FI20095992A0 - Mätfönsterkonstruktion - Google Patents

Mätfönsterkonstruktion

Info

Publication number
FI20095992A0
FI20095992A0 FI20095992A FI20095992A FI20095992A0 FI 20095992 A0 FI20095992 A0 FI 20095992A0 FI 20095992 A FI20095992 A FI 20095992A FI 20095992 A FI20095992 A FI 20095992A FI 20095992 A0 FI20095992 A0 FI 20095992A0
Authority
FI
Finland
Prior art keywords
window structure
measuring window
measuring
window
Prior art date
Application number
FI20095992A
Other languages
English (en)
Finnish (fi)
Other versions
FI20095992A (sv
FI124114B (sv
Inventor
Harri J Salo
Original Assignee
Janesko Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Janesko Oy filed Critical Janesko Oy
Priority to FI20095992A priority Critical patent/FI124114B/sv
Publication of FI20095992A0 publication Critical patent/FI20095992A0/sv
Priority to DE102010041511A priority patent/DE102010041511A1/de
Priority to US12/892,415 priority patent/US8456627B2/en
Publication of FI20095992A publication Critical patent/FI20095992A/sv
Application granted granted Critical
Publication of FI124114B publication Critical patent/FI124114B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133—Refractometers, e.g. differential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0317—High pressure cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N21/8507—Probe photometers, i.e. with optical measuring part dipped into fluid sample

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI20095992A 2009-09-29 2009-09-29 Mätfönsterkonstruktion FI124114B (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI20095992A FI124114B (sv) 2009-09-29 2009-09-29 Mätfönsterkonstruktion
DE102010041511A DE102010041511A1 (de) 2009-09-29 2010-09-28 Messfensterkonstruktion
US12/892,415 US8456627B2 (en) 2009-09-29 2010-09-28 Structure of measurement window

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20095992 2009-09-29
FI20095992A FI124114B (sv) 2009-09-29 2009-09-29 Mätfönsterkonstruktion

Publications (3)

Publication Number Publication Date
FI20095992A0 true FI20095992A0 (sv) 2009-09-29
FI20095992A FI20095992A (sv) 2011-03-30
FI124114B FI124114B (sv) 2014-03-31

Family

ID=41136451

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20095992A FI124114B (sv) 2009-09-29 2009-09-29 Mätfönsterkonstruktion

Country Status (3)

Country Link
US (1) US8456627B2 (sv)
DE (1) DE102010041511A1 (sv)
FI (1) FI124114B (sv)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112525235A (zh) * 2020-12-01 2021-03-19 天津津航技术物理研究所 一种用于光电探测装置的窗口结构

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20206374A1 (sv) * 2020-12-28 2022-06-29 Kxs Tech Oy Refraktometer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2544877B1 (fr) * 1983-04-22 1986-07-04 Electricite De France Sonde optique
CA1273223A (en) * 1985-06-25 1990-08-28 Richard D. Mclachlan Methods and apparatus for measuring the light absorbance of a fluid medium
DE4414975C2 (de) 1994-04-29 2000-06-15 Bayer Ag Vorrichtung zur spektroskopischen Analyse von Prozeßgemischen
DE4418180C2 (de) 1994-06-27 1997-05-15 Emmrich Roland Sondenanordnung zur Messung der spektralen Absorption in Flüssigkeiten, Gasen oder Feststoffen
US5773825A (en) * 1995-09-22 1998-06-30 Axiom Analytical, Inc. Bi-layer attenuated total reflectance device providing optimized absorbance linearity
US6118520A (en) * 1996-12-18 2000-09-12 The Dow Chemical Company Dual analysis probe
FI108259B (sv) * 1998-01-30 2001-12-14 Janesko Oy Refraktometer
FI113566B (sv) * 2000-08-01 2004-05-14 Janesko Oy Refraktometer
US20040122280A1 (en) * 2002-12-19 2004-06-24 Forney Robert W. Optical probes
FI118864B (sv) * 2005-08-12 2008-04-15 Janesko Oy Refraktometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112525235A (zh) * 2020-12-01 2021-03-19 天津津航技术物理研究所 一种用于光电探测装置的窗口结构

Also Published As

Publication number Publication date
DE102010041511A1 (de) 2011-03-31
US8456627B2 (en) 2013-06-04
FI20095992A (sv) 2011-03-30
US20110075141A1 (en) 2011-03-31
FI124114B (sv) 2014-03-31

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