FR2025794A1 - - Google Patents

Info

Publication number
FR2025794A1
FR2025794A1 FR6942578A FR6942578A FR2025794A1 FR 2025794 A1 FR2025794 A1 FR 2025794A1 FR 6942578 A FR6942578 A FR 6942578A FR 6942578 A FR6942578 A FR 6942578A FR 2025794 A1 FR2025794 A1 FR 2025794A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
FR6942578A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Enraf Nonius BV
Original Assignee
Enraf Nonius BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Enraf Nonius BV filed Critical Enraf Nonius BV
Publication of FR2025794A1 publication Critical patent/FR2025794A1/fr
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR6942578A 1968-12-10 1969-12-09 Pending FR2025794A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL686817709A NL139600B (nl) 1968-12-10 1968-12-10 Goniometrische inrichting, in het bijzonder voor een diffractometer.

Publications (1)

Publication Number Publication Date
FR2025794A1 true FR2025794A1 (fr) 1970-09-11

Family

ID=19805368

Family Applications (1)

Application Number Title Priority Date Filing Date
FR6942578A Pending FR2025794A1 (fr) 1968-12-10 1969-12-09

Country Status (7)

Country Link
US (1) US3636347A (fr)
JP (1) JPS4824079B1 (fr)
DE (1) DE1961648C3 (fr)
FR (1) FR2025794A1 (fr)
GB (1) GB1267440A (fr)
NL (1) NL139600B (fr)
SE (1) SE352453B (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2814337C2 (de) * 1976-03-25 1983-03-10 A.Halim Dr.-Ing. 5100 Aachen Demirci Textur-Spannungsgoniometer zur gemeinsamen Ermittlung sowohl der räumlichen Spannungsverteilung als auch der Kristallorientierungsverteilung (Textur)
GB2198920B (en) * 1986-12-18 1990-11-14 Univ Moskovsk Apparatus for x-ray studies of crystalline matter
US6069934A (en) * 1998-04-07 2000-05-30 Osmic, Inc. X-ray diffractometer with adjustable image distance
CN104121454B (zh) * 2014-06-27 2016-06-08 丹东通达科技有限公司 一种载晶台体传动装置及其装配、操作方法
US10161887B2 (en) 2015-01-20 2018-12-25 United Technologies Corporation Systems and methods for materials analysis
US11287545B2 (en) 2019-12-26 2022-03-29 Baker Hughes Oilfield Operations Llc Magnetic freepoint indicator tool

Also Published As

Publication number Publication date
NL139600B (nl) 1973-08-15
DE1961648C3 (de) 1979-03-15
DE1961648B2 (de) 1978-07-06
JPS4824079B1 (fr) 1973-07-18
US3636347A (en) 1972-01-18
GB1267440A (en) 1972-03-22
NL6817709A (fr) 1970-06-12
DE1961648A1 (de) 1970-06-18
SE352453B (fr) 1972-12-27

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