FR2122142A6 - - Google Patents
Info
- Publication number
- FR2122142A6 FR2122142A6 FR7147858A FR7147858A FR2122142A6 FR 2122142 A6 FR2122142 A6 FR 2122142A6 FR 7147858 A FR7147858 A FR 7147858A FR 7147858 A FR7147858 A FR 7147858A FR 2122142 A6 FR2122142 A6 FR 2122142A6
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19712101689 DE2101689A1 (de) | 1971-01-15 | 1971-01-15 | Anordnung zur Durchführung eines Verfahrens zum berühungslosen optischen Prüfen und Messen von Oberflächen |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| FR2122142A6 true FR2122142A6 (fr) | 1972-08-25 |
Family
ID=5795922
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7147858A Expired FR2122142A6 (fr) | 1971-01-15 | 1971-12-21 |
Country Status (3)
| Country | Link |
|---|---|
| DE (1) | DE2101689A1 (fr) |
| FR (1) | FR2122142A6 (fr) |
| GB (1) | GB1364269A (fr) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3037622A1 (de) * | 1980-10-04 | 1982-04-22 | Theodor Prof. Dr.-Ing. 1000 Berlin Gast | Optoelektronisches messverfahren und einrichtungen zum bestimmen der oberflaechenguete streuend reflektierender oberflaechen |
| DE3304780A1 (de) * | 1983-02-11 | 1984-08-30 | Rodenstock Optik G | Vorrichtung zur ermittlung einer oberflaechenstruktur, insbesondere der rauheit |
| DE3307639C2 (de) * | 1983-03-04 | 1986-10-30 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München | Optisches Potentiometer |
| DE3319320A1 (de) * | 1983-05-27 | 1984-11-29 | Siemens AG, 1000 Berlin und 8000 München | Einrichtung zur erfassung einer ortskoordinate eines lichtpunktes |
| JPS6153510A (ja) * | 1984-08-23 | 1986-03-17 | Canon Inc | 位置検知装置 |
| DE3503858A1 (de) * | 1985-02-05 | 1986-08-21 | Daimler-Benz Ag, 7000 Stuttgart | Vorrichtung zur ermittlung von gestaltsfehlern niedriger ordnung |
-
1971
- 1971-01-15 DE DE19712101689 patent/DE2101689A1/de active Pending
- 1971-12-13 GB GB5770371A patent/GB1364269A/en not_active Expired
- 1971-12-21 FR FR7147858A patent/FR2122142A6/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2101689A1 (de) | 1972-07-20 |
| GB1364269A (en) | 1974-08-21 |