FR2193300B1 - - Google Patents
Info
- Publication number
- FR2193300B1 FR2193300B1 FR7325250A FR7325250A FR2193300B1 FR 2193300 B1 FR2193300 B1 FR 2193300B1 FR 7325250 A FR7325250 A FR 7325250A FR 7325250 A FR7325250 A FR 7325250A FR 2193300 B1 FR2193300 B1 FR 2193300B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/08—Deviation, concentration or focusing of the beam by electric or magnetic means
- G21K1/093—Deviation, concentration or focusing of the beam by electric or magnetic means by magnetic means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/3002—Details
- H01J37/3007—Electron or ion-optical systems
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H5/00—Direct voltage accelerators; Accelerators using single pulses
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Plasma & Fusion (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US00271497A US3845312A (en) | 1972-07-13 | 1972-07-13 | Particle accelerator producing a uniformly expanded particle beam of uniform cross-sectioned density |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2193300A1 FR2193300A1 (un) | 1974-02-15 |
FR2193300B1 true FR2193300B1 (un) | 1978-05-26 |
Family
ID=23035842
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7325250A Expired FR2193300B1 (un) | 1972-07-13 | 1973-07-10 |
Country Status (6)
Country | Link |
---|---|
US (1) | US3845312A (un) |
JP (1) | JPS4957299A (un) |
DE (1) | DE2335821A1 (un) |
FR (1) | FR2193300B1 (un) |
GB (1) | GB1438851A (un) |
NL (1) | NL7309412A (un) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AT388628B (de) * | 1986-01-31 | 1989-08-10 | Ims Ionen Mikrofab Syst | Einrichtung fuer projektionsgeraete |
US4757208A (en) * | 1986-03-07 | 1988-07-12 | Hughes Aircraft Company | Masked ion beam lithography system and method |
EP0287630A4 (en) * | 1986-10-08 | 1989-07-25 | Varian Associates | METHOD AND DEVICE FOR SCANING WITH A CONSTANT INCLINATION ANGLE IN ION RAY SYSTEMS. |
AT393333B (de) * | 1986-11-27 | 1991-09-25 | Ims Ionen Mikrofab Syst | Ionenprojektionseinrichtung fuer schattenprojektion |
AT393925B (de) * | 1987-06-02 | 1992-01-10 | Ims Ionen Mikrofab Syst | Anordnung zur durchfuehrung eines verfahrens zum positionieren der abbildung der auf einer maske befindlichen struktur auf ein substrat, und verfahren zum ausrichten von auf einer maske angeordneten markierungen auf markierungen, die auf einem traeger angeordnet sind |
DE3734442A1 (de) * | 1987-10-12 | 1989-04-27 | Kernforschungsanlage Juelich | Verfahren und vorrichtung zur bestrahlung grosser flaechen mit ionen |
GB8725459D0 (en) * | 1987-10-30 | 1987-12-02 | Nat Research Dev Corpn | Generating particle beams |
US4914305A (en) * | 1989-01-04 | 1990-04-03 | Eaton Corporation | Uniform cross section ion beam system |
SE463055B (sv) * | 1989-02-10 | 1990-10-01 | Scanditronix Ab | Anordning foer att bestraala artiklar med elektroner samt magnetisk lins foer avboejning av straalar av laddade partiklar, saerskilt elektroner |
JP2648642B2 (ja) * | 1990-04-17 | 1997-09-03 | アプライド マテリアルズ インコーポレイテッド | 巾広ビームでイオンインプランテーションを行なう方法及び装置 |
US5350926A (en) * | 1993-03-11 | 1994-09-27 | Diamond Semiconductor Group, Inc. | Compact high current broad beam ion implanter |
US5834786A (en) * | 1996-07-15 | 1998-11-10 | Diamond Semiconductor Group, Inc. | High current ribbon beam ion implanter |
US5757009A (en) * | 1996-12-27 | 1998-05-26 | Northrop Grumman Corporation | Charged particle beam expander |
US6693289B1 (en) | 2000-02-07 | 2004-02-17 | Nec Electronics, Inc. | Operationally positionable source magnet field |
JP4795755B2 (ja) * | 2005-08-25 | 2011-10-19 | 株式会社日立ハイテクノロジーズ | 半導体基板の製造装置 |
US7391038B2 (en) * | 2006-03-21 | 2008-06-24 | Varian Semiconductor Equipment Associates, Inc. | Technique for isocentric ion beam scanning |
KR101194652B1 (ko) * | 2008-08-11 | 2012-10-29 | 이온빔 어플리케이션스 에스.에이. | 고전류 디시 양성자 가속기 |
EP2485571B1 (en) | 2011-02-08 | 2014-06-11 | High Voltage Engineering Europa B.V. | High-current single-ended DC accelerator |
CN103140012A (zh) * | 2011-11-25 | 2013-06-05 | 中国原子能科学研究院 | 具有钛膜保护功能的电子辐照加速器 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2866902A (en) * | 1955-07-05 | 1958-12-30 | High Voltage Engineering Corp | Method of and apparatus for irradiating matter with high energy electrons |
US2941077A (en) * | 1958-07-07 | 1960-06-14 | Applied Radiation Corp | Method of enlarging and shaping charged particle beams |
US3120609A (en) * | 1961-05-04 | 1964-02-04 | High Voltage Engineering Corp | Enlargement of charged particle beams |
US3434894A (en) * | 1965-10-06 | 1969-03-25 | Ion Physics Corp | Fabricating solid state devices by ion implantation |
US3313969A (en) * | 1966-03-25 | 1967-04-11 | Boeing Co | Charged particle deflecting apparatus having hemispherical electrodes |
US3547074A (en) * | 1967-04-13 | 1970-12-15 | Block Engineering | Apparatus for forming microelements |
FR2045238A5 (un) * | 1969-06-26 | 1971-02-26 | Commissariat Energie Atomique | |
US3621327A (en) * | 1969-12-29 | 1971-11-16 | Ford Motor Co | Method of controlling the intensity of an electron beam |
FR2080511A1 (un) * | 1970-01-20 | 1971-11-19 | Commissariat Energie Atomique |
-
1972
- 1972-07-13 US US00271497A patent/US3845312A/en not_active Expired - Lifetime
-
1973
- 1973-07-02 GB GB3141373A patent/GB1438851A/en not_active Expired
- 1973-07-05 NL NL7309412A patent/NL7309412A/xx unknown
- 1973-07-10 FR FR7325250A patent/FR2193300B1/fr not_active Expired
- 1973-07-12 JP JP48078858A patent/JPS4957299A/ja active Pending
- 1973-07-13 DE DE19732335821 patent/DE2335821A1/de active Pending
Also Published As
Publication number | Publication date |
---|---|
FR2193300A1 (un) | 1974-02-15 |
DE2335821A1 (de) | 1974-01-31 |
US3845312A (en) | 1974-10-29 |
NL7309412A (un) | 1974-01-15 |
GB1438851A (en) | 1976-06-09 |
JPS4957299A (un) | 1974-06-04 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |