FR2147904A1 - - Google Patents

Info

Publication number
FR2147904A1
FR2147904A1 FR7206875A FR7206875A FR2147904A1 FR 2147904 A1 FR2147904 A1 FR 2147904A1 FR 7206875 A FR7206875 A FR 7206875A FR 7206875 A FR7206875 A FR 7206875A FR 2147904 A1 FR2147904 A1 FR 2147904A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7206875A
Other languages
French (fr)
Other versions
FR2147904B1 (cg-RX-API-DMAC10.html
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EIDP Inc
Original Assignee
EI Du Pont de Nemours and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EI Du Pont de Nemours and Co filed Critical EI Du Pont de Nemours and Co
Publication of FR2147904A1 publication Critical patent/FR2147904A1/fr
Application granted granted Critical
Publication of FR2147904B1 publication Critical patent/FR2147904B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/488—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with retarding grids

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7206875A 1971-08-03 1972-02-29 Expired FR2147904B1 (cg-RX-API-DMAC10.html)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US16857571A 1971-08-03 1971-08-03

Publications (2)

Publication Number Publication Date
FR2147904A1 true FR2147904A1 (cg-RX-API-DMAC10.html) 1973-03-11
FR2147904B1 FR2147904B1 (cg-RX-API-DMAC10.html) 1978-03-10

Family

ID=22612064

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7206875A Expired FR2147904B1 (cg-RX-API-DMAC10.html) 1971-08-03 1972-02-29

Country Status (2)

Country Link
US (1) US3749926A (cg-RX-API-DMAC10.html)
FR (1) FR2147904B1 (cg-RX-API-DMAC10.html)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3935454A (en) * 1974-06-28 1976-01-27 E. I. Du Pont De Nemours & Company Electron collection in electron spectrometers
FR2335839A1 (fr) * 1975-12-19 1977-07-15 Commissariat Energie Atomique Procede d'analyse d'echantillons en matiere isolante par spectrometrie photo-electronique et porte-echantillon pour la mise en oeuvre dudit procede
US4546254A (en) * 1983-03-24 1985-10-08 Shimadzu Corporation Charged particle energy analyzer
US5120968A (en) * 1990-07-05 1992-06-09 The United States Of America As Represented By The Secretary Of The Navy Emittance measuring device for charged particle beams
EP1063677B1 (en) * 1999-06-23 2005-03-16 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam device
GB2428868B (en) * 2005-10-28 2008-11-19 Thermo Electron Corp Spectrometer for surface analysis and method therefor
JP4878501B2 (ja) * 2006-05-25 2012-02-15 株式会社日立ハイテクノロジーズ 荷電粒子線応用装置
US8944679B2 (en) * 2009-08-28 2015-02-03 National Institute Of Advanced Industrial Science And Technology Electrode member, electron energy analyzer, photoelectron energy analyzer, and temperature measuring apparatus
SE542643C2 (en) 2012-03-06 2020-06-23 Vg Scienta Ab Analyze arrangement for particle spectrometer
JP5815826B2 (ja) * 2014-10-07 2015-11-17 ヴィゲー・シエンタ・アーベー 粒子分光計のための分析装置
JP7008671B2 (ja) * 2019-09-13 2022-01-25 日本電子株式会社 荷電粒子線装置および分析方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1439064A (fr) * 1965-02-09 1966-05-20 Centre Nat Rech Scient Perfectionnements aux analyseurs ioniques
GB1171700A (en) * 1967-10-31 1969-11-26 Atomic Energy Authority Uk Improvements in or relating to Ion Beam Intensity Measuring Apparatus and Methods

Also Published As

Publication number Publication date
US3749926A (en) 1973-07-31
FR2147904B1 (cg-RX-API-DMAC10.html) 1978-03-10

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