FR2111520A5 - - Google Patents

Info

Publication number
FR2111520A5
FR2111520A5 FR7137428A FR7137428A FR2111520A5 FR 2111520 A5 FR2111520 A5 FR 2111520A5 FR 7137428 A FR7137428 A FR 7137428A FR 7137428 A FR7137428 A FR 7137428A FR 2111520 A5 FR2111520 A5 FR 2111520A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7137428A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Application granted granted Critical
Publication of FR2111520A5 publication Critical patent/FR2111520A5/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
FR7137428A 1970-10-20 1971-10-19 Expired FR2111520A5 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19702051511 DE2051511B2 (en) 1970-10-20 1970-10-20 ROENTGENTOPOGRAPHY DEVICE

Publications (1)

Publication Number Publication Date
FR2111520A5 true FR2111520A5 (en) 1972-06-02

Family

ID=5785657

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7137428A Expired FR2111520A5 (en) 1970-10-20 1971-10-19

Country Status (6)

Country Link
US (1) US3751662A (en)
CH (1) CH532785A (en)
DE (1) DE2051511B2 (en)
FR (1) FR2111520A5 (en)
GB (1) GB1372885A (en)
SE (1) SE368626B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992624A (en) * 1975-04-29 1976-11-16 The United States Of America As Represented By The Secretary Of The Army Apparatus and method of X-ray topography at cryogenic temperature
DE3439471A1 (en) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München METHOD AND DEVICE FOR TESTING SINGLE-CRYSTAL OBJECTS
DE4100680A1 (en) * 1991-01-11 1992-07-23 Siemens Ag Non-destructive detection of deformations of semiconductor crystal in housing - using goniometer to excite crystal by X=ray beam penetrating housing via shutter

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2829268A (en) * 1952-05-05 1958-04-01 Industrial Nucleonics Corp Standardization system
US3177360A (en) * 1962-09-14 1965-04-06 Norton Co Diffractometer with a rotatable support to hold plural samples for automatic analysis of crystalline material
US3435219A (en) * 1967-01-30 1969-03-25 Atomic Energy Commission Neutron spectrometer for high neutron flux

Also Published As

Publication number Publication date
CH532785A (en) 1973-01-15
DE2051511C3 (en) 1973-11-29
SE368626B (en) 1974-07-08
GB1372885A (en) 1974-11-06
DE2051511B2 (en) 1973-05-03
DE2051511A1 (en) 1972-05-31
US3751662A (en) 1973-08-07

Similar Documents

Publication Publication Date Title
AR204384A1 (en)
ATA96471A (en)
AU1473870A (en)
AU1146470A (en)
AU1326870A (en)
AU1336970A (en)
AU1517670A (en)
AU1716970A (en)
AR195465A1 (en)
AU1083170A (en)
ATA672271A (en)
AU1064870A (en)
AU1689770A (en)
AU1603270A (en)
AU1328670A (en)
AU1086670A (en)
AU1591370A (en)
AU1581370A (en)
AU1004470A (en)
AU1789870A (en)
AU1943370A (en)
AU1918570A (en)
AU1247570A (en)
AU1277070A (en)
AU1189670A (en)

Legal Events

Date Code Title Description
ST Notification of lapse