FR1139227A - Dispositif pour la diffraction des rayons x - Google Patents
Dispositif pour la diffraction des rayons xInfo
- Publication number
- FR1139227A FR1139227A FR1139227DA FR1139227A FR 1139227 A FR1139227 A FR 1139227A FR 1139227D A FR1139227D A FR 1139227DA FR 1139227 A FR1139227 A FR 1139227A
- Authority
- FR
- France
- Prior art keywords
- ray diffraction
- diffraction
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T74/00—Machine element or mechanism
- Y10T74/18—Mechanical movements
- Y10T74/18888—Reciprocating to or from oscillating
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES38635A DE1080320B (de) | 1954-04-09 | 1954-04-09 | Einrichtung zur Beugung von Roentgenstrahlen |
Publications (1)
Publication Number | Publication Date |
---|---|
FR1139227A true FR1139227A (fr) | 1957-06-26 |
Family
ID=7483022
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1139227D Expired FR1139227A (fr) | 1954-04-09 | 1955-04-08 | Dispositif pour la diffraction des rayons x |
Country Status (3)
Country | Link |
---|---|
US (1) | US2870337A (fr) |
DE (1) | DE1080320B (fr) |
FR (1) | FR1139227A (fr) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3344274A (en) * | 1967-09-26 | Ray analysis apparatus having both diffraction amd spectrometer tubes mounted on a common housing | ||
US3112398A (en) * | 1960-02-15 | 1963-11-26 | Shimula Yoshihiro | Device for cooling the specimen in X-ray diffraction apparatus |
US3218458A (en) * | 1960-02-29 | 1965-11-16 | Picker X Ray Corp | Diffractometer |
US3238371A (en) * | 1963-02-11 | 1966-03-01 | Picker X Ray Corp Waite Mfg | X-ray beam attenuator |
US3353020A (en) * | 1964-10-15 | 1967-11-14 | Sun Oil Co | Automatic control system for an X-ray diffraction apparatus |
US3411000A (en) * | 1965-04-14 | 1968-11-12 | Siemens Ag | X-ray diffractometer diaphragm which is synchronously rotated with the specimen |
US3852594A (en) * | 1973-07-25 | 1974-12-03 | Pepi Inc | X-ray diffraction apparatus |
DE2833078C2 (de) * | 1978-07-27 | 1983-05-05 | Siemens AG, 1000 Berlin und 8000 München | Röntgen-Pulverdiffraktometer mit einem ortsempfindlichen Detektor |
NL8201343A (nl) * | 1982-03-31 | 1983-10-17 | Philips Nv | Roentgen analyse apparaat met instelbare strooistralenspleet. |
DE3430984A1 (de) * | 1984-08-23 | 1986-03-06 | Leybold-Heraeus GmbH, 5000 Köln | Verfahren und vorrichtung zur registrierung von teilchen oder quanten mit hilfe eines detektors |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1780398A (en) * | 1929-08-24 | 1930-11-04 | Timken Axle Co Detroit | Air compressor |
US2602142A (en) * | 1949-11-15 | 1952-07-01 | Melpar Inc | X-ray spectrograph |
US2619600A (en) * | 1950-07-13 | 1952-11-25 | Philips Lab Inc | X-ray spectrometry |
-
1954
- 1954-04-09 DE DES38635A patent/DE1080320B/de active Pending
-
1955
- 1955-04-08 US US500051A patent/US2870337A/en not_active Expired - Lifetime
- 1955-04-08 FR FR1139227D patent/FR1139227A/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US2870337A (en) | 1959-01-20 |
DE1080320B (de) | 1960-04-21 |
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