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Application filed by Kajaani ElectronicsfiledCriticalKajaani Electronics
Priority to FI890073ApriorityCriticalpatent/FI84298C/fi
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Publication of FI890073ApublicationCriticalpatent/FI890073A/fi
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Publication of FI84298BpublicationCriticalpatent/FI84298B/fi
Publication of FI84298CpublicationCriticalpatent/FI84298C/fi
Detector system for measuring the intensity of a radiation scattered at a predetermined angle from a sample irradiated at a specified angle of incidence