FR1375173A - Window for x-ray microanalyzers - Google Patents

Window for x-ray microanalyzers

Info

Publication number
FR1375173A
FR1375173A FR945748A FR945748A FR1375173A FR 1375173 A FR1375173 A FR 1375173A FR 945748 A FR945748 A FR 945748A FR 945748 A FR945748 A FR 945748A FR 1375173 A FR1375173 A FR 1375173A
Authority
FR
France
Prior art keywords
window
microanalyzers
ray
ray microanalyzers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR945748A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CIE D APPLIC MECANIQUES A L EL
Original Assignee
CIE D APPLIC MECANIQUES A L EL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CIE D APPLIC MECANIQUES A L EL filed Critical CIE D APPLIC MECANIQUES A L EL
Priority to FR945748A priority Critical patent/FR1375173A/en
Priority to GB33387/64A priority patent/GB1027909A/en
Priority to US391630A priority patent/US3319064A/en
Priority to DEC33729A priority patent/DE1297898B/en
Application granted granted Critical
Publication of FR1375173A publication Critical patent/FR1375173A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J5/00—Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps
    • H01J5/02—Vessels; Containers; Shields associated therewith; Vacuum locks
    • H01J5/18—Windows permeable to X-rays, gamma-rays, or particles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR945748A 1963-08-27 1963-08-27 Window for x-ray microanalyzers Expired FR1375173A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR945748A FR1375173A (en) 1963-08-27 1963-08-27 Window for x-ray microanalyzers
GB33387/64A GB1027909A (en) 1963-08-27 1964-08-14 Window for x-ray microanalyzers
US391630A US3319064A (en) 1963-08-27 1964-08-24 Slidable window for x-ray microanalyzers selectively permeable to hard or soft x-rays
DEC33729A DE1297898B (en) 1963-08-27 1964-08-26 X-ray microanalyser with two spaces separated from each other in a gastight manner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR945748A FR1375173A (en) 1963-08-27 1963-08-27 Window for x-ray microanalyzers

Publications (1)

Publication Number Publication Date
FR1375173A true FR1375173A (en) 1964-10-16

Family

ID=8811222

Family Applications (1)

Application Number Title Priority Date Filing Date
FR945748A Expired FR1375173A (en) 1963-08-27 1963-08-27 Window for x-ray microanalyzers

Country Status (4)

Country Link
US (1) US3319064A (en)
DE (1) DE1297898B (en)
FR (1) FR1375173A (en)
GB (1) GB1027909A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1205231A (en) * 1966-12-13 1970-09-16 Ass Elect Ind Improvements relating to x-ray and gamma ray apparatus
US3663812A (en) * 1969-02-27 1972-05-16 Mc Donnell Douglas Corp X-ray spectrographic means having fixed analyzing and detecting means
JPS515316B1 (en) * 1969-09-25 1976-02-19
US4463257A (en) * 1982-08-05 1984-07-31 Tracor Xray Inc. Rotatable support for selectively aligning a window with the channel of a probe
US7618906B2 (en) * 2005-11-17 2009-11-17 Oxford Instruments Analytical Oy Window membrane for detector and analyser devices, and a method for manufacturing a window membrane
US7474730B2 (en) * 2006-10-17 2009-01-06 Oxford Instruments Analytical Oy Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2094103A (en) * 1935-10-12 1937-09-28 Picker X Ray Corp Waite Mfg Roentgen ray control unit
DE962206C (en) * 1954-05-10 1957-04-18 Berthold Schumacher Dipl Phys Apparatus for spectrochemical analysis and structural analysis of solids, liquids and gases by means of X-rays
DE1084044B (en) * 1958-04-01 1960-06-23 Berthold W Schumacher Dipl Phy Set of dynamic pressure levels

Also Published As

Publication number Publication date
DE1297898B (en) 1969-06-19
GB1027909A (en) 1966-04-27
US3319064A (en) 1967-05-09

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