FR1485075A - Système d'essai automatique de mémoires de calculateurs - Google Patents

Système d'essai automatique de mémoires de calculateurs

Info

Publication number
FR1485075A
FR1485075A FR7906A FR06007906A FR1485075A FR 1485075 A FR1485075 A FR 1485075A FR 7906 A FR7906 A FR 7906A FR 06007906 A FR06007906 A FR 06007906A FR 1485075 A FR1485075 A FR 1485075A
Authority
FR
France
Prior art keywords
test system
computer memory
automatic test
memory automatic
computer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7906A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of FR1485075A publication Critical patent/FR1485075A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
FR7906A 1965-07-01 1966-06-22 Système d'essai automatique de mémoires de calculateurs Expired FR1485075A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US46878265A 1965-07-01 1965-07-01

Publications (1)

Publication Number Publication Date
FR1485075A true FR1485075A (fr) 1967-06-16

Family

ID=23861222

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7906A Expired FR1485075A (fr) 1965-07-01 1966-06-22 Système d'essai automatique de mémoires de calculateurs

Country Status (4)

Country Link
US (1) US3478286A (fr)
DE (1) DE1499701A1 (fr)
FR (1) FR1485075A (fr)
GB (1) GB1113769A (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3603772A (en) * 1969-09-09 1971-09-07 Nasa Analog-to-digital converter analyzing system
US3633174A (en) * 1970-04-14 1972-01-04 Us Navy Memory system having self-adjusting strobe timing
US3659088A (en) * 1970-08-06 1972-04-25 Cogar Corp Method for indicating memory chip failure modes
US3655959A (en) * 1970-08-17 1972-04-11 Computer Test Corp Magnetic memory element testing system and method
US3739349A (en) * 1971-05-24 1973-06-12 Sperry Rand Corp Digital equipment interface unit
US3736569A (en) * 1971-10-13 1973-05-29 Ibm System for controlling power consumption in a computer
US4322816A (en) * 1972-07-07 1982-03-30 Hewlett-Packard Company Programmable calculator having structure for controlling an x-y plotter
US4038648A (en) * 1974-06-03 1977-07-26 Chesley Gilman D Self-configurable circuit structure for achieving wafer scale integration
US4253059A (en) * 1979-05-14 1981-02-24 Fairchild Camera & Instrument Corp. EPROM Reliability test circuit
DE2923564C2 (de) * 1979-06-11 1982-06-24 Siemens AG, 1000 Berlin und 8000 München Speicheranordnung mit einer Anzahl von Speicherbaugruppen
US4335457A (en) * 1980-08-08 1982-06-15 Fairchild Camera & Instrument Corp. Method for semiconductor memory testing
US4486801A (en) * 1980-11-10 1984-12-04 Sundstrand Corporation Generator shorted diode protection system
US4680762A (en) * 1985-10-17 1987-07-14 Inmos Corporation Method and apparatus for locating soft cells in a ram
DE112017004594T5 (de) * 2016-10-26 2019-07-11 Hitachi Automotive Systems, Ltd. Fahrzeugsteuereinheit
WO2018165909A1 (fr) 2017-03-15 2018-09-20 富士通株式会社 Procédé et appareil d'interdiction d'accès, et système de communication

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2920818A (en) * 1954-12-31 1960-01-12 Ibm Dynamic evaluator
US2996666A (en) * 1957-07-12 1961-08-15 Gen Motors Corp Automatic test apparatus
US3027542A (en) * 1958-07-14 1962-03-27 Beckman Instruments Inc Automatic marginal checking apparatus
US3271674A (en) * 1961-04-28 1966-09-06 Itt Circuit variance analyzer including scanner controlled parameter variation of the test circuit
GB1000281A (en) * 1962-01-15 1965-08-04 Bendix Corp Test equipment for electronic assemblies
US3252097A (en) * 1962-10-29 1966-05-17 Ibm Marginal checking system

Also Published As

Publication number Publication date
DE1499701A1 (de) 1970-06-11
US3478286A (en) 1969-11-11
GB1113769A (en) 1968-05-15

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