FR1602196A - - Google Patents
Info
- Publication number
- FR1602196A FR1602196A FR1602196DA FR1602196A FR 1602196 A FR1602196 A FR 1602196A FR 1602196D A FR1602196D A FR 1602196DA FR 1602196 A FR1602196 A FR 1602196A
- Authority
- FR
- France
- Prior art keywords
- combinatorial
- logged
- punched
- cards
- sequential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
- Peptides Or Proteins (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US69767668A | 1968-01-15 | 1968-01-15 | |
US87755269A | 1969-11-20 | 1969-11-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
FR1602196A true FR1602196A (fr) | 1970-10-19 |
Family
ID=27106056
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1602196D Expired FR1602196A (fr) | 1968-01-15 | 1968-12-20 |
Country Status (3)
Country | Link |
---|---|
US (2) | US3546582A (fr) |
FR (1) | FR1602196A (fr) |
GB (1) | GB1247061A (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2162287A1 (fr) * | 1971-12-09 | 1973-07-20 | Sescosem | |
FR2218721A1 (fr) * | 1973-02-19 | 1974-09-13 | Sits Soc It Telecom Siemens |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3659088A (en) * | 1970-08-06 | 1972-04-25 | Cogar Corp | Method for indicating memory chip failure modes |
US4055801A (en) * | 1970-08-18 | 1977-10-25 | Pike Harold L | Automatic electronic test equipment and method |
US3718910A (en) * | 1970-09-30 | 1973-02-27 | Ibm | Time coherent sampling system for eliminating the effects of test system jitter and providing a simplified single transient threshold test |
US3631229A (en) * | 1970-09-30 | 1971-12-28 | Ibm | Monolithic memory array tester |
US3751649A (en) * | 1971-05-17 | 1973-08-07 | Marcrodata Co | Memory system exerciser |
US3897626A (en) * | 1971-06-25 | 1975-08-05 | Ibm | Method of manufacturing a full capacity monolithic memory utilizing defective storage cells |
GB1379588A (en) * | 1971-12-01 | 1975-01-02 | Int Computers Ltd | Systems for testing electrical devices |
US3764995A (en) * | 1971-12-21 | 1973-10-09 | Prd Electronics Inc | Programmable test systems |
US3832535A (en) * | 1972-10-25 | 1974-08-27 | Instrumentation Engineering | Digital word generating and receiving apparatus |
US3813647A (en) * | 1973-02-28 | 1974-05-28 | Northrop Corp | Apparatus and method for performing on line-monitoring and fault-isolation |
US3873818A (en) * | 1973-10-29 | 1975-03-25 | Ibm | Electronic tester for testing devices having a high circuit density |
US4123750A (en) * | 1973-11-29 | 1978-10-31 | Dynamics Research Corporation | Signal processor for position encoder |
US3969618A (en) * | 1974-11-29 | 1976-07-13 | Xerox Corporation | On line PROM handling system |
US3931506A (en) * | 1974-12-30 | 1976-01-06 | Zehntel, Inc. | Programmable tester |
US4305063A (en) * | 1977-03-04 | 1981-12-08 | Grumman Aerospace Corp. | Automatic digital gain ranging system |
US4216539A (en) * | 1978-05-05 | 1980-08-05 | Zehntel, Inc. | In-circuit digital tester |
USRE31828E (en) * | 1978-05-05 | 1985-02-05 | Zehntel, Inc. | In-circuit digital tester |
US4207610A (en) * | 1978-12-18 | 1980-06-10 | Ford Motor Company | Apparatus and method for testing and controlling manufacture of a vehicle electrical system |
US4207611A (en) * | 1978-12-18 | 1980-06-10 | Ford Motor Company | Apparatus and method for calibrated testing of a vehicle electrical system |
US4540974A (en) * | 1981-10-30 | 1985-09-10 | Rca Corporation | Adaptive analog-to-digital converter |
US4764925A (en) * | 1984-06-14 | 1988-08-16 | Fairchild Camera & Instrument | Method and apparatus for testing integrated circuits |
US6531972B2 (en) * | 2000-04-19 | 2003-03-11 | Texas Instruments Incorporated | Apparatus and method including an efficient data transfer for analog to digital converter testing |
US6429641B1 (en) * | 2000-05-26 | 2002-08-06 | International Business Machines Corporation | Power booster and current measuring unit |
JP3951560B2 (ja) * | 2000-06-14 | 2007-08-01 | セイコーエプソン株式会社 | 信号供給装置及びその検査方法、並びにそれを用いた半導体装置及びデータ線駆動ic |
JP2002318267A (ja) * | 2001-04-23 | 2002-10-31 | Ando Electric Co Ltd | Adコンバータ評価装置 |
JP2004219126A (ja) * | 2003-01-10 | 2004-08-05 | Agilent Technologies Japan Ltd | 電流レンジを自動的に変更する方法 |
JP4282334B2 (ja) * | 2003-02-04 | 2009-06-17 | 株式会社アドバンテスト | 試験装置 |
US7844877B2 (en) * | 2005-11-15 | 2010-11-30 | Ramot At Tel Aviv University Ltd. | Method and device for multi phase error-correction |
DE102008003515A1 (de) * | 2008-01-08 | 2009-07-09 | Leopold Kostal Gmbh & Co. Kg | Rechnersystem zur Auswertung sicherheitskritischer Sensorgrößen |
US9568504B2 (en) | 2013-03-15 | 2017-02-14 | Milwaukee Electric Tool Corporation | Digital multi-meter |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3133278A (en) * | 1958-08-13 | 1964-05-12 | Texas Instruments Inc | Analogue to digital converter |
US3237100A (en) * | 1960-06-24 | 1966-02-22 | Chalfin Albert | Computer-controlled test apparatus for composite electrical and electronic equipment |
US3187323A (en) * | 1961-10-24 | 1965-06-01 | North American Aviation Inc | Automatic scaler for analog-to-digital converter |
GB1172830A (en) * | 1966-08-02 | 1969-12-03 | Solartron Electronic Group | Apparatus for the Automatic Calibration of Digital Instruments. |
-
1968
- 1968-01-15 US US697676A patent/US3546582A/en not_active Expired - Lifetime
- 1968-12-20 FR FR1602196D patent/FR1602196A/fr not_active Expired
-
1969
- 1969-01-13 GB GB0928/69A patent/GB1247061A/en not_active Expired
- 1969-11-20 US US877552A patent/US3648175A/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2162287A1 (fr) * | 1971-12-09 | 1973-07-20 | Sescosem | |
FR2218721A1 (fr) * | 1973-02-19 | 1974-09-13 | Sits Soc It Telecom Siemens |
Also Published As
Publication number | Publication date |
---|---|
US3648175A (en) | 1972-03-07 |
DE1901815B2 (de) | 1976-09-16 |
GB1247061A (en) | 1971-09-22 |
DE1901815A1 (de) | 1970-08-27 |
US3546582A (en) | 1970-12-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |