FR2121537B1 - - Google Patents

Info

Publication number
FR2121537B1
FR2121537B1 FR7200006A FR7200006A FR2121537B1 FR 2121537 B1 FR2121537 B1 FR 2121537B1 FR 7200006 A FR7200006 A FR 7200006A FR 7200006 A FR7200006 A FR 7200006A FR 2121537 B1 FR2121537 B1 FR 2121537B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7200006A
Other languages
French (fr)
Other versions
FR2121537A1 (enExample
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BBC Brown Boveri AG Switzerland
Original Assignee
BBC Brown Boveri AG Switzerland
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BBC Brown Boveri AG Switzerland filed Critical BBC Brown Boveri AG Switzerland
Publication of FR2121537A1 publication Critical patent/FR2121537A1/fr
Application granted granted Critical
Publication of FR2121537B1 publication Critical patent/FR2121537B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/263—Circuits therefor for testing thyristors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR7200006A 1971-01-05 1972-01-03 Expired FR2121537B1 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH6271A CH540493A (de) 1971-01-05 1971-01-05 Vorrichtung zum Messen der Freiwerdezeit von Halbleiterventilen

Publications (2)

Publication Number Publication Date
FR2121537A1 FR2121537A1 (enExample) 1972-08-25
FR2121537B1 true FR2121537B1 (enExample) 1979-05-11

Family

ID=4178441

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7200006A Expired FR2121537B1 (enExample) 1971-01-05 1972-01-03

Country Status (3)

Country Link
CH (1) CH540493A (enExample)
DE (1) DE2102769C3 (enExample)
FR (1) FR2121537B1 (enExample)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1614037B1 (de) * 1967-02-16 1970-06-04 Licentia Gmbh Anordnung zum Messen der Freiwerdezeit von Halbleiterventilen

Also Published As

Publication number Publication date
CH540493A (de) 1973-08-15
DE2102769C3 (de) 1981-12-10
FR2121537A1 (enExample) 1972-08-25
DE2102769A1 (de) 1972-07-20
DE2102769B2 (de) 1981-02-05

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Legal Events

Date Code Title Description
ST Notification of lapse