FR2093572A5 - - Google Patents

Info

Publication number
FR2093572A5
FR2093572A5 FR7118409A FR7118409A FR2093572A5 FR 2093572 A5 FR2093572 A5 FR 2093572A5 FR 7118409 A FR7118409 A FR 7118409A FR 7118409 A FR7118409 A FR 7118409A FR 2093572 A5 FR2093572 A5 FR 2093572A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7118409A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Application granted granted Critical
Publication of FR2093572A5 publication Critical patent/FR2093572A5/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
FR7118409A 1970-05-22 1971-05-21 Expired FR2093572A5 (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2491670 1970-05-22

Publications (1)

Publication Number Publication Date
FR2093572A5 true FR2093572A5 (enrdf_load_stackoverflow) 1972-01-28

Family

ID=10219287

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7118409A Expired FR2093572A5 (enrdf_load_stackoverflow) 1970-05-22 1971-05-21

Country Status (5)

Country Link
US (1) US3714423A (enrdf_load_stackoverflow)
DE (1) DE2125105A1 (enrdf_load_stackoverflow)
FR (1) FR2093572A5 (enrdf_load_stackoverflow)
GB (1) GB1320346A (enrdf_load_stackoverflow)
NL (1) NL7106972A (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4170737A (en) 1978-07-06 1979-10-09 Spetsialnoe Konstruktorskoe Bjuro Biologicheskogo Priborotroenia Akademii Nauk SSSR Top-entry transmission electron microscope
DE3050424A1 (de) * 1980-06-09 1982-07-29 Burevestnik Sample chamber for electron-sounding instrument
US6967335B1 (en) 2002-06-17 2005-11-22 Zyvex Corporation Manipulation system for manipulating a sample under study with a microscope
US6891170B1 (en) * 2002-06-17 2005-05-10 Zyvex Corporation Modular manipulation system for manipulating a sample under study with a microscope
WO2005031789A2 (en) * 2003-09-23 2005-04-07 Zyvex Corporation Method, system and device for microscopic examination employing fib-prepared sample grasping element
TW200531420A (en) 2004-02-20 2005-09-16 Zyvex Corp Positioning device for microscopic motion
KR20060043141A (ko) * 2004-02-23 2006-05-15 지벡스 코포레이션 대전 입자 빔 장치 프로브 조작기
US7326293B2 (en) * 2004-03-26 2008-02-05 Zyvex Labs, Llc Patterned atomic layer epitaxy
US7786442B2 (en) * 2004-06-18 2010-08-31 General Electric Company Method and apparatus for ion source positioning and adjustment
KR102083193B1 (ko) * 2013-11-25 2020-03-02 삼성전자주식회사 로봇 청소기

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1226228B (de) * 1959-07-24 1966-10-06 Max Planck Gesellschaft Bewegbarer Praeparattisch fuer einen Korpus-kularstrahlapparat, insbesondere Elektronen-mikroskop oder Elektronenbeugungsgeraet
DE1572753B2 (de) * 1966-04-06 1971-02-18 Nihon Denshi K K , Tokio Goniometer zur werkstoffanalyse mittels roentgenstrahlen
FR1572651A (enrdf_load_stackoverflow) * 1967-06-19 1969-06-27

Also Published As

Publication number Publication date
GB1320346A (en) 1973-06-13
NL7106972A (enrdf_load_stackoverflow) 1971-11-24
US3714423A (en) 1973-01-30
DE2125105A1 (enrdf_load_stackoverflow) 1971-12-02

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Legal Events

Date Code Title Description
ST Notification of lapse