FI20155546A - METHOD FOR MONITORING THE OPTICAL ROAD STATUS IN THE OPTICAL RADIATION SPECTROSCOPY OF THE SAMPLE AND A COMPUTER PROGRAM FOR THE PROCESSING DEVICE - Google Patents

METHOD FOR MONITORING THE OPTICAL ROAD STATUS IN THE OPTICAL RADIATION SPECTROSCOPY OF THE SAMPLE AND A COMPUTER PROGRAM FOR THE PROCESSING DEVICE

Info

Publication number
FI20155546A
FI20155546A FI20155546A FI20155546A FI20155546A FI 20155546 A FI20155546 A FI 20155546A FI 20155546 A FI20155546 A FI 20155546A FI 20155546 A FI20155546 A FI 20155546A FI 20155546 A FI20155546 A FI 20155546A
Authority
FI
Finland
Prior art keywords
optical
monitoring
sample
computer program
processing device
Prior art date
Application number
FI20155546A
Other languages
Finnish (fi)
Swedish (sv)
Inventor
Lauri Köresaar
Björn Salmi
Arto Ollikainen
Original Assignee
Outotec Finland Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Outotec Finland Oy filed Critical Outotec Finland Oy
Priority to FI20155546A priority Critical patent/FI20155546A/en
Priority to BR112018000233A priority patent/BR112018000233A2/en
Priority to PCT/FI2016/050504 priority patent/WO2017009528A1/en
Priority to AU2016293213A priority patent/AU2016293213B2/en
Priority to CA2991462A priority patent/CA2991462A1/en
Publication of FI20155546A publication Critical patent/FI20155546A/en
Priority to ZA2018/00363A priority patent/ZA201800363B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/155Monitoring cleanness of window, lens, or other parts
    • G01N2021/157Monitoring by optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids
    • G01N2021/8592Grain or other flowing solid samples
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/68Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FI20155546A 2015-07-10 2015-07-10 METHOD FOR MONITORING THE OPTICAL ROAD STATUS IN THE OPTICAL RADIATION SPECTROSCOPY OF THE SAMPLE AND A COMPUTER PROGRAM FOR THE PROCESSING DEVICE FI20155546A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI20155546A FI20155546A (en) 2015-07-10 2015-07-10 METHOD FOR MONITORING THE OPTICAL ROAD STATUS IN THE OPTICAL RADIATION SPECTROSCOPY OF THE SAMPLE AND A COMPUTER PROGRAM FOR THE PROCESSING DEVICE
BR112018000233A BR112018000233A2 (en) 2015-07-10 2016-07-08 method for optical path observation state in optical emission spectroscopy of a sample and computer program product for a processing device
PCT/FI2016/050504 WO2017009528A1 (en) 2015-07-10 2016-07-08 Method for observation state of optical path in optical emission spectroscopy of a sample and computer program product for a processing device
AU2016293213A AU2016293213B2 (en) 2015-07-10 2016-07-08 Method for observation state of optical path in optical emission spectroscopy of a sample and computer program product for a processing device
CA2991462A CA2991462A1 (en) 2015-07-10 2016-07-08 Method for observation state of optical path in optical emission spectroscopy of a sample and computer program product for a processing device
ZA2018/00363A ZA201800363B (en) 2015-07-10 2018-01-18 Method for observation state of optical path in optical emission spectroscopy of a sample and computer program product for a processing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20155546A FI20155546A (en) 2015-07-10 2015-07-10 METHOD FOR MONITORING THE OPTICAL ROAD STATUS IN THE OPTICAL RADIATION SPECTROSCOPY OF THE SAMPLE AND A COMPUTER PROGRAM FOR THE PROCESSING DEVICE

Publications (1)

Publication Number Publication Date
FI20155546A true FI20155546A (en) 2017-01-11

Family

ID=56413702

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20155546A FI20155546A (en) 2015-07-10 2015-07-10 METHOD FOR MONITORING THE OPTICAL ROAD STATUS IN THE OPTICAL RADIATION SPECTROSCOPY OF THE SAMPLE AND A COMPUTER PROGRAM FOR THE PROCESSING DEVICE

Country Status (6)

Country Link
AU (1) AU2016293213B2 (en)
BR (1) BR112018000233A2 (en)
CA (1) CA2991462A1 (en)
FI (1) FI20155546A (en)
WO (1) WO2017009528A1 (en)
ZA (1) ZA201800363B (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6603538B1 (en) * 2000-11-21 2003-08-05 Applied Materials, Inc. Method and apparatus employing optical emission spectroscopy to detect a fault in process conditions of a semiconductor processing system
FR2882593B1 (en) * 2005-02-28 2007-05-04 Commissariat Energie Atomique METHOD AND SYSTEM FOR PHYSICOCHEMICAL ANALYSIS USING PULSE LASER ABLATION
DE102006028250A1 (en) * 2006-06-20 2007-12-27 Carl Zeiss Microimaging Gmbh Monitoring laser welding processes with or without spontaneous plasma zone formation, images optical radiation from processing region, analyzes spectrally and evaluates
US7948617B2 (en) * 2007-07-09 2011-05-24 Fluke Corporation Optical multiwavelength window contamination monitor for optical control sensors and systems
JP2013036779A (en) * 2011-08-04 2013-02-21 Toshiba Corp Laser-induced breakdown spectral analyzer
AU2013407022B2 (en) * 2013-12-02 2017-06-01 Outotec (Finland) Oy Method and apparatus for online analysis by laser-induced spectroscopy

Also Published As

Publication number Publication date
CA2991462A1 (en) 2017-01-19
ZA201800363B (en) 2019-08-28
AU2016293213B2 (en) 2018-11-29
AU2016293213A1 (en) 2018-02-08
BR112018000233A2 (en) 2018-09-04
WO2017009528A1 (en) 2017-01-19

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