FR1139227A - Dispositif pour la diffraction des rayons x - Google Patents

Dispositif pour la diffraction des rayons x

Info

Publication number
FR1139227A
FR1139227A FR1139227DA FR1139227A FR 1139227 A FR1139227 A FR 1139227A FR 1139227D A FR1139227D A FR 1139227DA FR 1139227 A FR1139227 A FR 1139227A
Authority
FR
France
Prior art keywords
ray diffraction
diffraction
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Reiniger Werke AG
Original Assignee
Siemens Reiniger Werke AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Reiniger Werke AG filed Critical Siemens Reiniger Werke AG
Application granted granted Critical
Publication of FR1139227A publication Critical patent/FR1139227A/fr
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T74/00Machine element or mechanism
    • Y10T74/18Mechanical movements
    • Y10T74/18888Reciprocating to or from oscillating

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR1139227D 1954-04-09 1955-04-08 Dispositif pour la diffraction des rayons x Expired FR1139227A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES38635A DE1080320B (de) 1954-04-09 1954-04-09 Einrichtung zur Beugung von Roentgenstrahlen

Publications (1)

Publication Number Publication Date
FR1139227A true FR1139227A (fr) 1957-06-26

Family

ID=7483022

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1139227D Expired FR1139227A (fr) 1954-04-09 1955-04-08 Dispositif pour la diffraction des rayons x

Country Status (3)

Country Link
US (1) US2870337A (fr)
DE (1) DE1080320B (fr)
FR (1) FR1139227A (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3344274A (en) * 1967-09-26 Ray analysis apparatus having both diffraction amd spectrometer tubes mounted on a common housing
US3112398A (en) * 1960-02-15 1963-11-26 Shimula Yoshihiro Device for cooling the specimen in X-ray diffraction apparatus
US3218458A (en) * 1960-02-29 1965-11-16 Picker X Ray Corp Diffractometer
US3238371A (en) * 1963-02-11 1966-03-01 Picker X Ray Corp Waite Mfg X-ray beam attenuator
US3353020A (en) * 1964-10-15 1967-11-14 Sun Oil Co Automatic control system for an X-ray diffraction apparatus
US3411000A (en) * 1965-04-14 1968-11-12 Siemens Ag X-ray diffractometer diaphragm which is synchronously rotated with the specimen
US3852594A (en) * 1973-07-25 1974-12-03 Pepi Inc X-ray diffraction apparatus
DE2833078C2 (de) * 1978-07-27 1983-05-05 Siemens AG, 1000 Berlin und 8000 München Röntgen-Pulverdiffraktometer mit einem ortsempfindlichen Detektor
NL8201343A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met instelbare strooistralenspleet.
DE3430984A1 (de) * 1984-08-23 1986-03-06 Leybold-Heraeus GmbH, 5000 Köln Verfahren und vorrichtung zur registrierung von teilchen oder quanten mit hilfe eines detektors

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1780398A (en) * 1929-08-24 1930-11-04 Timken Axle Co Detroit Air compressor
US2602142A (en) * 1949-11-15 1952-07-01 Melpar Inc X-ray spectrograph
US2619600A (en) * 1950-07-13 1952-11-25 Philips Lab Inc X-ray spectrometry

Also Published As

Publication number Publication date
US2870337A (en) 1959-01-20
DE1080320B (de) 1960-04-21

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