FR2072129B1 - - Google Patents

Info

Publication number
FR2072129B1
FR2072129B1 FR7047244A FR7047244A FR2072129B1 FR 2072129 B1 FR2072129 B1 FR 2072129B1 FR 7047244 A FR7047244 A FR 7047244A FR 7047244 A FR7047244 A FR 7047244A FR 2072129 B1 FR2072129 B1 FR 2072129B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7047244A
Other versions
FR2072129A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bull HN Information Systems Inc
Original Assignee
Honeywell Information Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Information Systems Inc filed Critical Honeywell Information Systems Inc
Publication of FR2072129A1 publication Critical patent/FR2072129A1/fr
Application granted granted Critical
Publication of FR2072129B1 publication Critical patent/FR2072129B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/06—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using single-aperture storage elements, e.g. ring core; using multi-aperture plates in which each individual aperture forms a storage element
    • G11C11/06007—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using single-aperture storage elements, e.g. ring core; using multi-aperture plates in which each individual aperture forms a storage element using a single aperture or single magnetic closed circuit
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5006—Current
FR7047244A 1969-12-30 1970-12-30 Expired FR2072129B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT2642169 1969-12-30

Publications (2)

Publication Number Publication Date
FR2072129A1 FR2072129A1 (fr) 1971-09-24
FR2072129B1 true FR2072129B1 (fr) 1976-02-06

Family

ID=11219446

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7047244A Expired FR2072129B1 (fr) 1969-12-30 1970-12-30

Country Status (6)

Country Link
US (1) US3712537A (fr)
JP (1) JPS4812651B1 (fr)
DE (1) DE2061674A1 (fr)
FR (1) FR2072129B1 (fr)
GB (1) GB1335856A (fr)
NL (1) NL7018010A (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4419747A (en) * 1981-09-14 1983-12-06 Seeq Technology, Inc. Method and device for providing process and test information in semiconductors
US4451903A (en) * 1981-09-14 1984-05-29 Seeq Technology, Inc. Method and device for encoding product and programming information in semiconductors
US4519076A (en) * 1981-12-28 1985-05-21 National Semiconductor Corporation Memory core testing system
US4595875A (en) * 1983-12-22 1986-06-17 Monolithic Memories, Incorporated Short detector for PROMS
US4701695A (en) * 1983-12-22 1987-10-20 Monolithic Memories, Inc. Short detector for PROMS
US4698589A (en) * 1986-03-21 1987-10-06 Harris Corporation Test circuitry for testing fuse link programmable memory devices
DE4317175A1 (de) * 1993-05-22 1994-11-24 Bosch Gmbh Robert Selbsttesteinrichtung für Speicheranordnungen, Decoder od. dgl.
KR950015768A (ko) * 1993-11-17 1995-06-17 김광호 불휘발성 반도체 메모리 장치의 배선단락 검출회로 및 그 방법
US5956280A (en) * 1998-03-02 1999-09-21 Tanisys Technology, Inc. Contact test method and system for memory testers
US6424161B2 (en) * 1998-09-03 2002-07-23 Micron Technology, Inc. Apparatus and method for testing fuses
US6584589B1 (en) * 2000-02-04 2003-06-24 Hewlett-Packard Development Company, L.P. Self-testing of magneto-resistive memory arrays

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3196418A (en) * 1963-02-13 1965-07-20 Bunker Ramo Monitoring system
DE1286106B (de) * 1963-09-30 1969-01-02 Siemens Ag Schaltungsanordnung zum Pruefen der Funktionsfaehigkeit von Matrixanordnungen
GB1106689A (en) * 1964-11-16 1968-03-20 Standard Telephones Cables Ltd Data processing equipment
US3460093A (en) * 1965-03-31 1969-08-05 Bell Telephone Labor Inc Selector matrix check circuit

Also Published As

Publication number Publication date
JPS4812651B1 (fr) 1973-04-21
NL7018010A (fr) 1971-07-02
GB1335856A (en) 1973-10-31
FR2072129A1 (fr) 1971-09-24
DE2061674A1 (de) 1971-07-01
US3712537A (en) 1973-01-23

Similar Documents

Publication Publication Date Title
AU2270770A (fr)
AU465452B2 (fr)
FR2072129B1 (fr)
AU450150B2 (fr)
AU2355770A (fr)
AU470301B1 (fr)
AU5113869A (fr)
AU442538B2 (fr)
AU442463B2 (fr)
AU442322B2 (fr)
AU442554B2 (fr)
AU470661B1 (fr)
AU410358B2 (fr)
AU442380B2 (fr)
FR2063173B1 (fr)
AU442535B2 (fr)
AT308690B (fr)
AU5109569A (fr)
AU4540468A (fr)
AU5077469A (fr)
AU1036070A (fr)
AR203167Q (fr)
AU4949169A (fr)
BE749953A (fr)
AU4982068A (fr)

Legal Events

Date Code Title Description
ST Notification of lapse