FI20051009A - Mittausmenetelmä, järjestely ja ohjelmistotuote - Google Patents
Mittausmenetelmä, järjestely ja ohjelmistotuote Download PDFInfo
- Publication number
- FI20051009A FI20051009A FI20051009A FI20051009A FI20051009A FI 20051009 A FI20051009 A FI 20051009A FI 20051009 A FI20051009 A FI 20051009A FI 20051009 A FI20051009 A FI 20051009A FI 20051009 A FI20051009 A FI 20051009A
- Authority
- FI
- Finland
- Prior art keywords
- arrangement
- program product
- measurement procedure
- procedure
- measurement
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0095—Semiconductive materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
- G01N2021/1719—Carrier modulation in semiconductors
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20051009A FI121555B (fi) | 2005-10-07 | 2005-10-07 | Mittausmenetelmä, järjestely ja ohjelmistotuote |
PCT/FI2006/000327 WO2007042606A1 (en) | 2005-10-07 | 2006-10-06 | Measuring method, arrangement and software product |
EP06794103.9A EP1931975B1 (en) | 2005-10-07 | 2006-10-06 | Measuring method and software product |
US12/083,091 US8624582B2 (en) | 2005-10-07 | 2006-10-06 | Measuring method, arrangement and software product |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20051009A FI121555B (fi) | 2005-10-07 | 2005-10-07 | Mittausmenetelmä, järjestely ja ohjelmistotuote |
FI20051009 | 2005-10-07 |
Publications (3)
Publication Number | Publication Date |
---|---|
FI20051009A0 FI20051009A0 (fi) | 2005-10-07 |
FI20051009A true FI20051009A (fi) | 2007-04-08 |
FI121555B FI121555B (fi) | 2010-12-31 |
Family
ID=35185151
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20051009A FI121555B (fi) | 2005-10-07 | 2005-10-07 | Mittausmenetelmä, järjestely ja ohjelmistotuote |
Country Status (4)
Country | Link |
---|---|
US (1) | US8624582B2 (fi) |
EP (1) | EP1931975B1 (fi) |
FI (1) | FI121555B (fi) |
WO (1) | WO2007042606A1 (fi) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008154186A1 (en) * | 2007-06-06 | 2008-12-18 | Semiconductor Diagnostics, Inc. | Enhanced sensitivity non-contact electrical monitoring of copper contamination on silicon surface |
JP6344168B2 (ja) | 2014-09-11 | 2018-06-20 | 株式会社Sumco | ボロンドープp型シリコンウェーハの金属汚染評価方法および評価装置、ならびにボロンドープp型シリコンウェーハの製造方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01278037A (ja) | 1988-04-28 | 1989-11-08 | Nec Corp | 半導体装置の製造方法 |
US6146135A (en) * | 1991-08-19 | 2000-11-14 | Tadahiro Ohmi | Oxide film forming method |
JP2672743B2 (ja) | 1992-05-14 | 1997-11-05 | 日本電信電話株式会社 | 汚染不純物の評価方法 |
US6150175A (en) * | 1998-12-15 | 2000-11-21 | Lsi Logic Corporation | Copper contamination control of in-line probe instruments |
US6607927B2 (en) * | 2001-09-28 | 2003-08-19 | Agere Systems, Inc. | Method and apparatus for monitoring in-line copper contamination |
JP2005142359A (ja) | 2003-11-06 | 2005-06-02 | Toshiba Ceramics Co Ltd | 半導体ウェーハのライフタイム評価方法 |
-
2005
- 2005-10-07 FI FI20051009A patent/FI121555B/fi not_active IP Right Cessation
-
2006
- 2006-10-06 WO PCT/FI2006/000327 patent/WO2007042606A1/en active Application Filing
- 2006-10-06 US US12/083,091 patent/US8624582B2/en not_active Expired - Fee Related
- 2006-10-06 EP EP06794103.9A patent/EP1931975B1/en not_active Not-in-force
Also Published As
Publication number | Publication date |
---|---|
WO2007042606A1 (en) | 2007-04-19 |
EP1931975A4 (en) | 2014-07-23 |
FI20051009A0 (fi) | 2005-10-07 |
US8624582B2 (en) | 2014-01-07 |
EP1931975B1 (en) | 2018-03-14 |
US20090160431A1 (en) | 2009-06-25 |
EP1931975A1 (en) | 2008-06-18 |
FI121555B (fi) | 2010-12-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM | Patent lapsed |