FI20070846A0 - Reläanslutningsdon - Google Patents

Reläanslutningsdon

Info

Publication number
FI20070846A0
FI20070846A0 FI20070846A FI20070846A FI20070846A0 FI 20070846 A0 FI20070846 A0 FI 20070846A0 FI 20070846 A FI20070846 A FI 20070846A FI 20070846 A FI20070846 A FI 20070846A FI 20070846 A0 FI20070846 A0 FI 20070846A0
Authority
FI
Finland
Prior art keywords
reläanslutningsdon
Prior art date
Application number
FI20070846A
Other languages
English (en)
Finnish (fi)
Other versions
FI121100B (sv
FI20070846A (sv
Inventor
Hisashi Suzuki
Ryoichi Hirako
Original Assignee
Yokowo Seisakusho Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2007265372A external-priority patent/JP4906666B2/ja
Application filed by Yokowo Seisakusho Kk filed Critical Yokowo Seisakusho Kk
Publication of FI20070846A0 publication Critical patent/FI20070846A0/sv
Publication of FI20070846A publication Critical patent/FI20070846A/sv
Application granted granted Critical
Publication of FI121100B publication Critical patent/FI121100B/sv

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70—Testing of connections between components and printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
FI20070846A 2006-11-10 2007-11-08 Reläanslutningsdon FI121100B (sv)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2006305363 2006-11-10
JP2006305363 2006-11-10
JP2007265372A JP4906666B2 (ja) 2006-11-10 2007-10-11 中継コネクター
JP2007265372 2007-10-11

Publications (3)

Publication Number Publication Date
FI20070846A0 true FI20070846A0 (sv) 2007-11-08
FI20070846A FI20070846A (sv) 2008-05-11
FI121100B FI121100B (sv) 2010-06-30

Family

ID=38786633

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20070846A FI121100B (sv) 2006-11-10 2007-11-08 Reläanslutningsdon

Country Status (2)

Country Link
US (1) US7656179B2 (sv)
FI (1) FI121100B (sv)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107834254A (zh) * 2017-11-20 2018-03-23 河南思维轨道交通技术研究院有限公司 一种连接器后出线定位结构

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM354211U (en) * 2008-09-08 2009-04-01 Hon Hai Prec Ind Co Ltd Electrical connector
JP5393498B2 (ja) * 2010-01-19 2014-01-22 株式会社ヨコオ 中継コネクタ
JP5579547B2 (ja) * 2010-09-07 2014-08-27 株式会社ヨコオ コネクタ接続用検査治具
US9113781B2 (en) 2013-02-07 2015-08-25 Siemens Aktiengesellschaft Method and system for on-site learning of landmark detection models for end user-specific diagnostic medical image reading
US9459312B2 (en) * 2013-04-10 2016-10-04 Teradyne, Inc. Electronic assembly test system
US20140340107A1 (en) * 2013-05-17 2014-11-20 Expert International Mercantile Corporation Bga test socket
KR101444774B1 (ko) * 2014-03-11 2014-09-26 주식회사 티씨에스 전자부품 테스트용 소켓
CN107782923A (zh) * 2016-08-24 2018-03-09 神讯电脑(昆山)有限公司 测试板对接装置
KR20200133084A (ko) * 2019-05-16 2020-11-26 삼성디스플레이 주식회사 커넥터
CN110815095B (zh) * 2019-12-13 2024-04-26 深圳奥维德机电有限公司 一种薄板通用加工治具

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA944435A (en) 1970-12-25 1974-03-26 Tadashi Kubota Inspection apparatus for printed circuit boards
US4225819A (en) 1978-10-12 1980-09-30 Bell Telephone Laboratories, Incorporated Circuit board contact contamination probe
US5572144A (en) 1993-02-22 1996-11-05 Seagate Technology Test jig and method for probing a printed circuit board
GB2276281B (en) 1993-03-03 1995-04-12 Centalic Tech Dev Ltd Testing apparatus for printed circuit boards and the like
JPH08213128A (ja) * 1995-02-08 1996-08-20 Texas Instr Japan Ltd ソケット
US6046597A (en) * 1995-10-04 2000-04-04 Oz Technologies, Inc. Test socket for an IC device
US5788526A (en) * 1996-07-17 1998-08-04 Minnesota Mining And Manufacturing Company Integrated circuit test socket having compliant lid and mechanical advantage latch
JPH11183521A (ja) 1997-12-22 1999-07-09 Yokowo Co Ltd クリップ式中継コネクタ
US6734690B1 (en) 2000-04-29 2004-05-11 Hewlett-Packard Development Company, L.P. Back pressure test fixture to allow probing of integrated circuit package signals
JP2003059602A (ja) * 2001-08-08 2003-02-28 Yamaichi Electronics Co Ltd 半導体装置用ソケット
US6844749B2 (en) * 2002-07-18 2005-01-18 Aries Electronics, Inc. Integrated circuit test probe
JP2004309441A (ja) 2003-02-18 2004-11-04 Yamaha Corp プローブヘッド及びその組立方法並びにプローブカード
JP2004273192A (ja) 2003-03-06 2004-09-30 Yokowo Co Ltd コネクタ検査用治具
US6856156B2 (en) 2003-03-26 2005-02-15 Taiwan Semiconductor Manufacturing Co., Ltd Automatically adjustable wafer probe card
WO2005106512A1 (ja) 2004-04-30 2005-11-10 Advantest Corporation マニュアル試験用器具
JP2007294146A (ja) 2006-04-21 2007-11-08 Yamaichi Electronics Co Ltd 位置決め治具
TWM312105U (en) * 2006-05-02 2007-05-11 Hon Hai Prec Ind Co Ltd Electrical connector
JP2008145248A (ja) * 2006-12-08 2008-06-26 Yokowo Co Ltd 中継コネクタ

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107834254A (zh) * 2017-11-20 2018-03-23 河南思维轨道交通技术研究院有限公司 一种连接器后出线定位结构
CN107834254B (zh) * 2017-11-20 2023-09-22 河南思维轨道交通技术研究院有限公司 一种连接器后出线定位结构

Also Published As

Publication number Publication date
US7656179B2 (en) 2010-02-02
FI121100B (sv) 2010-06-30
US20080129321A1 (en) 2008-06-05
FI20070846A (sv) 2008-05-11

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