FI800767A - Inspektionssystem foer detektering av defekter i regelbundna figurer - Google Patents

Inspektionssystem foer detektering av defekter i regelbundna figurer

Info

Publication number
FI800767A
FI800767A FI800767A FI800767A FI800767A FI 800767 A FI800767 A FI 800767A FI 800767 A FI800767 A FI 800767A FI 800767 A FI800767 A FI 800767A FI 800767 A FI800767 A FI 800767A
Authority
FI
Finland
Prior art keywords
defectors
expression
figures
detection
inspection system
Prior art date
Application number
FI800767A
Other languages
English (en)
Inventor
Peter David Southgate
John Prickett Beltz
Original Assignee
Rca Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US06/021,822 external-priority patent/US4292672A/en
Application filed by Rca Corp filed Critical Rca Corp
Publication of FI800767A publication Critical patent/FI800767A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FI800767A 1979-03-19 1980-03-12 Inspektionssystem foer detektering av defekter i regelbundna figurer FI800767A (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US2182679A 1979-03-19 1979-03-19
US06/021,822 US4292672A (en) 1979-03-19 1979-03-19 Inspection system for detecting defects in regular patterns

Publications (1)

Publication Number Publication Date
FI800767A true FI800767A (fi) 1980-09-20

Family

ID=26695138

Family Applications (1)

Application Number Title Priority Date Filing Date
FI800767A FI800767A (fi) 1979-03-19 1980-03-12 Inspektionssystem foer detektering av defekter i regelbundna figurer

Country Status (9)

Country Link
KR (1) KR830001829B1 (fi)
CA (1) CA1140251A (fi)
DD (1) DD149585A5 (fi)
DE (1) DE3010559C2 (fi)
FI (1) FI800767A (fi)
FR (1) FR2452101A1 (fi)
GB (1) GB2044925B (fi)
IT (1) IT1130315B (fi)
PL (1) PL137040B1 (fi)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1196085A (en) * 1980-11-07 1985-10-29 John W.V. Miller Method and apparatus for detecting defects in glass bottles using event proximity
DE3578768D1 (de) * 1985-03-14 1990-08-23 Toppan Printing Co Ltd Einrichtung zum ueberpruefen von abdruecken.
DE3522179A1 (de) * 1985-06-21 1987-01-02 Forschungsgemeinschaft Aut Sic Vorrichtung zur durchfuehrung optischer messungen an eingebauten windschutzscheiben
DE3737869A1 (de) * 1987-11-09 1989-05-24 Wagner Hans Juergen Dipl Ing Verfahren und einrichtung zum optischen pruefen von gegenstaenden

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1234941A (en) * 1967-08-16 1971-06-09 Emi Ltd Improvements in or relating to pattern recognition devices
US3620630A (en) * 1969-05-28 1971-11-16 Raytheon Co Radiation-sensitive mesh defect inspection system

Also Published As

Publication number Publication date
DD149585A5 (de) 1981-07-15
CA1140251A (en) 1983-01-25
FR2452101B1 (fi) 1984-07-20
GB2044925A (en) 1980-10-22
PL222821A1 (fi) 1981-01-30
FR2452101A1 (fr) 1980-10-17
DE3010559C2 (de) 1984-07-12
GB2044925B (en) 1983-02-09
IT8020392A0 (it) 1980-03-06
DE3010559A1 (de) 1980-10-23
KR830001829B1 (ko) 1983-09-12
IT1130315B (it) 1986-06-11
PL137040B1 (en) 1986-04-30

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Legal Events

Date Code Title Description
FD Application lapsed

Owner name: RCA CORPORATION