FI20135749A - Kuvanoton tahdistaminen - Google Patents
Kuvanoton tahdistaminen Download PDFInfo
- Publication number
- FI20135749A FI20135749A FI20135749A FI20135749A FI20135749A FI 20135749 A FI20135749 A FI 20135749A FI 20135749 A FI20135749 A FI 20135749A FI 20135749 A FI20135749 A FI 20135749A FI 20135749 A FI20135749 A FI 20135749A
- Authority
- FI
- Finland
- Prior art keywords
- image capture
- synchronizing image
- synchronizing
- capture
- image
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
- H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
-
- D—TEXTILES; PAPER
- D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
- D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
- D21G9/00—Other accessories for paper-making machines
- D21G9/0009—Paper-making control systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/34—Paper
- G01N33/346—Paper sheets
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/40—Analysis of texture
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
- H04N1/00002—Diagnosis, testing or measuring; Detecting, analysing or monitoring not otherwise provided for
- H04N1/00005—Diagnosis, testing or measuring; Detecting, analysing or monitoring not otherwise provided for relating to image data
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
- H04N1/00127—Connection or combination of a still picture apparatus with another apparatus, e.g. for storage, processing or transmission of still picture signals or of information associated with a still picture
- H04N1/00249—Connection or combination of a still picture apparatus with another apparatus, e.g. for storage, processing or transmission of still picture signals or of information associated with a still picture with a photographic apparatus, e.g. a photographic printer or a projector
- H04N1/00251—Connection or combination of a still picture apparatus with another apparatus, e.g. for storage, processing or transmission of still picture signals or of information associated with a still picture with a photographic apparatus, e.g. a photographic printer or a projector with an apparatus for taking photographic images, e.g. a camera
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/70—Circuitry for compensating brightness variation in the scene
- H04N23/73—Circuitry for compensating brightness variation in the scene by influencing the exposure time
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
- G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30124—Fabrics; Textile; Paper
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Signal Processing (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Theoretical Computer Science (AREA)
- Textile Engineering (AREA)
- Quality & Reliability (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Biomedical Technology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Studio Devices (AREA)
- Image Analysis (AREA)
- Closed-Circuit Television Systems (AREA)
- General Factory Administration (AREA)
- Image Processing (AREA)
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20135749A FI128403B (fi) | 2013-07-05 | 2013-07-05 | Kuvanoton tahdistaminen |
EP14819582.9A EP3017425B1 (en) | 2013-07-05 | 2014-07-07 | Synchronization of imaging |
JP2016522686A JP2016532099A (ja) | 2013-07-05 | 2014-07-07 | 画像化の同期 |
CN201480038286.0A CN105917379B (zh) | 2013-07-05 | 2014-07-07 | 成像的同步化 |
PCT/FI2014/050564 WO2015001196A1 (en) | 2013-07-05 | 2014-07-07 | Synchronization of imaging |
KR1020157036631A KR102038181B1 (ko) | 2013-07-05 | 2014-07-07 | 영상 동기화 |
US14/902,852 US9532015B2 (en) | 2013-07-05 | 2014-07-07 | Synchronization of imaging |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20135749A FI128403B (fi) | 2013-07-05 | 2013-07-05 | Kuvanoton tahdistaminen |
Publications (2)
Publication Number | Publication Date |
---|---|
FI20135749A true FI20135749A (fi) | 2015-01-06 |
FI128403B FI128403B (fi) | 2020-04-30 |
Family
ID=52143169
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20135749A FI128403B (fi) | 2013-07-05 | 2013-07-05 | Kuvanoton tahdistaminen |
Country Status (7)
Country | Link |
---|---|
US (1) | US9532015B2 (fi) |
EP (1) | EP3017425B1 (fi) |
JP (1) | JP2016532099A (fi) |
KR (1) | KR102038181B1 (fi) |
CN (1) | CN105917379B (fi) |
FI (1) | FI128403B (fi) |
WO (1) | WO2015001196A1 (fi) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20160364525A1 (en) * | 2015-06-09 | 2016-12-15 | Toshiba Medical Systems Corporation | Medical image processing apparatus and medical image transfer system |
FI20155643A (fi) | 2015-09-08 | 2017-03-09 | Procemex Oy Ltd | Fluoresoivan nesteen optinen havainnointi puukuiturainasta |
FI128735B (fi) * | 2016-05-06 | 2020-11-13 | Procemex Oy Ltd | Konenäkömenetelmä ja -järjestelmä |
FI128850B (fi) * | 2016-05-06 | 2021-01-29 | Procemex Oy Ltd | Konenäkömenetelmä sekä järjestelmä valmistusprosessien valvomiseksi |
CN113445201B (zh) * | 2021-07-20 | 2022-09-27 | 大易智慧信息科技(苏州)有限公司 | 基于相机阵列的双针床经编机断丝在线检测系统及其方法 |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05240805A (ja) * | 1992-02-27 | 1993-09-21 | Kawasaki Steel Corp | 表面欠陥検査装置 |
JPH1065940A (ja) * | 1996-06-13 | 1998-03-06 | Olympus Optical Co Ltd | 撮像装置 |
JP3015325B2 (ja) * | 1996-06-26 | 2000-03-06 | 東芝エンジニアリング株式会社 | スジキズ検査方法及びその装置 |
JPH1194760A (ja) * | 1997-09-24 | 1999-04-09 | Olympus Optical Co Ltd | 欠陥検出用顕微鏡 |
US5935285A (en) * | 1997-12-30 | 1999-08-10 | Coors Brewing Company | Method for inspecting manufactured articles |
US6947587B1 (en) * | 1998-04-21 | 2005-09-20 | Hitachi, Ltd. | Defect inspection method and apparatus |
EP0979995A1 (en) | 1998-08-12 | 2000-02-16 | Hildeco OY Ltd. | Method and system for monitoring a paper web, a paper pulp or a wire travelling in a paper machine |
FI990159A (fi) * | 1999-01-28 | 2000-07-29 | Valmet Automation Inc | Menetelmä kuiturainan laadun valvomiseksi |
FI114741B (fi) | 2001-05-11 | 2004-12-15 | Metso Automation Oy | Lämpökuvaukseen perustuva laadun- ja kunnonvalvontamenetelmä |
DE10260464A1 (de) | 2002-12-21 | 2004-07-01 | Voith Paper Patent Gmbh | Verfahren und Vorrichtung zum Betreiben einer Maschine zum Herstellen und/oder Veredeln einer Materialbahn |
US7027934B2 (en) * | 2003-09-24 | 2006-04-11 | 3M Innovative Properties Company | Apparatus and method for automated web inspection |
US20050117017A1 (en) | 2003-12-01 | 2005-06-02 | Baer Richard L. | System and method for imaging regions of interest |
JP2005308464A (ja) * | 2004-04-20 | 2005-11-04 | Dainippon Screen Mfg Co Ltd | 欠陥検出装置および欠陥検出方法 |
EP1630550A1 (en) | 2004-08-27 | 2006-03-01 | Moller & Devicon A/S | Methods and apparatuses of detecting foreign particles or faults in a plurality of filled containers |
CN101091381A (zh) * | 2004-12-23 | 2007-12-19 | 诺基亚公司 | 通过数字摄像机选取扫描区域的多个子窗口的方法 |
EP1897495A4 (en) * | 2005-06-28 | 2011-01-05 | Konica Minolta Med & Graphic | METHOD FOR THE DETECTION OF ANOMALIC SHADE CANDIDATES, DEVICE FOR DETECTING ANOMALIC SHADE CANDIDATES |
JP2007049673A (ja) * | 2005-07-13 | 2007-02-22 | Ricoh Co Ltd | 画像読み取り装置、画像形成装置、画像検査装置及び画像形成システム |
JP2007240432A (ja) * | 2006-03-10 | 2007-09-20 | Omron Corp | 欠陥検査装置および欠陥検査方法 |
US8014586B2 (en) * | 2007-05-24 | 2011-09-06 | Applied Vision Corporation | Apparatus and methods for container inspection |
KR20100054783A (ko) * | 2007-07-04 | 2010-05-25 | 테르모센소리크 게엠베하 | 열류 서모그래피를 이용한 용접 이음매의 자동 검사 방법 |
EP2315020B1 (en) * | 2008-07-18 | 2019-07-24 | Tohoku University | Method for imaging a structure defect and device for imaging a structure defect |
AT508159B1 (de) | 2009-06-05 | 2010-11-15 | Starlinger & Co Gmbh | Fehlerstellenerkennung |
US20110141269A1 (en) | 2009-12-16 | 2011-06-16 | Stephen Michael Varga | Systems And Methods For Monitoring On-Line Webs Using Line Scan Cameras |
US8345949B2 (en) * | 2010-03-09 | 2013-01-01 | General Electric Company | Sequential approach for automatic defect recognition |
FR2978831A1 (fr) * | 2011-08-05 | 2013-02-08 | St Microelectronics Sa | Detection de defauts par imagerie thermique frequentielle. |
US20120293623A1 (en) * | 2011-05-17 | 2012-11-22 | Gii Acquisition, Llc Dba General Inspection, Llc | Method and system for inspecting small manufactured objects at a plurality of inspection stations and sorting the inspected objects |
JP2013190309A (ja) * | 2012-03-13 | 2013-09-26 | Toshiba Corp | 欠陥検査装置 |
JP5944189B2 (ja) * | 2012-03-15 | 2016-07-05 | 株式会社東芝 | マスク基板の欠陥検査方法及び欠陥検査装置、フォトマスクの製造方法及び半導体装置の製造方法 |
US9390491B2 (en) * | 2013-01-30 | 2016-07-12 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method for automatic quality control for assembly line processes |
JP6241052B2 (ja) * | 2013-03-29 | 2017-12-06 | オムロン株式会社 | 画像処理システムおよび画像処理プログラム |
-
2013
- 2013-07-05 FI FI20135749A patent/FI128403B/fi active IP Right Grant
-
2014
- 2014-07-07 WO PCT/FI2014/050564 patent/WO2015001196A1/en active Application Filing
- 2014-07-07 JP JP2016522686A patent/JP2016532099A/ja active Pending
- 2014-07-07 KR KR1020157036631A patent/KR102038181B1/ko active IP Right Grant
- 2014-07-07 EP EP14819582.9A patent/EP3017425B1/en active Active
- 2014-07-07 CN CN201480038286.0A patent/CN105917379B/zh active Active
- 2014-07-07 US US14/902,852 patent/US9532015B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
FI128403B (fi) | 2020-04-30 |
EP3017425C0 (en) | 2024-03-20 |
EP3017425A1 (en) | 2016-05-11 |
KR20160030116A (ko) | 2016-03-16 |
EP3017425B1 (en) | 2024-03-20 |
KR102038181B1 (ko) | 2019-10-30 |
US9532015B2 (en) | 2016-12-27 |
CN105917379B (zh) | 2019-10-11 |
EP3017425A4 (en) | 2018-08-15 |
WO2015001196A1 (en) | 2015-01-08 |
US20160142682A1 (en) | 2016-05-19 |
JP2016532099A (ja) | 2016-10-13 |
CN105917379A (zh) | 2016-08-31 |
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