FR1560972A - - Google Patents

Info

Publication number
FR1560972A
FR1560972A FR1560972DA FR1560972A FR 1560972 A FR1560972 A FR 1560972A FR 1560972D A FR1560972D A FR 1560972DA FR 1560972 A FR1560972 A FR 1560972A
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
French (fr)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of FR1560972A publication Critical patent/FR1560972A/fr
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46Static spectrometers
    • H01J49/48Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
FR1560972D 1967-04-27 1968-04-26 Expired FR1560972A (forum.php)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US63421467A 1967-04-27 1967-04-27

Publications (1)

Publication Number Publication Date
FR1560972A true FR1560972A (forum.php) 1969-03-21

Family

ID=24542865

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1560972D Expired FR1560972A (forum.php) 1967-04-27 1968-04-26

Country Status (5)

Country Link
US (1) US3461306A (forum.php)
BE (1) BE714344A (forum.php)
ES (1) ES352500A1 (forum.php)
FR (1) FR1560972A (forum.php)
NL (1) NL6804889A (forum.php)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3659095A (en) * 1968-09-19 1972-04-25 Boris Andreevich Gumenjuk Magnetic beta-ray spectrometer and magnetic lenses for use therein
FR1593088A (forum.php) * 1968-10-25 1970-05-25
GB1246744A (en) * 1969-01-02 1971-09-15 Graham Stuart Plows Electron beam apparatus
US3631238A (en) * 1969-11-17 1971-12-28 North American Rockwell Method of measuring electric potential on an object surface using auger electron spectroscopy
US3679896A (en) * 1969-12-23 1972-07-25 Ibm Electrostatic prism
US3787692A (en) * 1971-05-17 1974-01-22 Varian Associates Induced electron emission spectrometer using plural radiation sources
DE2151167C3 (de) * 1971-10-14 1974-05-09 Siemens Ag, 1000 Berlin Und 8000 Muenchen Elektronenstrahl-Mikroanalysator mit Auger-Elektronen-Nachweis
GB1530277A (en) * 1975-01-02 1978-10-25 Commissariat Energie Atomique Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
US4459482A (en) * 1982-05-06 1984-07-10 Bales Maurice J Auger spectroscopic technique measuring the number of electrons emitted from a surface as a function of the energy level of those electrons
US4719120A (en) * 1986-09-29 1988-01-12 The United States Of America As Represented By The Secretary Of The Navy Detection of oxygen in thin films
JPH0299846A (ja) * 1988-10-07 1990-04-11 Toshiba Corp エネルギー分析装置
JPH05296947A (ja) * 1992-04-24 1993-11-12 Japan Aviation Electron Ind Ltd 電子線回折測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2405306A (en) * 1944-01-31 1946-08-06 Rca Corp Electronic microanalyzer monitoring
US3356844A (en) * 1963-07-02 1967-12-05 Centre Nat Rech Metall Rotatable sample changer for an electron probe microanalyzer having means for maintaining a vacuum in the analysis chamber
AT239876B (de) * 1963-07-03 1965-04-26 Fritz Dr Grasenick Vorrichtung zum Festhalten von Objektträgern

Also Published As

Publication number Publication date
US3461306A (en) 1969-08-12
BE714344A (forum.php) 1968-10-28
ES352500A1 (es) 1969-07-01
NL6804889A (forum.php) 1968-10-28

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Legal Events

Date Code Title Description
ST Notification of lapse