FR1503449A - Appareil et procédé pour obtenir des diagrammes de diffractior de rayons x - Google Patents

Appareil et procédé pour obtenir des diagrammes de diffractior de rayons x

Info

Publication number
FR1503449A
FR1503449A FR86723A FR86723A FR1503449A FR 1503449 A FR1503449 A FR 1503449A FR 86723 A FR86723 A FR 86723A FR 86723 A FR86723 A FR 86723A FR 1503449 A FR1503449 A FR 1503449A
Authority
FR
France
Prior art keywords
obtaining
ray diffraction
diffraction patterns
patterns
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR86723A
Other languages
English (en)
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ExxonMobil Technology and Engineering Co
Original Assignee
Exxon Research and Engineering Co
Esso Research and Engineering Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Exxon Research and Engineering Co, Esso Research and Engineering Co filed Critical Exxon Research and Engineering Co
Application granted granted Critical
Publication of FR1503449A publication Critical patent/FR1503449A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR86723A 1966-01-20 1966-12-08 Appareil et procédé pour obtenir des diagrammes de diffractior de rayons x Expired FR1503449A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US52192666A 1966-01-20 1966-01-20

Publications (1)

Publication Number Publication Date
FR1503449A true FR1503449A (fr) 1967-11-24

Family

ID=24078704

Family Applications (1)

Application Number Title Priority Date Filing Date
FR86723A Expired FR1503449A (fr) 1966-01-20 1966-12-08 Appareil et procédé pour obtenir des diagrammes de diffractior de rayons x

Country Status (4)

Country Link
BE (1) BE692931A (id)
DE (1) DE1598413A1 (id)
FR (1) FR1503449A (id)
NL (1) NL6700870A (id)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0153989A3 (en) * 1983-09-13 1986-02-05 Nicolet Instrument Corporation Sample holder for a powder diffractometer
US4678340A (en) * 1984-09-27 1987-07-07 Nicolet Instrument Corporation Sample holder for powder x-ray diffractometer
DE60305875T3 (de) 2002-01-15 2013-09-26 Avantium International B.V. Verfahren zur Durchführung einer Leistungsbeugungsanalyse
EP1327877A1 (en) * 2002-01-15 2003-07-16 Avantium International B.V. Method for successively performing powder diffraction analysis on a plurality of samples
CN100485373C (zh) 2004-07-14 2009-05-06 西南技术工程研究所 短波长x射线衍射测量装置和方法

Also Published As

Publication number Publication date
DE1598413A1 (de) 1970-04-23
NL6700870A (id) 1967-07-21
BE692931A (id) 1967-07-20

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