FR1176408A - Device for chemical analysis - Google Patents

Device for chemical analysis

Info

Publication number
FR1176408A
FR1176408A FR1176408DA FR1176408A FR 1176408 A FR1176408 A FR 1176408A FR 1176408D A FR1176408D A FR 1176408DA FR 1176408 A FR1176408 A FR 1176408A
Authority
FR
France
Prior art keywords
chemical analysis
analysis
chemical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of FR1176408A publication Critical patent/FR1176408A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/06—Proportional counter tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR1176408D 1956-06-01 1957-06-01 Device for chemical analysis Expired FR1176408A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US588898A US2924715A (en) 1956-06-01 1956-06-01 X-ray analysis apparatus

Publications (1)

Publication Number Publication Date
FR1176408A true FR1176408A (en) 1959-04-10

Family

ID=24355764

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1176408D Expired FR1176408A (en) 1956-06-01 1957-06-01 Device for chemical analysis

Country Status (4)

Country Link
US (1) US2924715A (en)
DE (1) DE1068032B (en)
FR (1) FR1176408A (en)
NL (1) NL217744A (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3073952A (en) * 1956-09-11 1963-01-15 Gen Electric X-ray diffraction apparatus
US3084255A (en) * 1958-11-13 1963-04-02 Lab For Electronics Inc Radiation sensitive system
US3086116A (en) * 1959-03-24 1963-04-16 Sylvania Electric Prod Apparatus for determining radioactive material ratios
US3052795A (en) * 1959-03-27 1962-09-04 Perkin Elmer Corp Radiation dispersion system
US3042801A (en) * 1959-12-30 1962-07-03 United States Steel Corp Apparatus for analyzing a sample of material
DE1288341B (en) * 1960-03-12 1969-01-30 Well Completions Inc Method and device for the detection of chemical elements in a sample consisting of granular components
DE1223569B (en) * 1960-09-08 1966-08-25 Commissariat Energie Atomique Device for determining the layer thickness by beta-irradiation and measuring the backscattered characteristic X-ray radiation
US3105902A (en) * 1960-09-19 1963-10-01 Standard Oil Co Controlled atmosphere X-ray diffraction spectrometer
US3153144A (en) * 1961-02-03 1964-10-13 Applied Res Lab Inc Position adjustment mechanism and X-ray spectrometer including it
US3100263A (en) * 1962-02-21 1963-08-06 John W Verba Continuous rotation scattering chamber
US3126479A (en) * 1962-03-01 1964-03-24 X-ray analyzer system with ionization
NL143730B (en) * 1962-04-19 1974-10-15 Philips Nv DEVICE FOR MEASURING IONIZING RADIATION.
US3370167A (en) * 1964-07-13 1968-02-20 American Mach & Foundry Proton-excited soft x-ray analyzer having a rotatable target for selectively directing the x-rays to different detectors
US3471694A (en) * 1965-03-01 1969-10-07 Philips Electronics & Pharm In Charge particle barrier consisting of magnetic means for removing electrons from an x-ray beam
US3678274A (en) * 1969-10-29 1972-07-18 President Of Tokyo Univ Diaphragm-less radioactive radiation counter
CA935568A (en) * 1970-03-20 1973-10-16 Houtman Eliberthus Device for examining material by x-ray fluorescence
US4417355A (en) * 1981-01-08 1983-11-22 Leningradskoe Npo "Burevestnik" X-Ray fluorescence spectrometer
US4959848A (en) * 1987-12-16 1990-09-25 Axic Inc. Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis
JP3950156B1 (en) * 2006-04-11 2007-07-25 理学電機工業株式会社 X-ray fluorescence analyzer
CN105074441A (en) * 2013-02-28 2015-11-18 一般社团法人矿物研究会 Method for exanimation of element in living body

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2516672A (en) * 1944-05-27 1950-07-25 Socony Vacuum Oil Co Inc Apparatus for measuring radiant energy
US2683220A (en) * 1949-06-04 1954-07-06 Gen Aniline & Film Corp Spectrograph device
US2602142A (en) * 1949-11-15 1952-07-01 Melpar Inc X-ray spectrograph

Also Published As

Publication number Publication date
NL217744A (en)
DE1068032B (en) 1959-10-29
US2924715A (en) 1960-02-09

Similar Documents

Publication Publication Date Title
FR1176408A (en) Device for chemical analysis
FR1160021A (en) Mixing device
FR1172587A (en) Transistron converter device
CH354600A (en) Device for sampling liquids
FR1177962A (en) Ore sampling device
FR1164873A (en) Calibration device
FR1153145A (en) Handling device
FR1160844A (en) Sprayer device
FR1150947A (en) Pipe connection device
FR1168644A (en) Sampling device
FR1156919A (en) Pouring device
FR1163397A (en) Device for the development of forces
FR1147313A (en) Capping device
FR1145509A (en) Selection device
FR1185453A (en) Device for positioning transducer heads
FR1188750A (en) Concentration device for vidicon tube
FR1098351A (en) Balanced liquid sampling device
FR1150988A (en) Anti-drip device
FR1267136A (en) Advanced indicating device for measuring device
FR1146250A (en) Anti-water hammer device
FR1146415A (en) Fluid analyzer device
FR76033E (en) Trigger device for switches
FR70554E (en) Capping device
CH349429A (en) Potentiometric device
FR1177282A (en) Indicating device for meters