integrated circuit test system
US3676777A (en) * 1970-08-10 1972-07-11 Tektronix Inc Apparatus for automatically testing integrated circuit devices

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0060194A1 (fr) * 1981-03-11 1982-09-15 Commissariat à l'Energie Atomique Système de test de la défaillance ou du bon fonctionnement d'un circuit à composants logiques
US4520309A (en) * 1981-03-11 1985-05-28 Commissariat A L'energie Atomique System for testing the malfunctioning or correct operation of a circuit with logic components
FR2509563A1 (fr) * 1981-07-10 1983-01-14 Thomson Csf Dispositif support de circuits integres utilise dans un systeme de selection de circuits integres a haute fiabilite

Also Published As

Publication number Publication date
DE2363604A1 (de) 1974-06-27
JPS4991383A (fr) 1974-08-31
US3842346A (en) 1974-10-15

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Legal Events

Date Code Title Description
ST Notification of lapse