FR1018218A - Adjustable filament holder system for focused fixed electron beam devices such as, but not limited to, electron microscope and diffraction analyzer - Google Patents

Adjustable filament holder system for focused fixed electron beam devices such as, but not limited to, electron microscope and diffraction analyzer

Info

Publication number
FR1018218A
FR1018218A FR1018218DA FR1018218A FR 1018218 A FR1018218 A FR 1018218A FR 1018218D A FR1018218D A FR 1018218DA FR 1018218 A FR1018218 A FR 1018218A
Authority
FR
France
Prior art keywords
limited
holder system
beam devices
electron beam
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
CSF Compagnie Generale de Telegraphie sans Fil SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CSF Compagnie Generale de Telegraphie sans Fil SA filed Critical CSF Compagnie Generale de Telegraphie sans Fil SA
Application granted granted Critical
Publication of FR1018218A publication Critical patent/FR1018218A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06—Electron sources; Electron guns
    • H01J37/067—Replacing parts of guns; Mutual adjustment of electrodes
FR1018218D 1950-05-20 1950-05-20 Adjustable filament holder system for focused fixed electron beam devices such as, but not limited to, electron microscope and diffraction analyzer Expired FR1018218A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1018218T 1950-05-20

Publications (1)

Publication Number Publication Date
FR1018218A true FR1018218A (en) 1952-12-30

Family

ID=9574940

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1018218D Expired FR1018218A (en) 1950-05-20 1950-05-20 Adjustable filament holder system for focused fixed electron beam devices such as, but not limited to, electron microscope and diffraction analyzer

Country Status (1)

Country Link
FR (1) FR1018218A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0168641A2 (en) * 1984-06-15 1986-01-22 Kabushiki Kaisha Toshiba X-ray tube
EP0296385A2 (en) * 1987-06-26 1988-12-28 Siemens Aktiengesellschaft Beam emitting system for particle beam apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0168641A2 (en) * 1984-06-15 1986-01-22 Kabushiki Kaisha Toshiba X-ray tube
EP0168641A3 (en) * 1984-06-15 1987-10-28 Kabushiki Kaisha Toshiba X-ray tube
EP0296385A2 (en) * 1987-06-26 1988-12-28 Siemens Aktiengesellschaft Beam emitting system for particle beam apparatus
EP0296385A3 (en) * 1987-06-26 1989-12-27 Siemens Aktiengesellschaft Beam emitting system for particle beam apparatus

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