FR2200527B1 - - Google Patents

Info

Publication number
FR2200527B1
FR2200527B1 FR737333822A FR7333822A FR2200527B1 FR 2200527 B1 FR2200527 B1 FR 2200527B1 FR 737333822 A FR737333822 A FR 737333822A FR 7333822 A FR7333822 A FR 7333822A FR 2200527 B1 FR2200527 B1 FR 2200527B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR737333822A
Other versions
FR2200527A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iwatsu Electric Co Ltd
Original Assignee
Iwatsu Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iwatsu Electric Co Ltd filed Critical Iwatsu Electric Co Ltd
Publication of FR2200527A1 publication Critical patent/FR2200527A1/fr
Application granted granted Critical
Publication of FR2200527B1 publication Critical patent/FR2200527B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
FR737333822A 1972-09-21 1973-09-20 Expired FR2200527B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9492672A JPS539542B2 (fr) 1972-09-21 1972-09-21

Publications (2)

Publication Number Publication Date
FR2200527A1 FR2200527A1 (fr) 1974-04-19
FR2200527B1 true FR2200527B1 (fr) 1979-02-09

Family

ID=14123563

Family Applications (1)

Application Number Title Priority Date Filing Date
FR737333822A Expired FR2200527B1 (fr) 1972-09-21 1973-09-20

Country Status (6)

Country Link
US (1) US3824459A (fr)
JP (1) JPS539542B2 (fr)
DE (1) DE2347450C3 (fr)
FR (1) FR2200527B1 (fr)
GB (1) GB1416754A (fr)
NL (1) NL154327B (fr)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3931610A (en) * 1973-11-29 1976-01-06 Teletype Corporation Capacitive keyswitch sensor and method
US3930405A (en) * 1974-09-17 1976-01-06 The United States Of America As Represented By The United States Energy Research And Development Administration Method and means for measuring acoustic emissions
US4001676A (en) * 1975-08-27 1977-01-04 General Motors Corporation Solid-state threshold detector
US4117398A (en) * 1975-12-22 1978-09-26 Western Electric Company, Inc. Method and apparatus for measuring the filling effectiveness of a cable during filling
US4054833A (en) * 1976-06-11 1977-10-18 Setra Systems, Inc. Capacitance measuring system
US4103225A (en) * 1977-01-05 1978-07-25 Dynatel Corporation System and method for determining capacitance and cable length in the presence of other circuit elements
GB2006970B (en) * 1977-09-23 1982-03-31 Testut Aequitas Capacitance measuring device
DE2833141A1 (de) * 1978-07-28 1980-02-07 Bosch Gmbh Robert Schaltungsanordnung zum vergleichen und zur verhaeltnisbildung von induktivitaeten
DE2912573A1 (de) * 1979-03-29 1980-10-09 Leitz Ernst Gmbh Verfahren zur ermittlung von zeitkriterien sowie schaltungsanordnungen zur durchfuehrung des verfahrens
GB2058364B (en) * 1979-09-01 1983-03-23 Ferranti Ltd Capacitance measuring apparatus
US4283676A (en) * 1980-03-06 1981-08-11 The United States Of America As Represented By The Secretary Of The Navy Direct reading capacitance meter
US4328573A (en) * 1980-05-12 1982-05-04 Nad International Precision phonocartridge interface
DE3143114A1 (de) * 1980-11-07 1982-07-15 Mestra AG, 4153 Reinach Verfahren und schaltung zur messung von kapazitaeten
US4558274A (en) * 1983-09-14 1985-12-10 Johnson Service Company Apparatus and method determining the value of a capacitance
US4661768A (en) * 1983-09-14 1987-04-28 Johnson Service Company Capacitance transducing method and apparatus
US4621227A (en) * 1984-02-29 1986-11-04 Borg-Warner Corporation Measuring system for determining the capacitance ratio of a pair of capacitors
FR2564205B1 (fr) * 1984-05-10 1986-10-24 Univ Rennes Procede et dispositif pour le test rapide de condensateurs et de materiaux dielectriques
US4633168A (en) * 1984-11-30 1986-12-30 Borg-Warner Corporation Measuring system for determining the reactance ratio of a pair of reactive devices
FR2584822B1 (fr) * 1985-07-09 1988-06-17 Thomson Csf Dispositif de mesure du rapport de deux capacites de faibles valeurs
IL82194A (en) * 1986-04-23 1992-03-29 Rosemount Inc Measurement circuit
US4825147A (en) * 1988-09-14 1989-04-25 Sencore, Inc. Capacitance measuring method and apparatus
US5073757A (en) * 1988-09-23 1991-12-17 John Fluke Mfg. Co., Inc. Apparatus for and method of measuring capacitance of a capacitive element
FR2674636B1 (fr) * 1991-03-29 1994-07-29 Commissariat Energie Atomique Procede et dispositif de qualification d'un systeme capacitif.
FR2675583B1 (fr) * 1991-04-18 1993-08-27 Marelli Autronica Procede et dispositif de mesure de condensateur.
DE4116961A1 (de) * 1991-05-24 1992-11-26 Abb Patent Gmbh Messschaltung zur messung einer kapazitaet
US5202640A (en) * 1991-06-03 1993-04-13 International Business Machines Corporation Capacitance and leakage test method and apparatus
DE4208399A1 (de) * 1992-03-16 1993-09-23 Knorr Bremse Ag Verfahren und messvorrichtung zur messung der zeitkonstanten eines elektrischen wegaufnehmers
US5585733A (en) * 1992-09-10 1996-12-17 David Sarnoff Research Center Capacitive sensor and method of measuring changes in capacitance
US5446420A (en) * 1993-08-25 1995-08-29 Motorola, Inc. Method and apparatus for reducing jitter and improving testability of an oscillator
EP1326085A3 (fr) * 1993-11-08 2007-11-14 Honda Giken Kogyo Kabushiki Kaisha Dispositif d'inspection des composants électriques d'un circuit
US5576628A (en) * 1994-09-30 1996-11-19 Telcom Semiconductor, Inc. Method and apparatus to measure capacitance
DE19524387C1 (de) * 1995-07-04 1996-11-07 Siemens Ag Schaltungsanordnung und Verfahren zum Messen eines Kapazitätsunterschiedes zwischen einer ersten Kapazität C1 und einer zweiten Kapazität C2
DE19634320A1 (de) * 1996-08-24 1998-02-26 Bosch Gmbh Robert Verfahren und Vorrichtung zur Prüfung eines Speicherelements
DE102009017011A1 (de) * 2009-04-14 2010-10-28 Balluff Gmbh Schaltungsanordnung zur Bestimmung einer Messkapazität
US8866499B2 (en) * 2009-08-27 2014-10-21 Analog Devices, Inc. System and method for measuring capacitance
KR20130007120A (ko) * 2011-06-29 2013-01-18 에스케이하이닉스 주식회사 반도체 장치 및 그의 테스트 방법
CN102929184B (zh) * 2012-11-23 2015-01-07 杭州士兰微电子股份有限公司 微控制单元的电压检测装置
RU2593818C1 (ru) * 2015-03-23 2016-08-10 Акционерное общество "Зеленоградский нанотехнологический центр" Способ и устройство измерения электрической емкости
FR3046677B1 (fr) * 2016-01-12 2019-06-07 Continental Automotive France Capteur, systeme et procede de detection de variation d'une capacite d'un condensateur de mesure
RU2645130C1 (ru) * 2017-01-09 2018-02-15 федеральное государственное бюджетное образовательное учреждение высшего образования "Ставропольский государственный аграрный университет" Способ измерения электрической емкости
EP3438677A1 (fr) 2017-07-31 2019-02-06 ams AG Procédé de détermination d'un paramètre électrique et agencement de mesure permettant de déterminer un paramètre électrique
JP7311380B2 (ja) * 2019-10-01 2023-07-19 株式会社日立産機システム 電源コンデンサ静電容量測定装置及び電源コンデンサ静電容量測定方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB939660A (en) * 1959-11-20 1963-10-16 Carl Gustav Hansson Apparatus and method for measuring capacitance
US3370229A (en) * 1964-05-25 1968-02-20 Sangamo Weston Electrical capacitance measuring method and apparatus with digital form indication
US3453535A (en) * 1967-10-20 1969-07-01 Mallory & Co Inc P R Capacitance test instrument using partial discharge time internal measurement
US3761805A (en) * 1971-06-24 1973-09-25 Western Electric Co Methods of and systems for measuring capacitance using a constant current charging technique

Also Published As

Publication number Publication date
DE2347450C3 (de) 1975-12-04
GB1416754A (en) 1975-12-03
DE2347450A1 (de) 1974-04-04
JPS4953080A (fr) 1974-05-23
JPS539542B2 (fr) 1978-04-06
NL154327B (nl) 1977-08-15
NL7312962A (fr) 1974-03-25
DE2347450B2 (de) 1975-04-24
US3824459A (en) 1974-07-16
FR2200527A1 (fr) 1974-04-19

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Legal Events

Date Code Title Description
ST Notification of lapse