FI950816A - Kaksoissäteilylähdekokoonpano ja mittausanturi - Google Patents

Kaksoissäteilylähdekokoonpano ja mittausanturi Download PDF

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Publication number
FI950816A
FI950816A FI950816A FI950816A FI950816A FI 950816 A FI950816 A FI 950816A FI 950816 A FI950816 A FI 950816A FI 950816 A FI950816 A FI 950816A FI 950816 A FI950816 A FI 950816A
Authority
FI
Finland
Prior art keywords
composition
beam source
double beam
measurement detector
detector
Prior art date
Application number
FI950816A
Other languages
English (en)
Swedish (sv)
Other versions
FI102696B1 (fi
FI950816A0 (fi
FI102696B (fi
Inventor
Kurt Peter Weckstroem
Pekka Tuomo Merilaeinen
Boerje Tor Rantala
Original Assignee
Instrumentarium Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Instrumentarium Oy filed Critical Instrumentarium Oy
Priority to FI950816A priority Critical patent/FI102696B/fi
Publication of FI950816A0 publication Critical patent/FI950816A0/fi
Priority to DE1996624602 priority patent/DE69624602T2/de
Priority to EP96301174A priority patent/EP0729016B1/en
Priority to US08/605,810 priority patent/US5668376A/en
Publication of FI950816A publication Critical patent/FI950816A/fi
Application granted granted Critical
Publication of FI102696B1 publication Critical patent/FI102696B1/fi
Publication of FI102696B publication Critical patent/FI102696B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI950816A 1995-02-22 1995-02-22 Kaksoissäteilylähdekokoonpano ja mittausanturi FI102696B (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI950816A FI102696B (fi) 1995-02-22 1995-02-22 Kaksoissäteilylähdekokoonpano ja mittausanturi
DE1996624602 DE69624602T2 (de) 1995-02-22 1996-02-21 Doppelstrahlungsquelleanordnung sowie hiermit ausgerüsteter Sensor
EP96301174A EP0729016B1 (en) 1995-02-22 1996-02-21 Double radiation source assembly and transducer incorporating same
US08/605,810 US5668376A (en) 1995-02-22 1996-02-23 Double radiation source assembly and transducer

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
FI950816A FI102696B (fi) 1995-02-22 1995-02-22 Kaksoissäteilylähdekokoonpano ja mittausanturi
FI950816 1995-02-22
US08/605,810 US5668376A (en) 1995-02-22 1996-02-23 Double radiation source assembly and transducer
US60581096 1996-02-23

Publications (4)

Publication Number Publication Date
FI950816A0 FI950816A0 (fi) 1995-02-22
FI950816A true FI950816A (fi) 1996-08-23
FI102696B1 FI102696B1 (fi) 1999-01-29
FI102696B FI102696B (fi) 1999-01-29

Family

ID=26159923

Family Applications (1)

Application Number Title Priority Date Filing Date
FI950816A FI102696B (fi) 1995-02-22 1995-02-22 Kaksoissäteilylähdekokoonpano ja mittausanturi

Country Status (3)

Country Link
US (1) US5668376A (fi)
EP (1) EP0729016B1 (fi)
FI (1) FI102696B (fi)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR970049350A (ko) * 1995-12-19 1997-07-29 윤종용 터치패널
US5910659A (en) * 1996-04-30 1999-06-08 The United States Of America As Represented By The Secretary Of Commerce Flat panel thermal infrared generator
US5852308A (en) * 1997-06-30 1998-12-22 Honeywell Inc. Micromachined inferential opto-thermal gas sensor
US6124145A (en) * 1998-01-23 2000-09-26 Instrumentarium Corporation Micromachined gas-filled chambers and method of microfabrication
US6097034A (en) * 1998-02-12 2000-08-01 Instrumentarium Oy Radiation source assembly and transducer for analyzing gases or other substances
NO307392B1 (no) 1998-07-14 2000-03-27 Simrad Optronics As Strålekilde
US7015422B2 (en) 2000-12-21 2006-03-21 Mattson Technology, Inc. System and process for heating semiconductor wafers by optimizing absorption of electromagnetic energy
US6896850B2 (en) * 2001-03-26 2005-05-24 Kumetrix, Inc. Silicon nitride window for microsampling device and method of construction
EP1393354A1 (de) * 2001-05-23 2004-03-03 Mattson Thermal Products GmbH Verfahren und vorrichtung zum thermischen behandeln von substraten
DE10342800A1 (de) * 2003-09-16 2005-04-28 Fraunhofer Ges Forschung Vorrichtung zur Absorption und/oder Emission von Strahlung, Verfahren zur Herstellung einer solchen Vorrichtung und Verfahren zur Analyse von Fluiden
DE102006060138B4 (de) * 2006-12-18 2009-01-22 Airbus France Online-Sensor zum Überwachen chemischer Verunreinigungen in hydraulischen Flüssigkeiten
WO2008092114A2 (en) * 2007-01-26 2008-07-31 O.I. Corporation D/B/A O.I. Analytical Non-dispersive electromagnetic radiation detector
JP5223298B2 (ja) * 2007-10-30 2013-06-26 横河電機株式会社 赤外線光源
EP3144663B1 (en) * 2016-11-18 2020-06-17 Sensirion AG Gas sensor module
FR3096461B1 (fr) * 2019-05-23 2021-10-29 Elichens Dispositif d'émission et de contrôle d'une lumière infra-rouge et capteur de gaz utilisant un tel dispositif
CN112485212A (zh) * 2020-11-18 2021-03-12 宁波海尔欣光电科技有限公司 泄露检测系统、方法、装置及非瞬态存储介质

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3745349A (en) * 1971-11-18 1973-07-10 M Liston Single path,dual source radiant energy analyzer
US4084096A (en) * 1977-02-14 1978-04-11 Edwards Miles L Electrically activated infrared source
DE3466127D1 (en) * 1983-05-09 1987-10-15 Shaye Communications Ltd Element
US4914720A (en) * 1986-12-04 1990-04-03 Cascadia Technology Corporation Gas analyzers
US4922116A (en) * 1988-08-04 1990-05-01 Hughes Aircraft Company Flicker free infrared simulator with resistor bridges
US5285131A (en) * 1990-12-03 1994-02-08 University Of California - Berkeley Vacuum-sealed silicon incandescent light
FI101911B (fi) * 1993-04-07 1998-09-15 Valtion Teknillinen Sähköisesti moduloitava terminen säteilylähde ja menetelmä sen valmist amiseksi
FI110727B (fi) * 1994-06-23 2003-03-14 Vaisala Oyj Sähköisesti moduloitava terminen säteilylähde

Also Published As

Publication number Publication date
EP0729016B1 (en) 2002-11-06
FI102696B1 (fi) 1999-01-29
EP0729016A2 (en) 1996-08-28
EP0729016A3 (en) 1997-06-11
FI950816A0 (fi) 1995-02-22
FI102696B (fi) 1999-01-29
US5668376A (en) 1997-09-16

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MA Patent expired