FI8789U1 - Signaalinkytkentäyksikkö - Google Patents

Signaalinkytkentäyksikkö

Info

Publication number
FI8789U1
FI8789U1 FI20100158U FIU20100158U FI8789U1 FI 8789 U1 FI8789 U1 FI 8789U1 FI 20100158 U FI20100158 U FI 20100158U FI U20100158 U FIU20100158 U FI U20100158U FI 8789 U1 FI8789 U1 FI 8789U1
Authority
FI
Finland
Prior art keywords
switching unit
signal switching
signal
unit
switching
Prior art date
Application number
FI20100158U
Other languages
English (en)
Swedish (sv)
Inventor
Eero Rossi
Tuomo Tolonen
Kai Airikkala
Original Assignee
Orbis Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orbis Oy filed Critical Orbis Oy
Priority to FI20100158U priority Critical patent/FI8789U1/fi
Publication of FIU20100158U0 publication Critical patent/FIU20100158U0/fi
Priority to SE1000372A priority patent/SE535114C2/sv
Application granted granted Critical
Publication of FI8789U1 publication Critical patent/FI8789U1/fi
Priority to CN2011200894966U priority patent/CN202077036U/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
FI20100158U 2010-03-30 2010-03-30 Signaalinkytkentäyksikkö FI8789U1 (fi)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI20100158U FI8789U1 (fi) 2010-03-30 2010-03-30 Signaalinkytkentäyksikkö
SE1000372A SE535114C2 (sv) 2010-03-30 2010-04-13 Signalkopplingsenhet för radiofrekventa signaler innefattande en elektroniskt styrbar komponent
CN2011200894966U CN202077036U (zh) 2010-03-30 2011-03-30 信号交换单元

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20100158U FI8789U1 (fi) 2010-03-30 2010-03-30 Signaalinkytkentäyksikkö

Publications (2)

Publication Number Publication Date
FIU20100158U0 FIU20100158U0 (fi) 2010-03-30
FI8789U1 true FI8789U1 (fi) 2010-07-21

Family

ID=42074504

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20100158U FI8789U1 (fi) 2010-03-30 2010-03-30 Signaalinkytkentäyksikkö

Country Status (3)

Country Link
CN (1) CN202077036U (fi)
FI (1) FI8789U1 (fi)
SE (1) SE535114C2 (fi)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104615039B (zh) * 2014-09-22 2017-09-26 中国电子科技集团公司第四十一研究所 一种usb接口控制的可扩展的多路射频开关装置
EP3860005B1 (en) * 2020-01-28 2023-02-22 Rohde & Schwarz GmbH & Co. KG System and method for calibrating a multi-channel radio frequency signal generation system

Also Published As

Publication number Publication date
SE535114C2 (sv) 2012-04-17
CN202077036U (zh) 2011-12-14
SE1000372A1 (sv) 2011-10-01
FIU20100158U0 (fi) 2010-03-30

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